SCHEMBL3105550

SCHEMBL3105550

COC(OC)=C([SiH3])C(C)C

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL660751 0.69
SCHEMBL28490351 0.65 TSHR (0.33)
SCHEMBL2103202 0.62
SCHEMBL10615974 0.62
SCHEMBL1586506 0.62 ALDH1A1 (0.39)
SCHEMBL8759781 0.61
SCHEMBL2274415 0.61
SCHEMBL2100921 0.60
SCHEMBL2272321 0.58
SCHEMBL4492329 0.58

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 8 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-4108706-B1 METHOD FOR PRODUCING CYCLIC POLYSILOXANE SHINETSU CHEMICAL CO (JP) 2025-09-10 EP disclosed
US-20230095953-A1 METHOD FOR PRODUCING CYCLIC POLYSILOXANE SHIN-ETSU CHEMICAL CO., LTD. (JP) 2023-03-30 US disclosed
EP-4108706-A1 METHOD FOR PRODUCING CYCLIC POLYSILOXANE Shin-Etsu Chemical Co., Ltd. (JP) 2022-12-28 EP disclosed
CN-115135698-A Method for producing cyclic polysiloxane 信越化学工业株式会社 2022-09-30 CN disclosed
EP-2216682-B1 POSITIVE PHOTOSENSITIVE COMPOSITION, POSITIVE PERMANENT RESIST, AND METHOD FOR PRODUCING POSITIVE PERMANENT RESIST ADEKA CORP (JP) 2013-07-17 EP disclosed
US-8211619-B2 Positive photosensitive composition, positive permanent resist, and method for producing positive permanent resist ADEKA CORPORATION (JP) 2012-07-03 US disclosed
US-20100273104-A1 POSITIVE PHOTOSENSITIVE COMPOSITION, POSITIVE PERMANENT RESIST, AND METHOD FOR PRODUCING POSITIVE PERMANENT RESIST A D E K A (ADEKA CORPORATION) (JP) 2010-10-28 US disclosed
EP-2216682-A1 POSITIVE PHOTOSENSITIVE COMPOSITION, POSITIVE PERMANENT RESIST, AND METHOD FOR PRODUCING POSITIVE PERMANENT RESIST Adeka Corporation (JP) 2010-08-11 EP disclosed