SCHEMBL3217474

SCHEMBL3217474

CC(I)C(=O)OC12CC3CC(CC(C3)C1)C2

nearest known ligand 0.48

Predicted protein targets (top 9)

geneUniProtsupporting neighboursconfidence
CYP17A1 P05093 6/20 0.48
CYP19A1 P11511 5/20 0.48
NAAA Q02083 1/20 0.39
NPSR1 Q6W5P4 1/20 0.38
ALDH1A1 P00352 4/20 0.37
EPHX1 P07099 1/20 0.37
NPC1 O15118 1/20 0.37
MAPT P10636 1/20 0.34
EPHX2 P34913 1/20 0.34

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL9608681 0.84 CYP19A1 (0.50) CYP17A1CYP19A1NAAANPSR1ALDH1A1
SCHEMBL22999233 0.84 CYP19A1 (0.43) CYP17A1CYP19A1NAAANPSR1ALDH1A1
SCHEMBL14673993 0.84 CYP17A1 (0.50) CYP17A1CYP19A1NAAANPSR1ALDH1A1
SCHEMBL27437399 0.84 CYP19A1 (0.50) CYP17A1CYP19A1NAAANPSR1ALDH1A1
SCHEMBL25142188 0.82 GRIN2D (0.44) CYP17A1CYP19A1NAAAALDH1A1EPHX1
SCHEMBL20078523 0.81 CYP19A1 (0.48) CYP17A1CYP19A1NAAANPSR1ALDH1A1
SCHEMBL10613175 0.81 CYP19A1 (0.48) CYP17A1CYP19A1NAAANPSR1ALDH1A1
SCHEMBL6441379 0.81 CYP19A1 (0.48) CYP17A1CYP19A1NAAANPSR1ALDH1A1
SCHEMBL11991223 0.81 CYP19A1 (0.48) CYP17A1CYP19A1NAAANPSR1ALDH1A1
SCHEMBL958155 0.81 CYP19A1 (0.48) CYP17A1CYP19A1NAAANPSR1ALDH1A1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 3 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-8586281-B2 Positive resist composition and method of forming resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2013-11-19 US disclosed
US-8574809-B2 Positive resist composition and method of forming resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2013-11-05 US disclosed
US-20100055606-A1 Positive resist composition and method of forming resist pattern TOKYO OHKA KOGYO CO., LTD. 2010-03-04 US disclosed