SCHEMBL3475571

SCHEMBL3475571

CO[Si]1(C)O[Si](C)(OC)O[Si](C)(OC)O1

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL9976185 1.00
SCHEMBL3474970 1.00
SCHEMBL1639210 1.00
SCHEMBL13923825 0.89
SCHEMBL20345782 0.87
SCHEMBL12725247 0.87
SCHEMBL13133223 0.87
SCHEMBL14424563 0.82
SCHEMBL41538 0.82
SCHEMBL16329397 0.82

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 12 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20230399469-A1 ORGANOPOLYSILOXANE AND PRODUCTION METHOD THEREFOR, DISPERSANT COMPRISING ORGANOPOLYSILOXANE, AND DISPERSION CONTAINING ORGANOPOLYSILOXANE AS DISPERSANT JNC CORPORATION (JP) 2023-12-14 US disclosed
US-8513448-B2 Cyclic siloxane compound, a material for forming Si-containing film, and its use TOSOH CORPORATION (JP) 2013-08-20 US disclosed
EP-2256123-A2 Cyclic siloxane compound, a material for forming Si-containing film, and its use Tosoh Corporation (JP) 2010-12-01 EP disclosed
US-20100052114-A1 CYCLIC SILOXANE COMPOUND, A MATERIAL FOR FORMING SI-CONTAINING FILM, AND ITS USE TOSOH CORPORATION (JP) 2010-03-04 US disclosed
US-20090294922-A1 ORGANIC SILICON OXIDE FINE PARTICLE AND PREPARATION METHOD THEREOF, POROUS FILM-FORMING COMPOSITION, POROUS FILM AND FORMATION METHOD THEREOF, AND SEMICONDUCTOR DEVICE PANASONIC CORPORATION (JP) 2009-12-03 US disclosed
EP-1845100-A1 CYCLIC SILOXANE COMPOUND, Si-CONTAINING FILM-FORMING MATERIAL, AND USE THEREOF Tosoh Corporation (JP) 2007-10-17 EP disclosed
US-7064088-B2 Method for forming low-k hard film ASM JAPAN K.K. (JP) 2006-06-20 US disclosed
US-6881683-B2 Insulation film on semiconductor substrate and method for forming same ASM JAPAN K.K. (JP) 2005-04-19 US disclosed
US-6740602-B1 Method of forming low-dielectric constant film on semiconductor substrate by plasma reaction using high-RF power ASM JAPAN K.K. (JP) 2004-05-25 US disclosed
US-20040038514-A1 Method for forming low-k hard film ASM JAPAN K.K. (JP) 2004-02-26 US disclosed
US-20030162408-A1 Insulation film on semiconductor substrate and method for forming same ASM JAPAN K.K. (JP) 2003-08-28 US disclosed
US-4197384-A Stabilized polycarbonate compositions GENERAL ELECTRIC COMPANY (US) 1980-04-08 US disclosed