Salicyladehyde

Salicyladehyde

SCHEMBL3800873

C=CCOCC=C.O=Cc1ccccc1O

nearest known ligand 0.64

Full drug profile on Sugi Atlas →

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
TRIM24 O15164 1/20 0.64
TRIM33 Q9UPN9 1/20 0.64
ERN1 O75460 1/20 0.46
CA2 P00918 5/20 0.43
CA1 P00915 2/20 0.43
CDK4 P11802 1/20 0.43
CCND1 P24385 1/20 0.43
LMNA P02545 2/20 0.41
MEN1 O00255 1/20 0.41
THRB P10828 1/20 0.41
BLM P54132 1/20 0.41
KMT2A Q03164 1/20 0.41
TDP1 Q9NUW8 1/20 0.41
CYP3A4 P08684 1/20 0.41
HPGD P15428 2/20 0.40
ALDH1A1 P00352 1/20 0.40
HTT P42858 1/20 0.40
SMN1; SMN2 Q16637 1/20 0.40
TSHR P16473 1/20 0.39
MAPK1 P28482 1/20 0.39

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL28990965 0.85 TRIM24 (0.42) TRIM24TRIM33CA2CA1CDK4
Catechol SCHEMBL6545013 0.82 MAPT (0.48) CA2LMNAMEN1BLMKMT2A
Salicyladehyde SCHEMBL27478581 0.80 TRIM24 (0.90) TRIM24TRIM33ERN1CA2CA1
Salicyladehyde SCHEMBL28720472 0.80 TRIM24 (0.90) TRIM24TRIM33ERN1CA2CA1
Salicyladehyde SCHEMBL1481752 0.80 TRIM24 (0.90) TRIM24TRIM33ERN1CA2CA1
Salicyladehyde SCHEMBL11137059 0.80 TRIM24 (0.90) TRIM24TRIM33ERN1CA2CA1
Salicyladehyde SCHEMBL3324723 0.80 TRIM24 (0.90) TRIM24TRIM33ERN1CA2CA1
Salicyladehyde SCHEMBL6904372 0.80 TRIM24 (0.90) TRIM24TRIM33ERN1CA2CA1
Salicyladehyde SCHEMBL901265 0.80 TRIM24 (1.00) TRIM24TRIM33ERN1CA2CA1
Salicyladehyde SCHEMBL15395 0.80

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 16 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-1001054-B1 Tin-copper alloy electroplating bath and plating process therewith UYEMURA C & CO LTD (JP) 2005-04-20 EP claimed
US-6508927-B2 Bath contains an inorganic or organic acid or a water-soluble salt thereof, and one or more thioamide compounds or thiol compounds; forms a tin-copper alloy deposit, in place of tin-lead alloy plating, on electronic parts C. UYEMURA & CO., LTD. (JP) 2003-01-21 US claimed
US-20020104763-A1 TIN - COPPER ALLOY ELECTROPLATING BATH AND PLATING PROCESS THEREWITH C. UYEMURA & CO., LTD. (JP) 2002-08-08 US claimed
EP-1001054-A2 Tin-copper alloy electroplating bath and plating process therewith C. UYEMURA & CO, LTD (JP) 2000-05-17 EP claimed
EP-3238861-B1 SOLDER MATERIAL, SOLDER PASTE, FOAM SOLDER, FLUX COATING MATERIAL SENJU METAL INDUSTRY CO (JP) 2025-08-27 EP disclosed
US-10675719-B2 Joining member, solder material, solder paste, formed solder, flux coated material, and solder joint SENJU METAL INDUSTRY CO., LTD. (JP) 2020-06-09 US disclosed
US-20180015572-A1 Joining Member, Solder Material, Solder Paste, Formed Solder, Flux Coated Material, and Solder Joint SENJU METAL INDUSTRY CO., LTD. (JP) 2018-01-18 US disclosed
EP-3238861-A1 JOINING MEMBER, SOLDER MATERIAL, SOLDER PASTE, FOAM SOLDER, FLUX COATING MATERIAL, AND SOLDER JOINT Senju Metal Industry Co., Ltd (JP) 2017-11-01 EP disclosed
US-8440066-B2 Tin electroplating bath, tin plating film, tin electroplating method, and electronic device component C. UYEMURA & CO., LTD. (JP) 2013-05-14 US disclosed
US-20100269894-A1 TITANIUM DIOXIDE NANOTUBES AND THEIR USE IN PHOTOVOLTAIC DEVICES BOARD OF REGENTS OF THE NEVADA SYSTEM OF HIGHER EDUCATION, ON BEHALF OF THE UNIVERSITY OF NEVADA (US) 2010-10-28 US disclosed
US-20090275143-A1 NANOSTRUCTURE ARRAY AND METHODS OF USE FOR EXPLOSIVE DETECTION THE BOARD OF REGENTS OF THE NEVADA SYSTEM OF HIGHE EDUCATION, ON BEHALF OF THE UNIVERSITY OF NEVADA, 2009-11-05 US disclosed
US-20090098398-A1 TIN ELECTROPLATING BATH, TIN PLATING FILM, TIN ELECTROPLATING METHOD, AND ELECTRONIC DEVICE COMPONENT C. UYEMURA & CO., LTD. (JP) 2009-04-16 US disclosed
EP-1001054-B1 Tin-copper alloy electroplating bath and plating process therewith UYEMURA C & CO LTD (JP) 2005-04-20 EP disclosed
US-6508927-B2 Bath contains an inorganic or organic acid or a water-soluble salt thereof, and one or more thioamide compounds or thiol compounds; forms a tin-copper alloy deposit, in place of tin-lead alloy plating, on electronic parts C. UYEMURA & CO., LTD. (JP) 2003-01-21 US disclosed
US-20020104763-A1 TIN - COPPER ALLOY ELECTROPLATING BATH AND PLATING PROCESS THEREWITH C. UYEMURA & CO., LTD. (JP) 2002-08-08 US disclosed
EP-1001054-A2 Tin-copper alloy electroplating bath and plating process therewith C. UYEMURA & CO, LTD (JP) 2000-05-17 EP disclosed