SCHEMBL388403

SCHEMBL388403

[N-]=C=O.[N-]=C=O.[N-]=C=O.[N-]=C=O.[Zr+4]

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL11879355 0.86
SCHEMBL2142197 0.86
SCHEMBL2367693 0.86
SCHEMBL5480491 0.86
Potassium Ion SCHEMBL75950 0.86
SCHEMBL387131 0.86
SCHEMBL1083149 0.86
Potassium Ion SCHEMBL1325711 0.86
Zinc Ion SCHEMBL7036211 0.86
SCHEMBL343649 0.86

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 38 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-1895576-B1 PATTERN FORMING METHOD TOKYO OHKA KOGYO CO LTD (JP) 2014-07-23 EP claimed
US-7932013-B2 Pattern coating material and pattern forming method TOKYO OHKA KOGYO CO., LTD. (JP) 2011-04-26 US claimed
CN-120134737-A Resin sheet with metal foil 味之素株式会社 2025-06-13 CN disclosed
EP-3275527-B1 GAS-PERMEABLE MEMBRANE, USE OF A COMPOSITION FOR FORMING SUCH MEMBRANE AND PROCESS FOR PRODUCING IT NANOMEMBRANE TECH INC (JP) 2023-10-11 EP disclosed
US-10751672-B2 Gas-permeable membrane NanoMembrane Technologies, Inc. (JP) 2020-08-25 US disclosed
EP-3275527-A1 GAS-PERMEABLE MEMBRANE NanoMembrane Technologies, Inc. (JP) 2018-01-31 EP disclosed
US-20180021738-A1 GAS-PERMEABLE MEMBRANE NanoMembrane Technologies, Inc. (JP) 2018-01-25 US disclosed
EP-2131423-B1 NEGATIVE ELECTRODE BASE MEMBER TOKYO OHKA KOGYO CO LTD (JP) 2017-11-15 EP disclosed
US-9796879-B2 Film-forming material TOKYO OHKA KOGYO CO., LTD. (JP) 2017-10-24 US disclosed
US-9405199-B2 Method for forming resist pattern TOKYO OHKA KOGYO CO., LTD. (JP) 2016-08-02 US disclosed
US-9105929-B2 Negative electrode base member TOKYO OHKA KOGYO CO., LTD. (JP) 2015-08-11 US disclosed
US-20090286936-A1 COMPOSITION FOR FORMATION OF MOLD TOKYO OHKA KOGYO CO., LTD. (JP) 2009-11-19 US disclosed
US-20090134119-A1 FILM-FORMING MATERIAL AND METHOD OF FORMING PATTERN TOKYO OHKA KOGYO CO., LTD. (JP) 2009-05-28 US disclosed
US-20090087625-A1 METHOD FOR MANUFACTURING STRUCTURE, AND STRUCTURE TOKYO OHKA KOGYO CO., LTD. (JP) 2009-04-02 US disclosed
US-20090061170-A1 ANISOTROPIC FILM AND METHOD OF MANUFACTURING ANISOTROPIC FILM TOKYO OHKA KOGYO CO., LTD. (JP) 2009-03-05 US disclosed
US-20090029284-A1 PATTERN COATING MATERIAL AND PATTERN FORMING METHOD TOKYO OHKA KOGYO CO., LTD. (JP) 2009-01-29 US disclosed
EP-1895576-A1 PATTERN COATING MATERIAL AND PATTERN FORMING METHOD TOKYO OHKA KOGYO CO., LTD. (JP) 2008-03-05 EP disclosed
US-20080050564-A1 Method of Forming a Nano-Structure and the Nano-Structure RIKEN (JP) 2008-02-28 US disclosed
US-20070126147-A1 Method of producing a nanomaterial, and a nanomaterial RIKEN (JP) 2007-06-07 US disclosed
EP-1767491-A1 METHOD FOR MANUFACTURING NANOSTRUCTURE AND NANOSTRUCTURE Riken (JP) 2007-03-28 EP disclosed