SCHEMBL3974802

SCHEMBL3974802

C(=COC=CCCC1CCCCC1)CCC1CCCCC1

nearest known ligand 0.41

Predicted protein targets (top 10)

geneUniProtsupporting neighboursconfidence
SIGMAR1 Q99720 3/20 0.40
CYP1A2 P05177 1/20 0.38
NFE2L2 Q16236 1/20 0.32
ADH1B P00325 1/20 0.31
ADH1C P00326 1/20 0.31
ADH1A P07327 1/20 0.31
ADH4 P08319 1/20 0.31
ADH7 P40394 1/20 0.31
HPGD P15428 1/20 0.31
ALDH1A1 P00352 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL15226793 0.87 SIGMAR1 (0.47) SIGMAR1CYP1A2
SCHEMBL8398837 0.80 CYP1A2 (0.44) SIGMAR1CYP1A2NFE2L2ADH1BADH1C
SCHEMBL1815340 0.76 SIGMAR1 (0.33) SIGMAR1CYP1A2ADH1BADH1CADH1A
SCHEMBL9719593 0.74 CYP1A2 (0.44) SIGMAR1CYP1A2ADH1BADH1CADH1A
SCHEMBL11772642 0.74 CYP1A2 (0.39) SIGMAR1CYP1A2ADH1BADH1CADH1A
SCHEMBL9719568 0.74 CYP1A2 (0.39) SIGMAR1CYP1A2ADH1BADH1CADH1A
SCHEMBL7264765 0.74 SIGMAR1 (0.41) SIGMAR1CYP1A2NFE2L2ADH1BADH1C
SCHEMBL7031133 0.74 CYP1A2 (0.44) SIGMAR1CYP1A2ADH1BADH1CADH1A
SCHEMBL11772648 0.74 CYP1A2 (0.39) SIGMAR1CYP1A2ADH1BADH1CADH1A
SCHEMBL10368761 0.73 CYP1A2 (0.38) SIGMAR1CYP1A2ADH1BADH1CADH1A

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 7 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-111758074-A Photosensitive layer, laminate, photosensitive resin composition, kit, and method for producing photosensitive resin composition 富士胶片株式会社 2020-10-09 CN disclosed
US-20130230770-A1 NON-AQUEOUS SECONDARY BATTERY HITACHI MAXELL, LTD. (JP) 2013-09-05 US disclosed
US-7501223-B2 Polymer, resist composition and patterning process using the same SHIN-ETSU CHEMICAL CO., LTD. (JP) 2009-03-10 US disclosed
US-20080090179-A1 Novel polymer, resist composition and patterning process using the same SHIN-ETSU CHEMICAL CO., LTD. (JP) 2008-04-17 US disclosed
US-6887645-B2 Negative resist composition FUJI PHOTO FILM CO., LTD. (JP) 2005-05-03 US disclosed
US-20020061462-A1 Negative resist composition FUJI PHOTO FILM CO., LTD. 2002-05-23 US disclosed
EP-1193555-A1 Negative resist composition Fuji Photo Film Co., Ltd. (JP) 2002-04-03 EP disclosed