SCHEMBL409732

SCHEMBL409732

[Hf].[La]

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL29167371 0.82
SCHEMBL31197910 0.82
SCHEMBL828558 0.82
Fluoride SCHEMBL309409 0.82
Water SCHEMBL20873118 0.82
SCHEMBL828559 0.82
SCHEMBL15484185 0.82
Water SCHEMBL568983 0.82
SCHEMBL10719239 0.82
SCHEMBL10719241 0.82

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 219 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-120157478-A Lanthanum and hafnium co-doped yttrium titanate composite coating material and preparation method thereof 电子科技大学 2025-06-17 CN claimed
CN-118598659-A Lanthanum-hafnium co-doped silver niobate-based antiferroelectric ceramic material and preparation method thereof 内蒙古科技大学 2024-09-06 CN claimed
CN-110957273-B Method of manufacturing semiconductor device and full-wrap gate field effect transistor 台湾积体电路制造股份有限公司 2023-05-26 CN claimed
US-10998042-B2 Memory cells with tunneling materials including lanthanum oxide MICRON TECHNOLOGY, INC. (US) 2021-05-04 US claimed
US-10892340-B2 Memory cell structures MICRON TECHNOLOGY, INC. (US) 2021-01-12 US claimed
CN-111943669-A Preparation method for synthesizing lanthanum hafnate powder by sol-gel method 西北工业大学 2020-11-17 CN claimed
CN-110957273-A Method of manufacturing semiconductor device and all-around gate field effect transistor 台湾积体电路制造股份有限公司 2020-04-03 CN claimed
US-20190198631-A1 MEMORY CELL STRUCTURES MICRON TECHNOLOGY, INC. 2019-06-27 US claimed
US-20190122733-A1 MULTIFUNCTIONAL MEMORY CELLS MICRON TECHNOLOGY, INC. 2019-04-25 US claimed
US-10262736-B2 Multifunctional memory cells MICRON TECHNOLOGY, INC. (US) 2019-04-16 US claimed
CN-101752424-B Thin film transistor IND TECH RES INST 2011-10-26 CN claimed
CN-101752424-A Thin film transistor IND TECH RES INST 2010-06-23 CN claimed
US-7612422-B2 Structure for dual work function metal gate electrodes by control of interface dipoles TEXAS INSTRUMENTS INCORPORATED (US) 2009-11-03 US claimed
US-20080308876-A1 Semiconductor device and method of manufacturing the same SAMSUNG ELECTRONICS CO., LTD. (KR) 2008-12-18 US claimed
EP-1992442-A1 TOOL FOR FRICTION STIR WELDING, METHOD OF WELDING WITH THE SAME, AND PROCESSED OBJECT OBTAINED BY THE SAME FURUYA METAL CO., LTD. (JP) 2008-11-19 EP claimed
WO-2008127484-A2 STRUCTURE AND METHOD FOR DUAL WORK FUNCTION METAL GATE ELECTRODES BY CONTROL OF INTERFACE DIPOLES TEXAS INSTRUMENTS INCORPORATED (US) 2008-10-23 WO claimed
US-20080157228-A1 STRUCTURE AND METHOD FOR DUAL WORK FUNCTION METAL GATE ELECTRODES BY CONTROL OF INTERFACE DIPOLES TEXAS INSTRUMENTS INCORPORATED 2008-07-03 US claimed
WO-2008054689-A1 METHODS OF FORMING DIELECTRIC STRUCTURES IN SEMICONDUCTOR DEVICES MICRON TECHNOLOGY, INC. (US) 2008-05-08 WO claimed
US-20080099829-A1 Mosfet devices and systems with nitrided gate insulators and methods for forming MICRON TECHNOLOGY, INC. 2008-05-01 US claimed
WO-2007121007-A2 METHOD AND APPARATUS FOR FABRICATING A HIGH DIELECTRIC CONSTANT TRANSISTOR GATE USING A LOW ENERGY PLASMA SYSTEM APPLIED MATERIALS, INC. (US) 2007-10-25 WO claimed