SCHEMBL435429

SCHEMBL435429

CP(F)F

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL12795845 1.00
SCHEMBL9575138 0.83
SCHEMBL5846703 0.73
SCHEMBL9223919 0.73
SCHEMBL13368968 0.72
SCHEMBL18950221 0.72
SCHEMBL15120429 0.72
SCHEMBL16926192 0.72
SCHEMBL21559804 0.72
SCHEMBL16846600 0.72

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 79 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-12412749-B2 Etching method and plasma processing system TOKYO ELECTRON LIMITED (JP) 2025-09-09 US claimed
US-20230307243-A1 ETCHING METHOD AND PLASMA PROCESSING SYSTEM TOKYO ELECTRON LIMITED (JP) 2023-09-28 US claimed
WO-2019165279-A1 ORGANS-ON-CHIPS AS A PLATFORM FOR EPIGENETICS DISCOVERY EMULATE, Inc. (US) 2019-08-29 WO claimed
US-20100320428-A1 GASEOUS DIELECTRICS WITH LOW GLOBAL WARMING POTENTIALS HONEYWELL INTERNATIONAL INC. (US) 2010-12-23 US claimed
US-20260136859-A1 ETCHING METHOD AND ETCHING DEVICE TOKYO ELECTRON LIMITED (JP) 2026-05-14 US disclosed
US-20260107715-A1 PLASMA PROCESSING SYSTEM TOKYO ELECTRON LIMITED (JP) 2026-04-16 US disclosed
US-12532681-B2 Etching method and plasma processing system TOKYO ELECTRON LIMITED (JP) 2026-01-20 US disclosed
US-12412749-B2 Etching method and plasma processing system TOKYO ELECTRON LIMITED (JP) 2025-09-09 US disclosed
US-20250191889-A1 PLASMA PROCESSING APPARATUS AND SUBSTRATE PROCESSING SYSTEM TOKYO ELECTRON LIMITED (JP) 2025-06-12 US disclosed
US-20250191927-A1 ETCHING METHOD AND PLASMA PROCESSING SYSTEM TOKYO ELECTRON LIMITED (JP) 2025-06-12 US disclosed
US-20250095991-A1 ETCHING METHOD AND PLASMA PROCESSING APPARATUS TOKYO ELECTRON LIMITED (JP) 2025-03-20 US disclosed
WO-2025018161-A1 ETCHING METHOD AND ETCHING DEVICE 東京エレクトロン株式会社 2025-01-23 WO disclosed
US-7422860-B2 Optoelectronic detection system MASSACHUSETTS INSTITUTE OF TECHNOLOGY (US) 2008-09-09 US disclosed
US-20080166705-A1 Antibody diversity for detection of multiple and rare target particles or antigens; combining the crosslinked antigen with an emittor cell comprising an antibody that binds to the crosslinked antigen; measuring photon emission from the emittor cell MASSACHUSETTS INSTITUTE OF TECHNOLOGY (US) 2008-07-10 US disclosed
WO-2008078092-A1 FERROCENYL BORONIC ACID BASED SENSOR FOR FLUORIDE AND CYANIDE UNIVERSITY COLLEGE CARDIFF CONSULTANTS LTD. (GB) 2008-07-03 WO disclosed
WO-2008048300-A2 PATHOGEN DETECTION BIOSENSOR MASSACHUSETTS INSTITUTE OF TECHNOLOGY (US) 2008-04-24 WO disclosed
WO-2007046825-A9 OPTOELECTRONIC DETECTION SYSTEM MASSACHUSETTS INST TECHNOLOGY (US) 2007-06-21 WO disclosed
US-20050171390-A1 Wet oxidation process and system USFILTER CORPORATION (US) 2005-08-04 US disclosed
US-4840911-A Use of sulfoxides for testing ionization detector system THE UNITED STATES OF AMERICA AS REPRESENTED BY THE SECRETARY OF THE ARMY (US) 1989-06-20 US disclosed
US-3932566-A Phosphonate polymers CELANESE CORPORATION (US) 1976-01-13 US disclosed