SCHEMBL4363502

SCHEMBL4363502

CCCS(=O)(=O)O/N=C1/SC=C/C1=C(\C#N)c1ccccc1C

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL1920469 1.00
SCHEMBL30018697 1.00
SCHEMBL1920470 1.00
SCHEMBL20343908 1.00
SCHEMBL13900655 1.00
SCHEMBL18121276 1.00
SCHEMBL14882988 1.00
SCHEMBL16434663 0.94 TBXA2R (0.30)
SCHEMBL17833891 0.93 BRAF (0.30)
SCHEMBL18125574 0.93 BRAF (0.30)

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 25 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-2980058-B1 COMPOSITION CONTAINING VINYL-GROUP-CONTAINING COMPOUND TOKYO OHKA KOGYO CO LTD (JP) 2023-05-03 EP disclosed
US-20220326614-A1 POSITIVE-TYPE PHOTOSENSITIVE RESIN COMPOSITION AND PARTITION WALL OF ORGANIC EL ELEMENT SHOWA DENKO K.K. (JP) 2022-10-13 US disclosed
US-10962880-B2 Radiation-sensitive compositions and patterning and metallization processes ROHM AND HAAS ELECTRONIC MATERIALS LLC (US) 2021-03-30 US disclosed
US-20200201175-A1 RADIATION-SENSITIVE COMPOSITIONS AND PATTERNING AND METALLIZATION PROCESSES U.S. BANK TRUST COMPANY, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT 2020-06-25 US disclosed
US-10551745-B2 Photopatternable compositions and methods of fabricating transistor devices using same FLEXTERRA, INC. (US) 2020-02-04 US disclosed
EP-3406640-A1 PHOTOSENSITIVE RESIN COMPOSITION FOR BIOCHIP AND METHOD FOR FORMING LIQUID-REPELLENT FILM AGC INC. (JP) 2018-11-28 EP disclosed
US-20180307140-A1 PHOTOSENSITIVE RESIN COMPOSITION FOR BIOCHIP AND METHOD FOR FORMING LIQUID REPELLENT FILM ASAHI GLASS COMPANY, LIMITED (JP) 2018-10-25 US disclosed
EP-3376286-A1 PHOTOSENSITIVE COMPOSITION FOR BIOCHIP FOR FLUORESCENCE ANALYSIS, METHOD FOR MANUFACTURING BIOCHIP FOR FLUORESCENCE ANALYSIS, AND BIOCHIP FOR FLUORESCENCE ANALYSIS Asahi Glass Company, Limited (JP) 2018-09-19 EP disclosed
US-20180202934-A1 PHOTOSENSITIVE COMPOSITION FOR BIOCHIP FOR FLUORESCENCE ANALYSIS, METHOD FOR PRODUCING BIOCHIP FOR FLUORESCENCE ANALYSIS, AND BIOCHIP FOR FLUORESCENCE ANALYSIS ASAHI GLASS COMPANY, LIMITED (JP) 2018-07-19 US disclosed
US-20180188648-A1 RADIATION-SENSITIVE COMPOSITIONS AND PATTERNING AND METALLIZATION PROCESSES U.S. BANK TRUST COMPANY, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT 2018-07-05 US disclosed
US-20160046552-A1 COMPOSITION CONTAINING VINYL-GROUP-CONTAINING COMPOUND TOKYO OHKA KOGYO CO., LTD. (JP) 2016-02-18 US disclosed
EP-2980058-A1 COMPOSITION CONTAINING VINYL-GROUP-CONTAINING COMPOUND Tokyo Ohka Kogyo Co., Ltd. (JP) 2016-02-03 EP disclosed
US-9244346-B2 Negative-type photosensitive resin composition, pattern forming method, cured film, insulating film, color filter, and display device TOKYO OHKA KOGYO CO., LTD. (JP) 2016-01-26 US disclosed
US-9029270-B2 Phenolic resin composition, and methods for manufacturing cured relief pattern and semiconductor ASAHI KASEI E-MATERIALS CORPORATION (JP) 2015-05-12 US disclosed
US-20140349222-A1 PHOTOSENSITIVE RESIN COMPOSITION, METHOD FOR PRODUCING HARDENED RELIEF PATTERN, SEMICONDUCTOR DEVICE AND DISPLAY DEVICE ASAHI KASEI E-MATERIALS CORPORATION (JP) 2014-11-27 US disclosed
US-20140231729-A1 NEGATIVE-TYPE PHOTOSENSITIVE RESIN COMPOSITION, PATTERN FORMING METHOD, CURED FILM, INSULATING FILM, COLOR FILTER, AND DISPLAY DEVICE TOKYO OHKA KOGYO CO., LTD. (JP) 2014-08-21 US disclosed
US-20140127626-A1 RESIST COMPOSITION FOR NEGATIVE DEVELOPMENT WHICH IS USED FOR FORMATION OF GUIDE PATTERN, GUIDE PATTERN FORMATION METHOD, AND METHOD FOR FORMING PATTERN ON LAYER CONTAINING BLOCK COPOLYMER RIKEN (JP) 2014-05-08 US disclosed
EP-2725423-A1 NEGATIVE-TYPE PHOTOSENSITIVE RESIN COMPOSITION, PATTERN FORMING METHOD, CURED FILM, INSULATING FILM, COLOR FILTER, AND DISPLAY DEVICE Tokyo Ohka Kogyo Co., Ltd. (JP) 2014-04-30 EP disclosed
US-20130168829-A1 PHENOLIC RESIN COMPOSITION, AND METHODS FOR MANUFACTURING CURED RELIEF PATTERN AND SEMICONDUCTOR ASAHI KASEI E-MATERIALS CORPORATION (JP) 2013-07-04 US disclosed
US-20090123838-A1 CATHODE SUBSTRATE TOKYO OHKA KOGYO CO., LTD. (JP) 2009-05-14 US disclosed