SCHEMBL4425224

SCHEMBL4425224

CCCC[O-].CCCC[O-].CCCC[O-].CC[O-].CC[O-].CC[O-].CC[O-].[Al+3].[Ti+4]

nearest known ligand 0.40

Predicted protein targets (top 10)

geneUniProtsupporting neighboursconfidence
TSHR P16473 3/20 0.40
LMNA P02545 1/20 0.40
THRB P10828 1/20 0.38
CES2 O00748 5/20 0.33
CES1 P23141 5/20 0.33
ALDH1A1 P00352 2/20 0.32
TDP1 Q9NUW8 1/20 0.32
SLC22A1 O15245 2/20 0.30
SLC22A2 O15244 1/20 0.30
SMN1; SMN2 Q16637 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL32664559 0.96 TSHR (0.43) TSHRLMNATHRBCES2CES1
SCHEMBL1230320 0.96 TSHR (0.43) TSHRLMNATHRBCES2CES1
SCHEMBL1229985 0.96 TSHR (0.43) TSHRLMNATHRBCES2CES1
SCHEMBL1230027 0.96 TSHR (0.43) TSHRLMNATHRBCES2CES1
SCHEMBL1230281 0.96 TSHR (0.43) TSHRLMNATHRBCES2CES1
SCHEMBL5667021 0.93 TSHR (0.40) TSHRLMNATHRBCES2CES1
SCHEMBL7092821 0.93 TSHR (0.40) TSHRLMNATHRBCES2CES1
SCHEMBL29398848 0.93 TSHR (0.46) TSHRLMNATHRBCES2CES1
SCHEMBL16432 0.93 TSHR (0.46) TSHRLMNATHRBCES2CES1
SCHEMBL28510902 0.93 TSHR (0.46) TSHRLMNATHRBCES2CES1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 3 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-1729892-B1 METHOD FOR COATING A SUBSTRATE USING DIELECTRIC BARRIER DISCHARGE VITO (BE) 2009-06-17 EP claimed
US-20070202270-A1 Method And Apparatus For Coating A Substrate Using Dielectric Barrier Discharge VLAAMSE INSTELLING VOOR TECHNOLOGISCH ONDERZOEK (VITO) (BE) 2007-08-30 US claimed
EP-1582270-A1 Method and apparatus for coating a substrate using dielectric barrier discharge Vlaamse Instelling voor Technologisch Onderzoek (BE) 2005-10-05 EP claimed