SCHEMBL4546723

SCHEMBL4546723

CCC(C)(C)OCC(C)(C)COC(C)(C)CC

nearest known ligand 0.45

Predicted protein targets (top 3)

geneUniProtsupporting neighboursconfidence
TSHR P16473 2/20 0.45
TDP1 Q9NUW8 2/20 0.45
ALDH1A1 P00352 1/20 0.45

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL2612694 0.92 ALDH1A1 (0.39) TSHRTDP1ALDH1A1
SCHEMBL17297801 0.89 ALDH1A1 (0.43) TSHRTDP1ALDH1A1
SCHEMBL21413004 0.89 ALDH1A1 (0.38) TSHRTDP1ALDH1A1
SCHEMBL13453979 0.87 TSHR (0.36) TSHRTDP1ALDH1A1
SCHEMBL19389597 0.86 ALDH1A1 (0.39) TSHRTDP1ALDH1A1
SCHEMBL6444315 0.84 ALDH1A1 (0.38) TSHRTDP1ALDH1A1
SCHEMBL22221689 0.84 ALDH1A1 (0.38) TSHRTDP1ALDH1A1
SCHEMBL2517343 0.84 ALDH1A1 (0.38) TSHRTDP1ALDH1A1
SCHEMBL12318010 0.83 ALDH1A1 (0.33) TSHRTDP1ALDH1A1
SCHEMBL9750838 0.81 TSHR (0.45) TSHRTDP1ALDH1A1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 9 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20130065183-A1 PATTERNING PROCESS AND RESIST COMPOSITION SHIN-ETSU CHEMICAL CO., LTD. (JP) 2013-03-14 US disclosed
US-20120214100-A1 RESIST COMPOSITION AND PATTERNING PROCESS USING THE SAME SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-08-23 US disclosed
US-20120183893-A1 RESIST COMPOSITION AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-07-19 US disclosed
US-20120135350-A1 POSITIVE RESIST COMPOSITION AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-05-31 US disclosed
US-8182980-B2 Good in developability, staining resistance and dispersibility of photosensitive layer in the developing solution FUJIFILM CORPORATION (JP) 2012-05-22 US disclosed
US-20100167207-A1 Chemically amplified positive resist composition and resist patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2010-07-01 US disclosed
US-20080241739-A1 LITHOGRAPHIC PRINTING PLATE PRECURSOR AND METHOD FOR PREPARING LITHOGRAPHIC PRINTING PLATE FUJIFILM CORPORATION (JP) 2008-10-02 US disclosed
US-20070184387-A1 Method for preparation of lithographic printing plate and lithographic printing plate precursor FUJIFILM CORPORATION (JP) 2007-08-09 US disclosed
US-20070020563-A1 Method for preparation of lithographic printing plate and lithographic printing plate precursor FUJI PHOTO FILM CO., LTD. 2007-01-25 US disclosed