SCHEMBL471792

SCHEMBL471792

O=C1NCC(O)CN1

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL11321333 0.82
SCHEMBL164603 0.71
SCHEMBL375923 0.71
SCHEMBL164602 0.71
SCHEMBL351949 0.71
SCHEMBL25421788 0.69
SCHEMBL14826506 0.69 GABRP (0.47)
Hydrochloric Acid SCHEMBL20532011 0.69
SCHEMBL4524661 0.69
SCHEMBL19286787 0.69 CRBN (0.33)

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 190 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-0028204-B1 PRE-EXTENDED ETHERIFIED AMINOPLAST RESINS, PROCESS FOR THEIR PREPARATION AND THEIR USE IN SURFACE COATINGS CIBA-GEIGY AG (CH) 1984-02-29 EP claimed
US-4361594-A COATINGS CIBA-GEIGY CORPORATION (US) 1982-11-30 US claimed
EP-0028204-A2 Pre-extended etherified aminoplast resins, process for their preparation and their use in surface coatings CIBA-GEIGY AG (CH) 1981-05-06 EP claimed
US-20240366615-A1 POLQ INHIBITORS ASTRAZENECA UK LIMITED (GB) 2024-11-07 US disclosed
CN-105849638-B Active light-sensitive or radiation-sensitive resin composition and film 富士胶片株式会社 2020-07-07 CN disclosed
CN-105607426-B Polymer, chemical amplification negative resist composition and pattern forming method SHIN ETSU CHEMICAL COMPANY (JP) 2019-11-01 CN disclosed
EP-3106920-B1 ACTIVE LIGHT SENSITIVE OR RADIATION SENSITIVE RESIN COMPOSITION, ACTIVE LIGHT SENSITIVE OR RADIATION SENSITIVE FILM, MASK BLANK PROVIDED WITH ACTIVE LIGHT SENSITIVE OR RADIATION SENSITIVE FILM, PHOTOMASK, PATTERN FORMING METHOD, METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE FUJIFILM CORP (JP) 2019-07-10 EP disclosed
US-10324374-B2 Active light sensitive or radiation sensitive resin composition, active light sensitive or radiation sensitive film, mask blank provided with active light sensitive or radiation sensitive film, pattern forming method, method for manufacturing electronic device, electronic device and novel compound FUJIFILM CORPORATION (JP) 2019-06-18 US disclosed
US-RE46765-E1 Chemically amplified negative resist composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2018-03-27 US disclosed
US-RE46765-E1 Chemically amplified negative resist composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2018-03-27 US disclosed
US-RE46736-E1 Chemically amplified negative resist composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2018-02-27 US disclosed
EP-0022081-B1 POLYMERISABLE COMPOSITIONS CONTAINING SULPHOXONIUM SALTS AND PROCESS FOR THE PRODUCTION OF HIGH MOLECULAR WEIGHT PRODUCTS FROM THESE COMPOSITIONS BY IRRADIATION CIBA-GEIGY AG (CH) 1983-02-09 EP disclosed
US-4361594-A COATINGS CIBA-GEIGY CORPORATION (US) 1982-11-30 US disclosed
US-4339567-A Photopolymerization by means of sulphoxonium salts CIBA-GEIGY CORPORATION (US) 1982-07-13 US disclosed
EP-0054509-A2 Salt of sulfoxonium as a polymerisation catalyst CIBA-GEIGY AG (CH) 1982-06-23 EP disclosed
EP-0044274-A2 Photopolymerisation by means of carbamoylsulfoxonium salts CIBA-GEIGY AG (CH) 1982-01-20 EP disclosed
US-4299592-A Printing of textile materials BASF AKTIENGESELLSCHAFT (DE) 1981-11-10 US disclosed
EP-0035969-A1 Composition of cationically polymerisable material and a catalyst CIBA-GEIGY AG (CH) 1981-09-16 EP disclosed
EP-0028204-A2 Pre-extended etherified aminoplast resins, process for their preparation and their use in surface coatings CIBA-GEIGY AG (CH) 1981-05-06 EP disclosed
EP-0022081-A1 Polymerisable compositions containing sulphoxonium salts and process for the production of high molecular weight products from these compositions by irradiation CIBA-GEIGY AG (CH) 1981-01-07 EP disclosed