⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.
Similar compounds — the chemically nearest patent molecules
Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.
| Compound | similarity | top predicted | shared targets | |
|---|---|---|---|---|
| SCHEMBL8042996 | 0.91 | — | — | |
| SCHEMBL1282124 | 0.91 | — | — | |
| SCHEMBL780274 | 0.89 | — | — | |
| SCHEMBL716347 | 0.89 | — | — | |
| SCHEMBL3171443 | 0.84 | — | — | |
| SCHEMBL578897 | 0.80 | — | — | |
| SCHEMBL7148695 | 0.80 | — | — | |
| SCHEMBL10519580 | 0.80 | — | — | |
| SCHEMBL7756016 | 0.80 | — | — | |
| SCHEMBL6657283 | 0.80 | — | — |
Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.
Patent provenance — the patents this molecule appears in, and who filed them
Claimed or disclosed in 1527 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.
| Patent | Title | Assignee | Published | Priority | Filing | Country | Status |
|---|---|---|---|---|---|---|---|
| US-12334897-B2 | Bulk-acoustic wave resonator | SAMSUNG ELECTRO-MECHANICS CO., LTD. (KR) | 2025-06-17 | — | — | US | claimed |
| WO-2025053377-A1 | WARMTH MEASUREMENT DEVICE, WARMTH MEASUREMENT SYSTEM, AND WARMTH MEASUREMENT METHOD THEREBY | 재단법인대구경북과학기술원 | 2025-03-13 | — | — | WO | claimed |
| US-12206021-B2 | Negative differential resistance device | SAMSUNG ELECTRONICS CO., LTD. (KR) | 2025-01-21 | — | — | US | claimed |
| US-20240266417-A1 | NEGATIVE CAPACITANCE TRANSISTOR WITH EXTERNAL FERROELECTRIC STRUCTURE | TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. (TW) | 2024-08-08 | — | — | US | claimed |
| US-11961897-B2 | Negative capacitance transistor with external ferroelectric structure | TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. (TW) | 2024-04-16 | — | — | US | claimed |
| US-11956594-B2 | Two-way integrated speaker with piezoelectric diaphragm as tweeter | APPLE INC. (US) | 2024-04-09 | — | — | US | claimed |
| US-20240079496-A1 | NEGATIVE DIFFERENTIAL RESISTANCE DEVICE | SAMSUNG ELECTRONICS CO., LTD. (KR) | 2024-03-07 | — | — | US | claimed |
| US-20240027722-A1 | FLAT-SURFACED TUNABLE OPTICAL LENS | META PLATFORMS TECHNOLOGIES, LLC (US) | 2024-01-25 | — | — | US | claimed |
| US-11764292-B2 | Negative-capacitance field effect transistor | TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. (TW) | 2023-09-19 | — | — | US | claimed |
| US-20230276711-A2 | PIEZOELECTRIC LAMINATE, PRODUCTION METHOD FOR PIEZOELECTRIC LAMINATE, AND PIEZOELECTRIC ELEMENT | SUMITOMO CHEMICAL COMPANY, LIMITED (JP) | 2023-08-31 | — | — | US | claimed |
| CN-1337070-A | Thin film piezoelectric element | MITSUBISHI ELECTRIC CORP (JP) | 2002-02-20 | — | — | CN | claimed |
| US-20020009855-A1 | GATE INSULATOR PROCESS FOR NANOMETER MOSFETS | LATTICE SEMICONDUCTOR CORPORATION | 2002-01-24 | — | — | US | claimed |
| US-20010039087-A1 | Dram trench capacitor | INTERNATIONAL BUSINESS MACHINES CORPORATION | 2001-11-08 | — | — | US | claimed |
| US-6297086-B1 | Application of excimer laser anneal to DRAM processing | INTERNATIONAL BUSINESS MACHINES CORPORATION | 2001-10-02 | — | — | US | claimed |
| US-6222218-B1 | DRAM trench | INTERNATIONAL BUSINESS MACHINES CORPORATION | 2001-04-24 | — | — | US | claimed |
| US-6090658-A | Method of forming a capacitor including a bottom silicon diffusion barrier layer and a top oxygen diffusion barrier layer | LG SEMICON CO., LTD. (KR) | 2000-07-18 | — | — | US | claimed |
| EP-0987765-A2 | DRAM trench capacitor | International Business Machines Corporation (US) | 2000-03-22 | — | — | EP | claimed |
| US-5539695-A | Fast access multi-bit random access memory | SOLIDAS CORPORATION (US) | 1996-07-23 | — | — | US | claimed |
| WO-1996007774-A1 | PREPARATION OF LEAD-ZIRCONIUM-TITANIUM FILM AND POWDER BY ELECTRODEPOSITION | MIDWEST RESEARCH INSTITUTE (US) | 1996-03-14 | — | — | WO | claimed |
| US-5462647-A | Preparation of lead-zirconium-titanium film and powder by electrodeposition | MIDWEST RESEARCH INSTITUTE (US) | 1995-10-31 | — | — | US | claimed |