SCHEMBL4761256

SCHEMBL4761256

C[SiH](C)O[Si](C)(C)O[Si](C)(C)O[Si](C)(C)O[Si](C)(C)O[Si](C)(C)O[Si](C)(C)O[Si](C)(C)O[Si](C)(C)O[Si](C)(C)O[Si](C)(C)O[Si](C)(C)O[Si](C)(C)O[Si](C)(C)O[Si](C)(C)O[Si](C)(C)O[Si](C)(C)O[Si](C)(C)O[Si](C)(C)O[Si](C)(C)O[Si](C)(C)O[Si](C)(C)O[Si](C)(C)O[Si](C)(C)O[Si](C)(C)O[Si](C)(C)O[Si](C)(C)O[Si](C)(C)O[Si](C)(C)O[Si](C)(C)O[Si](C)(C)O[Si](C)(C)O[Si](C)(C)O[Si](C)(C)O[Si](C)(C)O[Si](C)(C)O[Si](C)(C)O[Si](C)(C)O[Si](C)(C)O[Si](C)(C)O[SiH](C)C

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL14902958 1.00
SCHEMBL9004508 1.00
SCHEMBL9004497 1.00
SCHEMBL9178213 1.00
SCHEMBL11950506 1.00
SCHEMBL9004474 1.00
SCHEMBL9004473 1.00
SCHEMBL9004493 1.00
SCHEMBL3868343 1.00
SCHEMBL9004501 1.00

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 19 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20140342530-A1 TEMPORARY ADHESIVE MATERIAL FOR WAFER, FILM FOR TEMPORARY ADHESION USING SAME, WAFER PROCESSING LAMINATE, AND METHOD FOR PRODUCING THIN WAFER USING SAME SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-11-20 US disclosed
US-8889810-B2 Adhesive composition and adhesive dry film SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-11-18 US disclosed
US-8865391-B2 Chemically amplified negative resist composition, photo-curable dry film, making method, pattern forming process, and electric/electronic part protecting film SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-10-21 US disclosed
US-8808865-B2 Adhesive composition, and adhesive sheet, semiconductor apparatus-protective material and semiconductor apparatus using the same SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-08-19 US disclosed
US-20140154868-A1 WAFER PROCESSING LAMINATE, WAFER PROCESSING MEMBER, TEMPORARY ADHERING MATERIAL FOR PROCESSING WAFER, AND MANUFACTURING METHOD OF THIN WAFER SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-06-05 US disclosed
US-8729148-B2 Photocurable dry film, method for preparing same, patterning method and film for protecting electric and electronic parts SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-05-20 US disclosed
US-20130302983-A1 TEMPORARY ADHESIVE FOR WAFER PROCESSING, MEMBER FOR WAFER PROCESSING USING THE SAME, WAFER PROCESSED BODY, AND METHOD FOR PRODUCING THIN WAFER SHIN-ETSU CHEMICAL CO., LTD. (JP) 2013-11-14 US disclosed
US-20130289225-A1 ADHESIVE COMPOSITION, AND ADHESIVE SHEET, SEMICONDUCTOR APPARATUS-PROTECTIVE MATERIAL AND SEMICONDUCTOR APPARATUS USING THE SAME SHIN-ETSU CHEMICAL CO., LTD. (JP) 2013-10-31 US disclosed
US-20130220687-A1 WAFER PROCESS BODY, WAFER PROCESSING MEMBER, WAFER PROCESSING TEMPORARY ADHESIVE MATERIAL, AND METHOD FOR MANUFACTURING THIN WAFER SHIN-ETSU CHEMICAL CO., LTD. (JP) 2013-08-29 US disclosed
US-8501879-B2 Adhesive composition, adhesive sheet, semiconductor apparatus protection material, and semiconductor apparatus SHIN-ETSU CHEMICAL CO., LTD. (JP) 2013-08-06 US disclosed
US-8481244-B2 Epoxy-containing polymer, photo-curable resin composition, patterning process, and electric/electronic part protective film SHIN-ETSU CHEMICAL CO., LTD. (JP) 2013-07-09 US disclosed
US-20130149493-A1 CHEMICALLY AMPLIFIED NEGATIVE RESIST COMPOSITION, PHOTO-CURABLE DRY FILM, MAKING METHOD, PATTERN FORMING PROCESS, AND ELECTRIC/ELECTRONIC PART PROTECTING FILM SHIN-ETSU CHEMICAL CO., LTD. (JP) 2013-06-13 US disclosed
US-20130149645-A1 CHEMICALLY AMPLIFIED NEGATIVE RESIST COMPOSITION, PHOTO-CURABLE DRY FILM, MAKING METHOD, PATTERN FORMING PROCESS, AND ELECTRIC/ELECTRONIC PART PROTECTING FILM SHIN-ETSU CHEMICAL CO., LTD. (JP) 2013-06-13 US disclosed
US-20130108866-A1 WAFER PROCESSING LAMINATE, WAFER PROCESSING MEMBER, TEMPORARY BONDING ARRANGEMENT, AND THIN WAFER MANUFACTURING METHOD SHIN-ETSU CHEMICAL CO., LTD. (JP) 2013-05-02 US disclosed
US-20120235284-A1 FILM-LIKE WAFER MOLD MATERIAL, MOLDED WAFER, AND SEMICONDUCTOR DEVICE SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-09-20 US disclosed
US-20120213993-A1 ADHESIVE COMPOSITION AND ADHESIVE DRY FILM SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-08-23 US disclosed
US-20120108762-A1 ADHESIVE COMPOSITION, ADHESIVE SHEET, SEMICONDUCTOR APPARATUS PROTECTION MATERIAL, AND SEMICONDUCTOR APPARATUS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-05-03 US disclosed
US-20110143092-A1 PHOTOCURABLE DRY FILM, METHOD FOR PREPARING SAME, PATTERNING METHOD AND FILM FOR PROTECTING ELECTRIC AND ELECTRONIC PARTS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2011-06-16 US disclosed
US-20110076465-A1 EPOXY-CONTAINING POLYMER, PHOTO-CURABLE RESIN COMPOSITION, PATTERNING PROCESS, AND ELECTRIC/ELECTRONIC PART PROTECTIVE FILM SHIN-ETSU CHEMICAL CO., LTD. (JP) 2011-03-31 US disclosed