SCHEMBL4872016

SCHEMBL4872016

C=CC(=O)OCC(C1CCCC1)C1CCCC1

nearest known ligand 0.55

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
TSHR P16473 8/20 0.55
ALDH1A1 P00352 7/20 0.39
TP53 P04637 5/20 0.39
HIF1A Q16665 3/20 0.39
CYP3A4 P08684 3/20 0.39
HSD17B10 Q99714 1/20 0.39
EPHX1 P07099 2/20 0.38
NPSR1 Q6W5P4 2/20 0.37
SMN1; SMN2 Q16637 2/20 0.36
MAPK1 P28482 1/20 0.36
HPGD P15428 1/20 0.36
GAA P10253 1/20 0.35
MEN1 O00255 2/20 0.34
LMNA P02545 2/20 0.34
KMT2A Q03164 2/20 0.34
MITF O75030 1/20 0.34
MAPT P10636 1/20 0.34
ALOX15 P16050 1/20 0.34
HTT P42858 1/20 0.34
NLRP1 Q9C000 1/20 0.34

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL4872026 0.84 TSHR (0.40) TSHRALDH1A1TP53HIF1ACYP3A4
SCHEMBL23494377 0.82 TSHR (0.56) TSHRALDH1A1TP53HIF1ACYP3A4
SCHEMBL8408099 0.81 TSHR (0.44) TSHRALDH1A1TP53HIF1ACYP3A4
SCHEMBL31519532 0.80 TSHR (0.44) TSHRALDH1A1TP53HIF1ACYP3A4
SCHEMBL4325855 0.77 TSHR (0.53) TSHRALDH1A1TP53HIF1ACYP3A4
SCHEMBL9443516 0.77 TSHR (0.42) TSHRALDH1A1TP53HIF1ACYP3A4
SCHEMBL1231300 0.75 TSHR (0.47) TSHRALDH1A1TP53HIF1ACYP3A4
SCHEMBL28027923 0.75 TSHR (0.51) TSHRALDH1A1TP53HIF1ACYP3A4
SCHEMBL9167203 0.74 TSHR (0.46) TSHRALDH1A1TP53HIF1ACYP3A4
SCHEMBL11875789 0.74 TSHR (0.50) TSHRALDH1A1EPHX1NPSR1HPGD

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 18 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-7364833-B2 coating uniformity on large-scale substrate; acrylic ester polymer; mixed solvent of ethylene diglycol methylethyl ether (EDM) and a solvent having a vapor pressure lower than the EDM; photosensitizer SAMSUNG ELECTRONICS CO., LTD (KR) 2008-04-29 US claimed
US-20050266339-A1 coating uniformity on large-scale substrate; acrylic ester polymer; mixed solvent of ethylene diglycol methylethyl ether (EDM) and a solvent having a vapor pressure lower than the EDM; photosensitizer SAMSUNG DISPLAY CO., LTD. (KR) 2005-12-01 US claimed
WO-2004107053-A1 POSITIVE PHOTORESIST COMPOSITION FOR SPINLESS (SLIT) COATING ADMS TECHNOLOGY CO., LTD. (KR) 2004-12-09 WO claimed
WO-2004107052-A1 NEGATIVE PHOTORESIST COMPOSITION FOR SPINLESS (SLIT) COATING ADMS TECHNOLOGY CO., LTD. (KR) 2004-12-09 WO claimed
WO-2004097522-A1 NEGATIVE RESIST COMPOSITION FOR ORGANIC INSULATOR OF HIGH APERTURE LCD ADMS TECHNOLOGY CO. LTD. (KR) 2004-11-11 WO claimed
CN-108693710-B Positive photosensitive polysiloxane composition 奇美实业股份有限公司 2022-12-02 CN disclosed
EP-3438222-B1 PHOTOCURABLE SEALANT COMPOSITION, COMMODITY, AND ORGANIC SOLAR CELL ZEON CORP (JP) 2022-05-04 EP disclosed
US-20190270919-A1 PHOTOCURABLE SEALANT COMPOSITION, ARTICLE AND ORGANIC SOLAR CELL ZEON CORPORATION (JP) 2019-09-05 US disclosed
EP-3438222-A1 PHOTOCURABLE SEALANT COMPOSITION, COMMODITY, AND ORGANIC SOLAR CELL Zeon Corporation (JP) 2019-02-06 EP disclosed
US-20150030836-A1 POLYMERIZABLE COMPOSITION, POLYMERIZATION PRODUCT, IMAGE DISPLAY DEVICE, AND METHOD FOR PRODUCING SAME SHOWA DENKO K.K. (JP) 2015-01-29 US disclosed
US-20150005406-A1 URETHANE (METH)ACRYLATE AND MOISTURE-PROOF INSULATING COATING MATERIAL SHOWA DENKO K.K. (JP) 2015-01-01 US disclosed
CN-100538517-C Negative resist composition for organic insulating layer of high aperture LCD ADMS TECHNOLOGY CO LTD (KR) 2009-09-09 CN disclosed
US-7364833-B2 coating uniformity on large-scale substrate; acrylic ester polymer; mixed solvent of ethylene diglycol methylethyl ether (EDM) and a solvent having a vapor pressure lower than the EDM; photosensitizer SAMSUNG ELECTRONICS CO., LTD (KR) 2008-04-29 US disclosed
CN-1781057-A Negative resist composition for organic insulating layer of high aperture LCD ADMS TECHNOLOGY CO LTD (KR) 2006-05-31 CN disclosed
US-20050266339-A1 coating uniformity on large-scale substrate; acrylic ester polymer; mixed solvent of ethylene diglycol methylethyl ether (EDM) and a solvent having a vapor pressure lower than the EDM; photosensitizer SAMSUNG DISPLAY CO., LTD. (KR) 2005-12-01 US disclosed
WO-2004107052-A1 NEGATIVE PHOTORESIST COMPOSITION FOR SPINLESS (SLIT) COATING ADMS TECHNOLOGY CO., LTD. (KR) 2004-12-09 WO disclosed
WO-2004107053-A1 POSITIVE PHOTORESIST COMPOSITION FOR SPINLESS (SLIT) COATING ADMS TECHNOLOGY CO., LTD. (KR) 2004-12-09 WO disclosed
WO-2004097522-A1 NEGATIVE RESIST COMPOSITION FOR ORGANIC INSULATOR OF HIGH APERTURE LCD ADMS TECHNOLOGY CO. LTD. (KR) 2004-11-11 WO disclosed