SCHEMBL4886637

SCHEMBL4886637

O=C(C1=CCCC=C1)C1C=CCCC1

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL1785347 0.70
SCHEMBL7158482 0.70 HDAC2 (0.43)
SCHEMBL2988371 0.69
SCHEMBL1357104 0.69 MCL1 (0.45)
SCHEMBL27639267 0.68
SCHEMBL242415 0.68
SCHEMBL14398568 0.68
SCHEMBL28000893 0.68
SCHEMBL3628741 0.67 MAPT (0.32)
SCHEMBL172482 0.67

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 16 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20080131812-A1 Resin for printing plate material and lithographic printing plate material by use thereof KONICA MINOLTA MEDICAL & GRAPHIC, INC. (JP) 2008-06-05 US disclosed
EP-1441256-B1 Radiation-sensitive resin composition JSR CORP (JP) 2006-05-31 EP disclosed
EP-0789278-B1 Radiation-sensitive resin composition JSR CORP (JP) 2005-05-04 EP disclosed
EP-1441256-A1 Radiation-sensitive resin composition JSR Corporation (JP) 2004-07-28 EP disclosed
US-6727032-B1 USEFUL IN MICRO-PROCESSING USING VARIOUS RADIATIONS, E.G., FAR-ULTRAVIOLET RADIATION SUCH AS KRF EXCIMER LASER OR ARF EXCIMER LASER, X RAYS SUCH AS SYNCHROTRON RADIATION, CHARGED PARTICLE RADIATION SUCH AS ELECTRON BEAM, ETC. JSR CORPORATION (JP) 2004-04-27 US disclosed
US-6692887-B1 COPOLYMER OF SUCH AS MALEIC ANHYDRIDE AND NORBORNENE ACID CLEAVABLE DERIVATIVE; TRANSPARENCY; DRY ETCHING RESISTANCE; PHOTORESIST PATTERN WITH HIGH ADHESION, SENSITIVITY, RESOLUTION AND DEVELOPABILITY JSR CORPORATION (JP) 2004-02-17 US disclosed
US-6382125-B1 Temperature control material and temperature control method using the same TOSHIBA TEC KABUSHIKI KAISHA (JP) 2002-05-07 US disclosed
EP-0443533-B1 Positive photoresist composition FUJI PHOTO FILM CO LTD (JP) 1998-09-30 EP disclosed
US-5753406-A ALKALI-SOLUBLE NOVOLAK RESIN, 1,2-QUINONEDIAZIDE COMPOUND, AND SOLVENT JAPAN SYNTHETIC RUBBER CO., LTD. (JP) 1998-05-19 US disclosed
EP-0789278-A2 Radiation-sensitive resin composition JAPAN SYNTHETIC RUBBER CO., LTD. (JP) 1997-08-13 EP disclosed
US-5482816-A RESISTS JAPAN SYNTHETIC RUBBER CO., LTD. (JP) 1996-01-09 US disclosed
US-5478691-A Blend of alkali-soluble novolak resin and 1,2-quinonediazidecompound JAPAN SYNTHETIC RUBBER CO., LTD. (JP) 1995-12-26 US disclosed
EP-0365318-B1 Radiation-sensitive resin composition JAPAN SYNTHETIC RUBBER CO LTD (JP) 1994-03-16 EP disclosed
EP-0443533-A2 Positive photoresist composition FUJI PHOTO FILM CO., LTD. (JP) 1991-08-28 EP disclosed
EP-0365318-A2 Radiation-sensitive resin composition JAPAN SYNTHETIC RUBBER CO., LTD. (JP) 1990-04-25 EP disclosed
US-4015017-A Certain biphenyl derivatives used to treat disorders caused by increased capillary permeability LABORATOIRES PHARMASCIENCE (FR) 1977-03-29 US disclosed