SCHEMBL4926613

SCHEMBL4926613

O=S(=O)(O)c1cc(Cl)cc(/N=N/c2ccc(O)cc2O)c1O

nearest known ligand 1.00 ✓ in ChEMBL — recovers established targets

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
▸ NSD2 O96028 2/20 1.00
▸ MMP14 P50281 2/20 1.00
▸ CASP6 P55212 2/20 1.00
▸ EGFR P00533 1/20 0.49
▸ MAPT P10636 4/20 0.44
▸ MEN1 O00255 3/20 0.44
▸ KMT2A Q03164 3/20 0.44
▸ ALDH1A1 P00352 2/20 0.44
▸ NPC1 O15118 2/20 0.44
▸ RAB9A P51151 2/20 0.44
▸ POLB P06746 3/20 0.43
▸ NPSR1 Q6W5P4 2/20 0.43
▸ LMNA P02545 2/20 0.43
▸ HTT P42858 1/20 0.43
▸ MAPK1 P28482 2/20 0.39
▸ KDM4E B2RXH2 1/20 0.38
▸ IDO1 P14902 1/20 0.38
▸ TDO2 P48775 1/20 0.38
▸ GFER P55789 1/20 0.38
▸ TDP1 Q9NUW8 1/20 0.38

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL1472403 1.00 NSD2 (1.00) NSD2MMP14CASP6EGFRMAPT
SCHEMBL29407520 1.00 NSD2 (1.00) NSD2MMP14CASP6EGFRMAPT
SCHEMBL11760061 0.99 NSD2 (0.97) NSD2MMP14CASP6EGFRMAPT
SCHEMBL11760057 0.86 NSD2 (0.76) NSD2MMP14CASP6EGFRMAPT
SCHEMBL11646620 0.84 NSD2 (0.72) NSD2MMP14CASP6EGFRMAPT
SCHEMBL11646608 0.84 NSD2 (0.72) NSD2MMP14CASP6EGFRMAPT
SCHEMBL10898942 0.78 NSD2 (0.63) NSD2MMP14CASP6MEN1KMT2A
SCHEMBL29670503 0.77 NSD2 (0.62) NSD2MMP14CASP6MEN1KMT2A
SCHEMBL10894104 0.76 NSD2 (0.61) NSD2MMP14CASP6MAPTMEN1
SCHEMBL5148283 0.76 CYP1A2 (0.67) NSD2MMP14CASP6MEN1KMT2A

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 26 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-11359136-B2 Colorimetric indicators for photocurable sealants THE BOEING COMPANY (US) 2022-06-14 — — US claimed
US-20080145942-A1 METAL DETECTION REAGENTS INCLUDING AN AMMONIUM SALT AND METHODS OF USING THE SAME SAMSUNG ELECTRONICS CO., LTD. 2008-06-19 — — US claimed
US-20050227363-A1 Methods of monitoring rinsing solutions and related systems and reagents SAMSUNG ELECTRONICS CO., LTD. (KR) 2005-10-13 — — US claimed
US-11359136-B2 Colorimetric indicators for photocurable sealants THE BOEING COMPANY (US) 2022-06-14 — — US disclosed
US-20170292068-A1 Colorimetric Indicators for Photocurable Sealants THE BOEING COMPANY 2017-10-12 — — US disclosed
US-20080145942-A1 METAL DETECTION REAGENTS INCLUDING AN AMMONIUM SALT AND METHODS OF USING THE SAME SAMSUNG ELECTRONICS CO., LTD. 2008-06-19 — — US disclosed
US-7201871-B2 Specimen having capability of separating solid component ARKRAY INC. (JP) 2007-04-10 — — US disclosed
US-7189576-B2 Method for measuring substance and testing piece ARKRAY INC. (JP) 2007-03-13 — — US disclosed
US-7153696-B2 Method for measuring substance and testing piece ARKRAY INC. (JP) 2006-12-26 — — US disclosed
US-7098038-B2 Method for measuring substance and testing piece ARKRAY INC. (JP) 2006-08-29 — — US disclosed
EP-0860695-B1 Method for measuring an analyte and corresponding device ARKRAY INC (JP) 2006-01-04 — — EP disclosed
US-20030166295-A1 Method for measuring substance and testing piece FUKUOKA TAKAO (JP) 2003-09-04 — — US disclosed
US-20030044316-A1 Specimen having capability of separating solid component ARKRAY INC. (JP) 2003-03-06 — — US disclosed
EP-1271143-A1 SPECIMEN HAVING CAPABILITY OF SEPARATING SOLID COMPONENT ARKRAY, Inc. (JP) 2003-01-02 — — EP disclosed
EP-0860695-A9 METHOD OF MEASUREMENT OF MATERIAL AND TESTPIECE KABUSHIKI KAISHA KYOTO DAIICHI KAGAKU (JP) 2001-10-17 — — EP disclosed
EP-1091958-A1 SALTS OF PAROXETINE SMITHKLINE BEECHAM PLC (GB) 2001-04-18 — — EP disclosed
WO-2000001692-A1 SALTS OF PAROXETINE SMITHKLINE BEECHAM PLC (GB) 2000-01-13 — — WO disclosed
EP-0860695-A1 METHOD OF MEASUREMENT OF MATERIAL AND TESTPIECE KABUSHIKI KAISHA KYOTO DAIICHI KAGAKU (JP) 1998-08-26 — — EP disclosed
US-5790627-A Method and apparatus for observing a specimen using an X-ray microscope RESEARCH DEVELOPMENT CORP. (JP) 1998-08-04 — — US disclosed
EP-0763512-A1 AIR BAG GAS GENERATING AGENT OTSUKA KAGAKU KABUSHIKI KAISHA (JP) 1997-03-19 — — EP disclosed
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