SCHEMBL4930769

SCHEMBL4930769

F[SiH3].[N]

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL35979 0.87
Ammonia Solution, Strong SCHEMBL5697677 0.75
SCHEMBL31634299 0.75
SCHEMBL497495 0.75
SCHEMBL21353820 0.75
Water SCHEMBL3273561 0.75
SCHEMBL21174925 0.75
SCHEMBL20768012 0.75
SCHEMBL31622460 0.75
SCHEMBL1061 0.50

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 20 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-101397138-B Method for making high-purity silicon dioxide and metallurgical grade polycrystalline silicon DING YUANJIE 2013-06-19 CN claimed
CN-101397138-A Method for making high-purity silicon dioxide and metallurgical grade polycrystalline silicon YUANJIE DING (CN) 2009-04-01 CN claimed
CN-101176189-A Low dielectric constant cryptocrystal layer and nanostructure TUBITAK (TR) 2008-05-07 CN claimed
CN-1754853-A Formula and method for manufacturing hydrophilic antifogging surface of glass substrate ONID TECHNOLOGY CORP (CN) 2006-04-05 CN claimed
CN-116130356-A Workpiece processing using deposition and etching processes 玛特森技术公司 2023-05-16 CN disclosed
CN-101397138-B Method for making high-purity silicon dioxide and metallurgical grade polycrystalline silicon DING YUANJIE 2013-06-19 CN disclosed
CN-101397138-B Method for making high-purity silicon dioxide and metallurgical grade polycrystalline silicon DING YUANJIE 2013-06-19 CN disclosed
CN-101176189-B Low dielectric constant cryptocrystal layer and nanostructure TUBITAK 2011-05-11 CN disclosed
CN-101397138-A Method for making high-purity silicon dioxide and metallurgical grade polycrystalline silicon YUANJIE DING (CN) 2009-04-01 CN disclosed
CN-101397138-A Method for making high-purity silicon dioxide and metallurgical grade polycrystalline silicon YUANJIE DING (CN) 2009-04-01 CN disclosed
CN-101176189-A Low dielectric constant cryptocrystal layer and nanostructure TUBITAK (TR) 2008-05-07 CN disclosed
US-20080045025-A1 SEMICONDUCTOR DEVICE MANUFACTURING METHOD TOKYO ELECTRON LIMITED (JP) 2008-02-21 US disclosed
CN-1754853-A Formula and method for manufacturing hydrophilic antifogging surface of glass substrate ONID TECHNOLOGY CORP (CN) 2006-04-05 CN disclosed
CN-1036853-C Utilization of catalyst in polymerization of olefin hydrocarbon PHILLIPS PETROLEUM CO (US) 1997-12-31 CN disclosed
EP-0284693-B1 Low temperature, plasma method of making plasma deposited coatings ENERGY CONVERSION DEVICES INC (US) 1994-08-31 EP disclosed
CN-1060475-A The application of catalyzer in olefinic polymerization PHILLIPS PETROLEUM CO (US) 1992-04-22 CN disclosed
CN-1013200-B Alumina treated with silicon and/or fluorine PHILLIPS PETROLEUM CO (US) 1991-07-17 CN disclosed
EP-0284693-A2 Low temperature, plasma method of making plasma deposited coatings ENERGY CONVERSION DEVICES, INC. (US) 1988-10-05 EP disclosed
US-4737379-A VACUUM DEPOSITION USING MICROWAVES ENERGY CONVERSION DEVICES, INC. (US) 1988-04-12 US disclosed
CN-85101209-A Alumina treated with silicon and/or fluorine 1987-01-24 CN disclosed