SCHEMBL5031065

SCHEMBL5031065

Cc1cc(C(C)(c2ccc(O)cc2)c2ccc(O)c(C)c2)ccc1O

nearest known ligand 0.75

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
ESR1 P03372 14/20 0.75
ESR2 Q92731 9/20 0.75
AR P10275 4/20 0.53
HPGD P15428 2/20 0.48
HSD17B10 Q99714 2/20 0.48
LMNA P02545 1/20 0.48
TYR P14679 1/20 0.48
CYP3A4 P08684 1/20 0.48
TSHR P16473 1/20 0.48
SLC6A2 P23975 1/20 0.48
SLC6A4 P31645 1/20 0.48
HTR6 P50406 1/20 0.48
ESRRG P62508 1/20 0.48
SLC6A3 Q01959 1/20 0.48
MEN1 O00255 1/20 0.47
KMT2A Q03164 1/20 0.47
TDP1 Q9NUW8 2/20 0.46
TP53 P04637 1/20 0.46
BACE1 P56817 1/20 0.44
ALDH1A1 P00352 1/20 0.43

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL12005784 0.94 ESR1 (0.68) ESR1ESR2ARHPGDHSD17B10
SCHEMBL20198395 0.94 ESR1 (0.68) ESR1ESR2ARHPGDHSD17B10
SCHEMBL12004569 0.94 ESR1 (0.68) ESR1ESR2ARHPGDHSD17B10
SCHEMBL3646850 0.94 ESR1 (0.68) ESR1ESR2ARHPGDHSD17B10
SCHEMBL6523088 0.93 ESR1 (0.71) ESR1ESR2ARHPGDHSD17B10
SCHEMBL22271942 0.93 ESR1 (0.71) ESR1ESR2ARHPGDHSD17B10
SCHEMBL29471727 0.91 ESR1 (0.80) ESR1ESR2ARHPGDHSD17B10
SCHEMBL29465776 0.91 ESR1 (0.80) ESR1ESR2ARHPGDHSD17B10
SCHEMBL217305 0.91 ESR1 (0.80) ESR1ESR2ARHPGDHSD17B10
SCHEMBL3645152 0.89 ESR1 (0.62) ESR1ESR2ARESRRGMEN1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 17 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20160200877-A1 SILICONE SKELETON-CONTAINING POLYMER COMPOUND, CHEMICALLY AMPLIFIED NEGATIVE RESIST COMPOSITION, PHOTO-CURABLE DRY FILM AND METHOD FOR PRODUCING SAME, PATTERNING PROCESS, LAYERED PRODUCT, SUBSTRATE, AND SEMICONDUCTOR APPARATUS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2016-07-14 US disclosed
US-20160200877-A1 SILICONE SKELETON-CONTAINING POLYMER COMPOUND, CHEMICALLY AMPLIFIED NEGATIVE RESIST COMPOSITION, PHOTO-CURABLE DRY FILM AND METHOD FOR PRODUCING SAME, PATTERNING PROCESS, LAYERED PRODUCT, SUBSTRATE, AND SEMICONDUCTOR APPARATUS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2016-07-14 US disclosed
US-7615331-B2 Photosensitive resin composition, production method of cured relief pattern using the same and semiconductor device FUJIFILM CORPORATION (JP) 2009-11-10 US disclosed
US-7615331-B2 Photosensitive resin composition, production method of cured relief pattern using the same and semiconductor device FUJIFILM CORPORATION (JP) 2009-11-10 US disclosed
US-20080234426-A1 Curable Composition and Cured Object Thereof KANEKA CORPORATION (JP) 2008-09-25 US disclosed
US-20080081294-A1 PHOTOSENSITIVE RESIN COMPOSITION, PRODUCTION METHOD OF CURED RELIEF PATTERN USING THE SAME AND SEMICONDUCTOR DEVICE FUJIFILM CORPORATION (JP) 2008-04-03 US disclosed
US-20080081294-A1 PHOTOSENSITIVE RESIN COMPOSITION, PRODUCTION METHOD OF CURED RELIEF PATTERN USING THE SAME AND SEMICONDUCTOR DEVICE FUJIFILM CORPORATION (JP) 2008-04-03 US disclosed
EP-1906246-A2 Photosensitive resin composition, production method of cured relief pattern using the same and semiconductor device FUJIFILM Corporation (JP) 2008-04-02 EP disclosed
EP-1852472-A1 CURABLE COMPOSITION AND CURED OBJECT THEREOF Kaneka Corporation (JP) 2007-11-07 EP disclosed
US-7008883-B2 Photoresist composition for forming an insulation film, insulation film for organic electroluminescence devices and process for producing the insulation film ZEON CORPORATION (JP) 2006-03-07 US disclosed
US-20040096771-A1 Photoresist composition for forming an insulation film, insulation film for organic electroluminescence element and method for itis formation ZEON CORPORATION (JP) 2004-05-20 US disclosed
EP-1321821-A1 PHOTORESIST COMPOSITION FOR FORMING INSULATION FILM, INSULATION FILM FOR ORGANIC ELECTROLUMINESCENCE ELEMENT AND METHOD FOR ITS FORMATION NIPPON ZEON CO., LTD. (JP) 2003-06-25 EP disclosed
US-6013407-A PHOTORESISTS WITH PHENOLIC RESINS, QUINONEDIAZIDE SULFONATES, PHOTOSENSITIVE AGENTS AND PHENOLIC COMPOUNDS NIPPON ZEON CO., LTD. (JP) 2000-01-11 US disclosed
EP-0709358-B1 NOVEL CLATHRATE COMPOUND, PROCESS FOR PRODUCING THE SAME, AND ANTIFOULING AGENT NIPPON SODA CO (JP) 1999-10-13 EP disclosed
EP-0831370-A1 POSITIVE RESIST COMPOSITION NIPPON ZEON CO., LTD. (JP) 1998-03-25 EP disclosed
EP-0816349-A1 NOVEL CLATHRATE COMPOUND, PROCESS FOR PRODUCING THE SAME, AND COATING COMPOSITION CONTAINING SAID NOVEL CLATHRATE COMPOUND ROHM AND HAAS COMPANY (US) 1998-01-07 EP disclosed
EP-0709358-A1 NOVEL CLATHRATE COMPOUND, PROCESS FOR PRODUCING THE SAME, AND ANTIFOULING AGENT NIPPON SODA CO., LTD. (JP) 1996-05-01 EP disclosed