SCHEMBL503581

SCHEMBL503581

O=C(O)[CH]CC(F)(F)F

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL429298 0.74
Bicarbonate SCHEMBL31651142 0.73 ALDH1A1 (0.33)
SCHEMBL455399 0.72 TSHR (0.46)
SCHEMBL14801551 0.72 TSHR (0.46)
SCHEMBL28016567 0.71
SCHEMBL1515294 0.69 HCAR2 (0.42)
Bicarbonate SCHEMBL22261442 0.69 ALDH1A1 (0.39)
SCHEMBL11928278 0.67 EP300 (0.37)
SCHEMBL8595653 0.65 GABRR1 (0.52)
Bicarbonate SCHEMBL30475361 0.65 GRIK1 (0.31)

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 8 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-0242080-B1 COPOLYMER COMPOSITIONS PARAGON OPTICAL INC (US) 1992-12-16 EP claimed
US-20140147794-A1 METHOD OF FORMING PHOTORESIST PATTERN JSR CORPORATION (JP) 2014-05-29 US disclosed
US-8435718-B2 Upper layer-forming composition and photoresist patterning method JSR CORPORATION (JP) 2013-05-07 US disclosed
US-20120171613-A1 UPPER LAYER FILM-FORMING COMPOSITION AND METHOD OF FORMING PHOTORESIST PATTERN JSR CORPORATION (JP) 2012-07-05 US disclosed
EP-1950610-B1 IMMERSION LITHOGRAPHIC COMPOSITION FOR FORMING UPPER FILM AND METHOD FOR FORMING PHOTORESIST PATTERN JSR CORP (JP) 2012-05-02 EP disclosed
US-20120028198-A1 UPPER LAYER-FORMING COMPOSITION AND PHOTORESIST PATTERNING METHOD JSR CORPORATION (JP) 2012-02-02 US disclosed
US-20100003615-A1 UPPER LAYER-FORMING COMPOSITION AND PHOTORESIST PATTERNING METHOD JSR CORPORATION (JP) 2010-01-07 US disclosed
EP-1950610-A1 COMPOSITION FOR FORMING UPPER FILM AND METHOD FOR FORMING PHOTORESIST PATTERN JSR Corporation (JP) 2008-07-30 EP disclosed