SCHEMBL5176405

SCHEMBL5176405

C=C(C)C(=O)OC(C)(C)CC(C)=O

nearest known ligand 0.41

Predicted protein targets (top 4)

geneUniProtsupporting neighboursconfidence
ALDH1A1 P00352 2/20 0.41
TSHR P16473 3/20 0.38
THRB P10828 1/20 0.35
GAA P10253 1/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL20629674 0.85 ALDH1A1 (0.39) ALDH1A1TSHRTHRBGAA
SCHEMBL1067047 0.82 ALDH1A1 (0.44) ALDH1A1TSHRTHRBGAA
SCHEMBL22353268 0.82 ALDH1A1 (0.44) ALDH1A1TSHRTHRBGAA
SCHEMBL7978787 0.80 ALDH1A1 (0.35) ALDH1A1TSHRTHRB
SCHEMBL21496027 0.80 ALDH1A1 (0.42) ALDH1A1TSHRTHRBGAA
SCHEMBL347723 0.80 ALDH1A1 (0.42) ALDH1A1TSHRTHRBGAA
SCHEMBL1371760 0.80 ALDH1A1 (0.42) ALDH1A1TSHRTHRBGAA
SCHEMBL23494347 0.79 TSHR (0.48) ALDH1A1TSHRTHRB
SCHEMBL20798785 0.79 ALDH1A1 (0.34) ALDH1A1TSHRTHRB
SCHEMBL21023743 0.79 GAA (0.43) ALDH1A1TSHRTHRBGAA

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 19 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20230400769-A1 ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE FILM, PATTERN FORMING METHOD, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE FUJIFILM CORPORATION (JP) 2023-12-14 US disclosed
US-20230375925-A1 ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE FILM, PATTERN FORMING METHOD, METHOD FOR MANUFACTURING ELECTRONIC DEVICE, COMPOUND, AND RESIN FUJIFILM CORPORATION (JP) 2023-11-23 US disclosed
US-20230367210-A1 ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE FILM, PATTERN FORMING METHOD, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE FUJIFILM CORPORATION (JP) 2023-11-16 US disclosed
US-20230221640-A1 ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, RESIST FILM, PATTERN FORMING METHOD, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE FUJIFILM CORPORATION (JP) 2023-07-13 US disclosed
US-20230185192-A1 ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, RESIST FILM, PATTERN FORMING METHOD, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE FUJIFILM CORPORATION (JP) 2023-06-15 US disclosed
CN-106103517-A Fluorine system surfactant, coating composition, protective agent compositions and solidfied material DIC株式会社 2016-11-09 CN disclosed
WO-2015150508-A1 AQUEOUS POLYMER COMPOSITIONS BASF SE (DE) 2015-10-08 WO disclosed
EP-1393922-B1 Ink jet recording material AGFA GEVAERT (BE) 2007-06-06 EP disclosed
CN-1934499-A Positively radiation-sensitive resin composition JSR CORP (JP) 2007-03-21 CN disclosed
CN-1806208-A Photocurable resin composition DSM IP ASSETS BV (NL) 2006-07-19 CN disclosed
US-6924011-B2 Ink jet recording material AGFA GEVAERT (BE) 2005-08-02 US disclosed
US-6794108-B1 COMPOUND CAPABLE OF GENERATING ACID BY ACTINIC RADIATION; POLYMER AND COMPOUND THAT DECOMPOSE TO A SULFONIC ACID; STORAGE STABILITY FUJI PHOTO FILM CO., LTD. (JP) 2004-09-21 US disclosed
US-20040043163-A1 Iink jet recording material AGFA-GEVAERT (BE) 2004-03-04 US disclosed
EP-1393922-A1 Improved ink jet recording material Agfa-Gevaert (BE) 2004-03-03 EP disclosed
US-6329125-B2 AN ALKALI-INSOLUBLE COMPOUND HAVING A PROTECTED ALKALI SOLUBLE GROUP IN WHICH PROTECTIVE GROUP CONTAINS AN ALICYCLIC HYDROCARBON GROUP HAVING BONDED TO A CARBON ATOM AND CLEAVED UPON ACTION OF AN ACID GENERATED FROM A PHOTOACID GEENERATOR FUJITSU LIMITED (JP) 2001-12-11 US disclosed
US-20010003640-A1 Chemically amplified resist compositions and process for the formation of resist patterns FUJITSU LIMITED (JP) 2001-06-14 US disclosed
US-6200725-B1 A SUBSTITUTED ALICYCLIC HYDROCARBON GROUP WHICH ACTS AS A PROTECTIVE GROUP TO AN ADDITIONAL POLYMER WHEN EXPOSED TO A POLYACID GENERATOR WHICH IS CAPABLE OF DECOMPOSING TO PATTERN RADIATION EPOSURE, PRODUCES ACID, CAPABLE OF DEPROTECTION FUJITSU LIMITED (JP) 2001-03-13 US disclosed
US-6013416-A FILMS FOR PHOTORESISTS PATTERNS FUJITSU LIMITED (JP) 2000-01-11 US disclosed
US-5968713-A ALKALI DEVELOPED RESISTS AND FILM FORMING COMPOUNDS WITH ALKALI SOLUBLE GROUPS AND GENERATION FUJITSU LIMITED (JP) 1999-10-19 US disclosed