SCHEMBL518580

SCHEMBL518580

O=S(=O)(O)CCCSCCSCCCS(=O)(=O)O

nearest known ligand 0.48

Predicted protein targets (top 7)

geneUniProtsupporting neighboursconfidence
APP P05067 1/20 0.48
PTGS1 P23219 1/20 0.39
PDE4A P27815 1/20 0.39
LMNA P02545 1/20 0.39
SLC6A6 P31641 1/20 0.39
CYP2C19 P33261 1/20 0.39
BLM P54132 1/20 0.39

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL27175673 0.97 APP (0.46) APPPTGS1PDE4ALMNASLC6A6
SCHEMBL564743 0.97 APP (0.46) APPPTGS1PDE4ALMNASLC6A6
SCHEMBL517829 0.97 APP (0.50) APPPTGS1PDE4ALMNASLC6A6
SCHEMBL565134 0.94 APP (0.48) APPPTGS1PDE4ALMNASLC6A6
SCHEMBL15297851 0.94 APP (0.48) APPPTGS1PDE4ALMNASLC6A6
SCHEMBL28042194 0.92 APP (0.46) APPPTGS1PDE4ALMNASLC6A6
SCHEMBL27175667 0.92 APP (0.46) APPPTGS1PDE4ALMNASLC6A6
SCHEMBL27175669 0.92 APP (0.46) APPPTGS1PDE4ALMNASLC6A6
SCHEMBL15297847 0.89 APP (0.39) APPPTGS1PDE4ALMNASLC6A6
SCHEMBL14856462 0.87 TDP1 (0.48) APPPTGS1PDE4ALMNASLC6A6

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 180 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-114086223-A Preparation method of acid bath, copper deposit and plating homogenizing agent 永星化工(上海)有限公司 2022-02-25 CN claimed
CN-112899736-A PCB high-longitudinal-transverse-through-hole electro-coppering additive and preparation method thereof 深圳中科利尔科技有限公司 2021-06-04 CN claimed
EP-3483307-B1 PLATING COMPOSITIONS FOR ELECTROLYTIC COPPER DEPOSITION, ITS USE AND A METHOD FOR ELECTROLYTICALLY DEPOSITING A COPPER OR COPPER ALLOY LAYER ONTO AT LEAST ONE SURFACE OF A SUBSTRATE ATOTECH DEUTSCHLAND GMBH (DE) 2020-04-01 EP claimed
EP-2576867-B1 METHOD FOR ETCHING SURFACES OF CIRCUIT STRUCTURES OF PLATED COPPER AND PLATED COPPER ALLOYS ATOTECH DEUTSCHLAND GMBH (DE) 2018-04-04 EP claimed
US-9493886-B2 Low internal stress copper electroplating method ROHM AND HAAS ELECTRONIC MATERIALS LLC 2016-11-15 US claimed
EP-3088570-A2 ACID COPPER ELECTROPLATING BATH AND METHOD FOR ELECTROPLATING LOW INTERNAL STRESS AND GOOD DUCTILITY COPPER DEPOSITS Rohm and Haas Electronic Materials LLC (US) 2016-11-02 EP claimed
US-20160312372-A1 ACID COPPER ELECTROPLATING BATH AND METHOD FOR ELECTROPLATING LOW INTERNAL STRESS AND GOOD DUCTIILITY COPPER DEPOSITS ROHM AND HAAS ELECTRONIC MATERIALS LLC 2016-10-27 US claimed
US-20130240368-A1 LOW INTERNAL STRESS COPPER ELECTROPLATING METHOD ROHM AND HAAS ELECTRONIC MATERIAL LLC (US) 2013-09-19 US claimed
US-20130112566-A1 METHOD FOR ETCHING OF COPPER AND COPPER ALLOYS ATOTECH DEUTSCHLAND GMBH (DE) 2013-05-09 US claimed
EP-2576867-A1 METHOD FOR ETCHING OF COPPER AND COPPER ALLOYS Atotech Deutschland GmbH (DE) 2013-04-10 EP claimed
EP-1651801-B1 AQUEOUS, ACIDIC SOLUTION AND METHOD FOR ELECTROLYTICALLY DEPOSITING COPPER COATINGS AS WELL AS USE OF SAID SOLUTION ATOTECH DEUTSCHLAND GMBH (DE) 2008-01-23 EP claimed
US-20060017169-A1 Electroplated interconnection structures on integrated circuit chips INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2006-01-26 US claimed
US-6946716-B2 Electroplated interconnection structures on integrated circuit chips INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2005-09-20 US claimed
US-20040229456-A1 Electroplated interconnection structures on integrated circuit chips INTERNATIONAL BUSINESS MACHINES (US) 2004-11-18 US claimed
US-6709562-B1 VOID-FREE AND SEAMLESS; COPPER IS SUPERIOR TO THE ELECTROMIGRATION RESISTANCE OF ALCU INTERNATIONAL BUSINESS MACHINES CORPORATION 2004-03-23 US claimed
EP-0785297-B1 An aqueous acid bath for the electrodeposition of a shiny and tear-free copper coating and its application ATOTECH DEUTSCHLAND GMBH (DE) 2000-01-05 EP claimed
EP-0932913-A1 ELECTROPLATED INTERCONNECTION STRUCTURES ON INTEGRATED CIRCUIT CHIPS INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 1999-08-04 EP claimed
WO-1998027585-A1 ELECTROPLATED INTERCONNECTION STRUCTURES ON INTEGRATED CIRCUIT CHIPS INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 1998-06-25 WO claimed
US-4975159-A Copper salt, inorganic acid and alkoxylated lactam; reinforcing electroconductivity of printed circuit SCHERING AKTIENGESELLSCHAFT (DE) 1990-12-04 US claimed
US-4181582-A Galvanic acid copper bath and method SCHERING AKTIENGESELLSCHAFT (DE) 1980-01-01 US claimed