⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.
Similar compounds — the chemically nearest patent molecules
Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.
| Compound | similarity | top predicted | shared targets | |
|---|---|---|---|---|
| Propene SCHEMBL4734549 | 0.77 | — | — | |
| Butadiene SCHEMBL17686472 | 0.77 | — | — | |
| SCHEMBL27833821 | 0.76 | — | — | |
| SCHEMBL28503941 | 0.74 | — | — | |
| Propene SCHEMBL28044215 | 0.74 | — | — | |
| SCHEMBL8418494 | 0.74 | — | — | |
| SCHEMBL7182769 | 0.74 | TSHR (0.32) | — | |
| Acrylic Acid SCHEMBL29234341 | 0.72 | LMNA (0.48) | — | |
| Acrylic Acid SCHEMBL31139542 | 0.72 | LMNA (0.48) | — | |
| Ethylene SCHEMBL28590172 | 0.72 | — | — |
Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.
Patent provenance — the patents this molecule appears in, and who filed them
Claimed or disclosed in 3 patents. claimed = in the patent's claims; disclosed = body only.
| Patent | Title | Assignee | Published | Priority | Filing | Country | Status |
|---|---|---|---|---|---|---|---|
| US-20040033445-A1 | Method of forming a photoresist pattern and method for patterning a layer using a photoresist | SAMSUNG ELECTRONICS CO., LTD. (KR) | 2004-02-19 | — | — | US | claimed |
| US-7297466-B2 | Method of forming a photoresist pattern and method for patterning a layer using a photoresist | SAMSUNG ELECTRONICS CO., LTD. (KR) | 2007-11-20 | — | — | US | disclosed |
| US-20040033445-A1 | Method of forming a photoresist pattern and method for patterning a layer using a photoresist | SAMSUNG ELECTRONICS CO., LTD. (KR) | 2004-02-19 | — | — | US | disclosed |