SCHEMBL544958

SCHEMBL544958

[Cu].[Ti].[W]

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL1805488 1.00
SCHEMBL8700654 0.87
SCHEMBL29254371 0.87
SCHEMBL27752876 0.87
SCHEMBL15168920 0.87
SCHEMBL3417125 0.87
SCHEMBL29158131 0.87
SCHEMBL6281291 0.87
SCHEMBL31668846 0.87
SCHEMBL27717155 0.87

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 309 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-119050064-A Low-warpage fan-out type wafer level packaging structure and preparation method thereof 贵州振华风光半导体股份有限公司 2024-11-29 CN claimed
CN-117696037-A Air purifying material based on copper-tungsten-titanium composite oxide and preparation method thereof 哈尔滨工业大学(深圳)(哈尔滨工业大学深圳科技创新研究院) 2024-03-15 CN claimed
CN-116490015-A Alloy electrode of perovskite photoelectric device 广东脉络能源科技有限公司 2023-07-25 CN claimed
CN-116072548-A Method for manufacturing semiconductor device 颀邦科技股份有限公司 2023-05-05 CN claimed
CN-114792680-A Power management chip packaging structure and manufacturing method thereof 江苏长电科技股份有限公司 2022-07-26 CN claimed
US-9805977-B1 Integrated circuit structure having through-silicon via and method of forming same GLOBALFOUNDRIES INC. (US) 2017-10-31 US claimed
CN-103531491-B Semiconductor process, semiconductor structure and packaging structure thereof 颀邦科技股份有限公司 2017-04-12 CN claimed
CN-103871912-B Semiconductor process and structure thereof 颀邦科技股份有限公司 2017-04-12 CN claimed
US-9577025-B2 Metal-insulator-metal (MIM) capacitor in redistribution layer (RDL) of an integrated device QUALCOMM INCORPORATED (US) 2017-02-21 US claimed
CN-104741774-B The welding method of tungsten titanium copper target material assembly 宁波江丰电子材料股份有限公司 2016-08-31 CN claimed
US-20120184099-A1 LASER REMOVAL OF CONDUCTIVE SEED LAYERS TAMARACK SCIENTIFIC CO. INC. (US) 2012-07-19 US claimed
CN-101944434-B polymer composite material embedded micro-capacitor and preparation method thereof UNIV TSINGHUA 2012-05-09 CN claimed
US-8110508-B2 Method of forming a bump structure using an etching composition for an under bump metallurgy layer SAMSUNG ELECTRONICS CO., LTD. (KR) 2012-02-07 US claimed
CN-101534103-B Method for manufacturing radio frequency filter capable of being integrated on single chip SHANGHAI INST MICROSYS & INF 2011-06-15 CN claimed
CN-101534103-A Radio frequency filter capable of being integrated in single chip and manufacturing method SHANGHAI INST MICROSYS & INF 2009-09-16 CN claimed
US-20090176363-A1 Etching composition for an under-bump metallurgy layer and method of forming a bump structure using the same SAMSUNG ELECTRONICS CO., LTD. (KR) 2009-07-09 US claimed
CN-101440491-A Method for forming convex point structure formed by etching composition for convex point lower metal layer SAMSUNG ELECTRONICS CO LTD (KR) 2009-05-27 CN claimed
CN-100405543-C Manufacturing method of CMOS (complementary Metal-oxide-semiconductor transistor) process-compatible inductor or mutual inductor with embedded suspension solenoid structure SHANGHAI INST OF MICRO SYSTEM (CN) 2008-07-23 CN claimed
CN-101110354-A Manufacturing method of CMOS process compatible suspension type variable capacitor SHANGHAI INST MICROSYS & INF (CN) 2008-01-23 CN claimed
CN-1889233-A Manufacturing method of CMOS (complementary Metal-oxide-semiconductor transistor) process-compatible inductor or mutual inductor with embedded suspension solenoid structure SHANGHAI INST OF MICRO SYSTEM (CN) 2007-01-03 CN claimed