SCHEMBL546128

SCHEMBL546128

OC1C2CC3CC(C2)C(O)C1C3

nearest known ligand 0.61

Predicted protein targets (top 1)

geneUniProtsupporting neighboursconfidence
CYP2C9 P11712 1/20 0.61

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL12861440 0.82 CYP2C9 (0.48) CYP2C9
SCHEMBL12861478 0.82 CYP2C9 (0.48) CYP2C9
SCHEMBL9223064 0.82 CYP2C9 (0.48) CYP2C9
SCHEMBL546366 0.80 CYP2C9 (0.42) CYP2C9
Acrylic Acid SCHEMBL5147956 0.80 CYP2C9 (0.41) CYP2C9
Methacrylic Acid SCHEMBL1821220 0.78 CYP2C9 (0.39) CYP2C9
SCHEMBL7258876 0.77 CYP2C9 (0.42) CYP2C9
SCHEMBL14473378 0.77 CYP2C9 (0.42) CYP2C9
Adamantan-2-Ol SCHEMBL8931261 0.76 CYP2C9 (1.00) CYP2C9
Adamantan-2-Ol SCHEMBL350390 0.76 CYP2C9 (1.00) CYP2C9

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 95 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-1693705-B1 Positive resist composition and pattern forming method using the resist composition FUJIFILM CORP (JP) 2014-01-22 EP claimed
US-8206886-B2 Photosensitive composition and pattern-forming method using the photosensitive composition FUJIFILM CORPORATION (JP) 2012-06-26 US claimed
US-8158326-B2 Photosensitive composition, compound for use in the photosensitive composition, and method of pattern formation with the photosensitive composition FUJIFILM CORPORATION (JP) 2012-04-17 US claimed
EP-1906238-B1 Photosensitive composition and pattern forming method using the same FUJIFILM CORP (JP) 2011-11-09 EP claimed
US-7807329-B2 Photosensitive composition and pattern-forming method using the same FUJIFILM CORPORATION (JP) 2010-10-05 US claimed
EP-1703326-B1 Photosensitive composition and pattern-forming method using the same FUJIFILM CORP (JP) 2010-03-10 EP claimed
US-7541131-B2 Resist composition, compound for use in the resist composition and pattern forming method using the resist composition FUJIFILM CORPORATION (JP) 2009-06-02 US claimed
US-20090075202-A1 PHOTOSENSITIVE COMPOSITION, COMPOUND FOR USE IN THE PHOTOSENSITIVE COMPOSITION, AND METHOD OF PATTERN FORMATION WITH THE PHOTOSENSITIVE COMPOSITION FUJIFILM CORPORATION (JP) 2009-03-19 US claimed
US-20080274421-A1 PHOTOSENSITIVE COMPOSITION AND PATTERN FORMING METHOD USING THE SAME FUJIFILM CORPORATION (JP) 2008-11-06 US claimed
EP-1906238-A2 Photosensitive composition and pattern forming method using the same FUJIFILM Corporation (JP) 2008-04-02 EP claimed
US-20060040203-A1 Photosensitive composition, compound for use in the photosensitive composition, and method of pattern formation with the photosensitive composition FUJI PHOTO FILM CO., LTD. 2006-02-23 US claimed
US-20050266336-A1 Photosensitive composition and pattern-forming method using the photosensitive composition FUJI PHOTO FILM CO., LTD. 2005-12-01 US claimed
EP-1591832-A2 Photosensitive composition, compound used in the same, and patterning method using the same Fuji Photo Film Co., Ltd. (JP) 2005-11-02 EP claimed
US-20050238992-A1 Photosensitive composition, compound used in the same, and patterning method using the same FUJI PHOTO FILM CO., LTD. 2005-10-27 US claimed
EP-1566692-A1 Photosensitive composition and pattern-forming method using the photosensitive composition FUJI PHOTO FILM CO., LTD. (JP) 2005-08-24 EP claimed
US-20050079441-A1 Positive resist composition and pattern forming method using the same FUJI PHOTO FILM CO., LTD. 2005-04-14 US claimed
EP-1522891-A1 Positive resist composition and pattern forming method using the same FUJI PHOTO FILM CO., LTD. (JP) 2005-04-13 EP claimed
EP-1519228-A2 Positive resist composition and pattern formation method using the same FUJI PHOTO FILM CO., LTD. (JP) 2005-03-30 EP claimed
US-20050064329-A1 Positive resist composition and pattern formation method using the same FUJI PHOTO FILM CO., LTD. 2005-03-24 US claimed
US-20040248035-A1 Positive-working resist composition FUJI PHOTO FILM CO., LTD. 2004-12-09 US claimed