SCHEMBL546366

SCHEMBL546366

OC1C2CC3CC1C(O)C(C2)C3O

nearest known ligand 0.42

Predicted protein targets (top 1)

geneUniProtsupporting neighboursconfidence
CYP2C9 P11712 1/20 0.42

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL26967984 0.80
SCHEMBL546128 0.80 CYP2C9 (0.61) CYP2C9
SCHEMBL15973892 0.76 CYP2C9 (0.64) CYP2C9
SCHEMBL9395183 0.76 LMNA (0.36) CYP2C9
SCHEMBL9243420 0.71
SCHEMBL7964314 0.68 LMNA (0.36) CYP2C9
SCHEMBL2571064 0.67 CYP2C9 (0.38) CYP2C9
SCHEMBL15973517 0.67 CYP2C9 (0.53) CYP2C9
SCHEMBL8254998 0.65 ALDH1A1 (0.39) CYP2C9
SCHEMBL5383090 0.65 FUCA1 (0.33) CYP2C9

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 62 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-102513023-B Trimeric surfactant and synthetic method thereof UNIV GUANGDONG TECHNOLOGY 2014-04-02 CN claimed
EP-1693705-B1 Positive resist composition and pattern forming method using the resist composition FUJIFILM CORP (JP) 2014-01-22 EP claimed
CN-102513023-A Trimeric surfactant and its synthetic method UNIV GUANGDONG TECHNOLOGY 2012-06-27 CN claimed
US-8206886-B2 Photosensitive composition and pattern-forming method using the photosensitive composition FUJIFILM CORPORATION (JP) 2012-06-26 US claimed
US-8158326-B2 Photosensitive composition, compound for use in the photosensitive composition, and method of pattern formation with the photosensitive composition FUJIFILM CORPORATION (JP) 2012-04-17 US claimed
EP-1906238-B1 Photosensitive composition and pattern forming method using the same FUJIFILM CORP (JP) 2011-11-09 EP claimed
US-7807329-B2 Photosensitive composition and pattern-forming method using the same FUJIFILM CORPORATION (JP) 2010-10-05 US claimed
EP-1703326-B1 Photosensitive composition and pattern-forming method using the same FUJIFILM CORP (JP) 2010-03-10 EP claimed
US-7541131-B2 Resist composition, compound for use in the resist composition and pattern forming method using the resist composition FUJIFILM CORPORATION (JP) 2009-06-02 US claimed
US-20090075202-A1 PHOTOSENSITIVE COMPOSITION, COMPOUND FOR USE IN THE PHOTOSENSITIVE COMPOSITION, AND METHOD OF PATTERN FORMATION WITH THE PHOTOSENSITIVE COMPOSITION FUJIFILM CORPORATION (JP) 2009-03-19 US claimed
US-7323286-B2 Photosensitive composition, compound used in the same, and patterning method using the same FUJIFILM CORPORATION (JP) 2008-01-29 US claimed
US-20060210919-A1 Photosensitive composition and pattern-forming method using the same FUJI PHOTO FILM CO., LTD. 2006-09-21 US claimed
EP-1703326-A2 Photosensitive composition and pattern-forming method using the same FUJI PHOTO FILM CO., LTD. (JP) 2006-09-20 EP claimed
US-20060194147-A1 Resist composition, compound for use in the resist composition and pattern forming method using the resist composition FUJI PHOTO FILM CO., LTD. 2006-08-31 US claimed
EP-1693705-A2 Resist composition, compound for use in the resist composition and pattern forming method using the resist composition FUJI PHOTO FILM CO., LTD. (JP) 2006-08-23 EP claimed
US-20060040203-A1 Photosensitive composition, compound for use in the photosensitive composition, and method of pattern formation with the photosensitive composition FUJI PHOTO FILM CO., LTD. 2006-02-23 US claimed
US-20050266336-A1 Photosensitive composition and pattern-forming method using the photosensitive composition FUJI PHOTO FILM CO., LTD. 2005-12-01 US claimed
EP-1591832-A2 Photosensitive composition, compound used in the same, and patterning method using the same Fuji Photo Film Co., Ltd. (JP) 2005-11-02 EP claimed
US-20050238992-A1 Photosensitive composition, compound used in the same, and patterning method using the same FUJI PHOTO FILM CO., LTD. 2005-10-27 US claimed
EP-1566692-A1 Photosensitive composition and pattern-forming method using the photosensitive composition FUJI PHOTO FILM CO., LTD. (JP) 2005-08-24 EP claimed