SCHEMBL5556231

SCHEMBL5556231

CCCC(O)C(CC)CC

nearest known ligand 0.75

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
LMNA P02545 2/20 0.75
TSHR P16473 6/20 0.37
CHRM1 P11229 1/20 0.33
AKR1A1 P14550 1/20 0.33
CHRM3 P20309 1/20 0.33
HTR2A P28223 1/20 0.33
HTR2C P28335 1/20 0.33
ADRA1A P35348 1/20 0.33
HRH1 P35367 1/20 0.33
DRD3 P35462 1/20 0.33
SLC6A3 Q01959 1/20 0.33
HDAC1 Q13547 1/20 0.33
HDAC2 Q92769 1/20 0.33
TDP1 Q9NUW8 1/20 0.33
SPHK1 Q9NYA1 2/20 0.32
METAP1 P53582 1/20 0.32
CYP3A4 P08684 3/20 0.32
NFKB1 P19838 2/20 0.32
NPSR1 Q6W5P4 2/20 0.32
FDPS P14324 1/20 0.32

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL20298310 0.91 LMNA (0.71) LMNATSHRCHRM1AKR1A1CHRM3
Ethohexadiol SCHEMBL27621584 0.89 LMNA (0.95) LMNATSHRTDP1SPHK1CYP3A4
Ethohexadiol SCHEMBL6282991 0.86 LMNA (1.00) LMNATSHRTDP1SPHK1CYP3A4
Ethohexadiol SCHEMBL38007 0.86 LMNA (1.00) LMNATSHRTDP1SPHK1CYP3A4
SCHEMBL5674208 0.84 LMNA (0.56) LMNATSHRFDPS
SCHEMBL11601577 0.84 LMNA (0.62) LMNATSHR
Ethohexadiol SCHEMBL11502837 0.84 LMNA (0.95) LMNATSHRTDP1SPHK1CYP3A4
Ethohexadiol SCHEMBL10731659 0.84 LMNA (0.95) LMNATSHRTDP1SPHK1CYP3A4
Ethohexadiol SCHEMBL610774 0.84 LMNA (0.95) LMNATSHRTDP1SPHK1CYP3A4
Ethohexadiol SCHEMBL20787860 0.84 LMNA (0.95) LMNATSHRTDP1SPHK1CYP3A4

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 18 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-3558903-B1 PROCESS FOR PHOSPHORYLATING A COMPLEX ALCOHOL AVECHO BIOTECHNOLOGY LTD (AU) 2024-07-03 EP disclosed
US-11753435-B2 Process AVECHO BIOTECHNOLOGY LIMITED (AU) 2023-09-12 US disclosed
US-20220106353-A1 PROCESS AVECHO BIOTECHNOLOGY LIMITED (AU) 2022-04-07 US disclosed
CN-110662733-A Method of producing a composite material 埃维科生物技术有限公司 2020-01-07 CN disclosed
US-20190330260-A1 PROCESS AVECHO BIOTECHNOLOGY LIMITED (AU) 2019-10-31 US disclosed
EP-3558903-A1 PROCESS Avecho Biotechnology Limited (AU) 2019-10-30 EP disclosed
WO-2018112512-A1 PROCESS PHOSPHAGENICS LIMITED (AU) 2018-06-28 WO disclosed
US-9504753-B2 Nanometer-sized prodrugs of NSAIDs CEDARS-SINAI MEDICAL CENTER (US) 2016-11-29 US disclosed
US-8178639-B2 Polymer for forming organic anti-reflective coating layer DONGJIN SEMICHEM CO., LTD. (KR) 2012-05-15 US disclosed
US-8026042-B2 Polymer for organic anti-reflective coating layer and composition including the same DONGJIN SEMICHEM CO., LTD. (KR) 2011-09-27 US disclosed
US-20110003478-A1 POLYMER FOR ORGANIC ANTI-REFLECTIVE COATING LAYER AND COMPOSITION INCLUDING THE SAME KIM SANG-JEOUNG 2011-01-06 US disclosed
US-20100266967-A1 POLYMER FOR FORMING ORGANIC ANTI-REFLECTIVE COATING LAYER DONGJIN SEMICHEM CO., LTD (KR) 2010-10-21 US disclosed
US-7629110-B2 polyethersiloxane copolymers used as photoresists for forming semiconductor circuit patterns, using photolithography DONGJIN SEMICHEM CO., LTD. (KR) 2009-12-08 US disclosed
US-7465531-B2 Copolyalkylene oxide of optionally substituted alkyl 1,2-epoxypropionate and 9-anthracenylmethyl 2,3-epoxypropionate; between etching layer and photoresist to absorb exposure light in photolithography; prevents the occurrence of standing wave, undercutting and notching to obtain uniform pattern profile DONGJIN SEMICHEM CO., LTD. (KR) 2008-12-16 US disclosed
US-20080131815-A1 polyethersiloxane copolymers used as photoresists for forming semiconductor circuit patterns, using photolithography DONGJIN SEMICHEM CO., LTD. (KR) 2008-06-05 US disclosed
US-7368219-B2 Polymer for forming anti-reflective coating layer DONGJIN SEMICHEM CO., LTD. (KR) 2008-05-06 US disclosed
US-7309561-B2 Polymer for forming anti-reflective coating layer DONGJIN SEMICHEM CO., LTD. (KR) 2007-12-18 US disclosed
US-7282530-B2 Polymer for forming anti-reflective coating layer DONGJIN SEMICHEM CO., LTD. (KR) 2007-10-16 US disclosed