Tetrylammonium

Tetrylammonium

SCHEMBL5571730

CCCCCC(=O)[O-].CC[N+](CC)(CC)CC

nearest known ligand 0.74

Full drug profile on Sugi Atlas →

Predicted protein targets (top 6)

geneUniProtsupporting neighboursconfidence
CA1 P00915 1/20 0.62
FABP3 P05413 7/20 0.59
CES2 O00748 4/20 0.54
CES1 P23141 4/20 0.54
BBOX1 O75936 2/20 0.52
NFKB1 P19838 1/20 0.52

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
Dodecanoate SCHEMBL5153789 0.98 FABP3 (0.62) CA1FABP3CES2CES1BBOX1
Stearic Acid SCHEMBL867328 0.98 FABP3 (0.62) CA1FABP3CES2CES1BBOX1
Behenic Acid SCHEMBL5679682 0.98 FABP3 (0.62) CA1FABP3CES2CES1BBOX1
Decanoic Acid SCHEMBL5571660 0.98 FABP3 (0.62) CA1FABP3CES2CES1BBOX1
Nonanoate SCHEMBL5875028 0.98 FABP3 (0.62) CA1FABP3CES2CES1BBOX1
Palmitic Acid SCHEMBL5153293 0.98 FABP3 (0.62) CA1FABP3CES2CES1BBOX1
Heptanoate SCHEMBL5874922 0.98 FABP3 (0.62) CA1FABP3CES2CES1BBOX1
Octanoic Acid SCHEMBL5574283 0.98 FABP3 (0.62) CA1FABP3CES2CES1BBOX1
Myristic Acid SCHEMBL5153714 0.98 FABP3 (0.62) CA1FABP3CES2CES1BBOX1
Tetrylammonium SCHEMBL5574992 0.93 CA1 (0.73) CA1FABP3CES2CES1BBOX1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 6 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20070135565-A1 COMPOSITION FOR FORMING POROUS FILM, POROUS FILM AND METHOD FOR FORMING THE SAME, INTERLEVEL INSULATOR FILM, AND SEMICONDUCTOR DEVICE MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. (JP) 2007-06-14 US disclosed
US-7132473-B2 Composition for forming porous film, porous film and method for forming the same, interlevel insulator film, and semiconductor device MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. (JP) 2006-11-07 US disclosed
US-7128976-B2 Composition for film formation, method of film formation, and silica-based film JSR CORPORATION (JP) 2006-10-31 US disclosed
EP-1568744-A1 COMPOSITION FOR POROUS FILM FORMATION, POROUS FILM, PROCESS FOR PRODUCING THE SAME, INTERLAYER INSULATION FILM AND SEMICONDUCTOR DEVICE MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. (JP) 2005-08-31 EP disclosed
US-20040219372-A1 Composition for forming porous film, porous film and method for forming the same, interlevel insulator film, and semiconductor device MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 2004-11-04 US disclosed
US-20030091838-A1 Composition for film formation, method of film formation, and silica-based film JSR CORPORATION (JP) 2003-05-15 US disclosed