SCHEMBL65024

SCHEMBL65024

C=COC[C@H](OC=C)[C@@H](OC=C)[C@H](OC=C)[C@H](O)CO

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL2239500 0.88 LMNA (0.33)
SCHEMBL66298 0.87
SCHEMBL8607012 0.80 LMNA (0.41)
SCHEMBL1743646 0.73
SCHEMBL8946937 0.72 LMNA (0.35)
SCHEMBL17128630 0.72 LMNA (0.35)
SCHEMBL3824062 0.69 LMNA (0.31)
SCHEMBL28075212 0.69 LMNA (0.50)
SCHEMBL2965228 0.66 CA1 (0.36)
SCHEMBL1412725 0.66

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 709 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
WO-2017009301-A1 ANTIFOULING COMPOSITION JOTUN A/S (NO) 2017-01-19 WO claimed
US-5939235-A PHOTOSENSITIVE CURING AGENTS HAVING AT LEAST TWO ENOL ETHER GROUPS; PERMITING THE USE OF LIGHT RAYS EXTENDING OVER A WIDE RANGE OF WAVELENGTH, PROVIDING CLEAR POSITIVE IMAGES AND A WIDE DEVELOPMENT LATITUDE FUJI PHOTO FILM CO., LTD. (JP) 1999-08-17 US claimed
US-5364738-A Divinyl ethers, solubility in developers FUJI PHOTO FILM CO., LTD. (JP) 1994-11-15 US claimed
US-20240192591-A1 RESIST COMPOSITION AND PATTERN FORMING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2024-06-13 US disclosed
US-20240184199-A1 Onium Salt, Resist Composition, And Patterning Process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2024-06-06 US disclosed
US-12001139-B2 Resist composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2024-06-04 US disclosed
US-20240176235-A1 RESIST COMPOSITION AND PATTERN FORMING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2024-05-30 US disclosed
US-20240176237-A1 Onium Salt, Resist Composition, And Patterning Process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2024-05-30 US disclosed
US-20240176238-A1 SULFONIUM SALT, RESIST COMPOSITION AND PATTERN FORMING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2024-05-30 US disclosed
US-11994799-B2 Negative resist composition and pattern forming process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2024-05-28 US disclosed
US-20240160101-A1 RESIST COMPOSITION AND PATTERN FORMING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2024-05-16 US disclosed
EP-0908783-A1 Resist compositions, their preparation and use for patterning processes SHIN-ETSU CHEMICAL CO., LTD. (JP) 1999-04-14 EP disclosed
US-5882844-A SOLVENTS, PHOTORESISTS, PHOTOACID GENERATOR AND COMPOUNDS WITH VINYL ETHERS SHIN-ETSU CHEMICAL CO., LTD. (JP) 1999-03-16 US disclosed
US-5876900-A POLYHYDROXYSTYRENE POLYMER SHIN-ETSU CHEMICAL CO., LTD. (JP) 1999-03-02 US disclosed
US-5658708-A RADIATION ABSORBING MATERIAL CONTAINING ENOL ETHER GROUPS FUJI PHOTO FILM CO., LTD. (JP) 1997-08-19 US disclosed
US-5637428-A POSITIVE WORKING PHOTOSENSITIVE COMPOSITION FUJI PHOTO FILM CO., LTD. (JP) 1997-06-10 US disclosed
EP-0702271-A1 Positive working printing plate FUJI PHOTO FILM CO., LTD. (JP) 1996-03-20 EP disclosed
US-5364738-A Divinyl ethers, solubility in developers FUJI PHOTO FILM CO., LTD. (JP) 1994-11-15 US disclosed
EP-0609684-A1 Positive-working light-sensitive composition Fuji Photo Film Co., Ltd. (JP) 1994-08-10 EP disclosed
EP-0536690-A1 Light-sensitive composition FUJI PHOTO FILM CO., LTD. (JP) 1993-04-14 EP disclosed