SCHEMBL6663425

SCHEMBL6663425

CC(C)(C)OOC(=O)c1cc(C(=O)OOC(C)(C)C)c(C(=O)OOC(C)(C)C)cc1C(=O)OOC(C)(C)C

nearest known ligand 0.55

Predicted protein targets (top 4)

geneUniProtsupporting neighboursconfidence
TSHR P16473 2/20 0.55
TDP1 Q9NUW8 2/20 0.55
ALDH1A1 P00352 1/20 0.55
HSD17B10 Q99714 1/20 0.55

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL5397124 0.92 ALDH1A1 (0.48) TSHRTDP1ALDH1A1HSD17B10
SCHEMBL11683945 0.86 ALDH1A1 (0.42) TSHRTDP1ALDH1A1HSD17B10
SCHEMBL5387898 0.82 ALDH1A1 (0.58) TSHRTDP1ALDH1A1HSD17B10
SCHEMBL29631091 0.82 TSHR (0.68) TSHRTDP1ALDH1A1HSD17B10
SCHEMBL155434 0.82 TSHR (0.68) TSHRTDP1ALDH1A1HSD17B10
SCHEMBL81645 0.81 ALDH1A1 (0.51) TSHRTDP1ALDH1A1HSD17B10
SCHEMBL32689847 0.81 ALDH1A1 (0.51) TSHRTDP1ALDH1A1HSD17B10
SCHEMBL29361201 0.81 ALDH1A1 (0.51) TSHRTDP1ALDH1A1HSD17B10
Benzene SCHEMBL12472151 0.80 TSHR (0.71) TSHRTDP1ALDH1A1HSD17B10
SCHEMBL11655234 0.80 TSHR (0.66) TSHRTDP1ALDH1A1HSD17B10

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 10 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-0814109-B1 Photosensitive polyimide precursor and its use for pattern formation HITACHI CHEMICAL CO LTD (JP) 2004-08-18 EP disclosed
US-20040048978-A1 Photosensitive resin composition, solder resist comprising the same, cover lay film, and printed circuit board KANEKA CORPORATION (JP) 2004-03-11 US disclosed
US-6605353-B2 Polyimide derived from a dianhydride and diamine having hydroxyl or carboxyl groups, which are modified with a diepoxide or unsaturated group-containing epoxide; curable; heat resistance, dielectric, film-forming KANEKA CORPORATION (JP) 2003-08-12 US disclosed
US-20020048726-A1 Photosensitive polyimide precursor and its use for pattern formation HITACHI CHEMICAL COMPANY, LTD. (JP) 2002-04-25 US disclosed
US-20010056174-A1 Epoxy-modified polyimide, photosensitive composition, coverlay film, solder resist, and printed wiring board using the epoxy-modified polyimide KANEKA CORPORATION (JP) 2001-12-27 US disclosed
US-6319656-B1 FORMING FILM OF A NEGATIVE-WORKING PHOTO-SENSITIVE POLYIMIDE PRECURSOR ON A SUBSTRATE; EXPOSING FILM TO LIGHT THROUGH A MASK HAVING A PREDETERMINED PATTERN; DEVELOPING THE EXPOSED FILM USING AN ALKALINE AQUEOUS SOLUTION HITACHI CHEMICAL COMPANY, LTD. (JP) 2001-11-20 US disclosed
US-6200831-B1 HEAT-CURING A COATING OF A POLYAMIC ACID BASED ON A TETRACARBOXYLIC ACID AND A DIAMINE CONTAINNG AN ACTIVE OXYGEN OR NITROGEN FUNCTIONAL GROUP; SEALING THE EXTERNAL TERMINALS WITH A RESIN, E.G. AN EPOXIDE HITACHI, LTD. (JP) 2001-03-13 US disclosed
US-6087006-A SEMICONDUCTOR DEVICE HAVING SURFACE-PROTECTING FILM COMPRISING POLYIMIDE OBTAINED BY HEAT-CURING PRECURSOR HAVING POLAR SUBSTITUENTS AS THE SIDE CHAINS HITACHI, LTD. (JP) 2000-07-11 US disclosed
US-6025113-A FOR PREPARING HIGHLY SENSITIVE NEGATIVE-WORKING PHOTOSENSITIVE MATERIAL DEVELOPABLE WITH ALKALINE AQUEOUS SOLUTION IN SHORT TIME WITH HIGH RESOLUTION HITACHI CHEMICAL COMPANY, LTD. (JP) 2000-02-15 US disclosed
EP-0814109-A1 Photosensitive polyimide precursor and its use for pattern formation HITACHI CHEMICAL COMPANY, LTD. (JP) 1997-12-29 EP disclosed