SCHEMBL6848897

SCHEMBL6848897

C=C(C)C(=O)OCC1CCCC(OC2CCCCC2)O1

nearest known ligand 0.50

Predicted protein targets (top 7)

geneUniProtsupporting neighboursconfidence
ALDH1A1 P00352 2/20 0.50
CYP3A4 P08684 2/20 0.34
TP53 P04637 1/20 0.34
TSHR P16473 2/20 0.32
CYP2D6 P10635 1/20 0.32
CYP2C19 P33261 1/20 0.32
EPHX1 P07099 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL6848035 0.83 ALDH1A1 (0.55) ALDH1A1CYP3A4TP53TSHRCYP2D6
SCHEMBL6843989 0.83 ALDH1A1 (0.55) ALDH1A1CYP3A4TP53TSHRCYP2D6
SCHEMBL9577034 0.76 ALDH1A1 (0.70) ALDH1A1CYP3A4TP53TSHRCYP2D6
SCHEMBL31194758 0.74 ALDH1A1 (0.71) ALDH1A1CYP3A4TP53TSHRCYP2D6
SCHEMBL8837737 0.74 ALDH1A1 (0.71) ALDH1A1CYP3A4TP53TSHRCYP2D6
SCHEMBL4612527 0.73 ALDH1A1 (0.65) ALDH1A1CYP3A4TP53
SCHEMBL599333 0.72 ALDH1A1 (0.73) ALDH1A1CYP3A4TP53TSHRCYP2D6
SCHEMBL29016773 0.72 ALDH1A1 (0.73) ALDH1A1CYP3A4TP53TSHRCYP2D6
SCHEMBL31184251 0.72 ALDH1A1 (0.58) ALDH1A1CYP3A4TP53TSHRCYP2D6
SCHEMBL8908064 0.71 ALDH1A1 (0.71) ALDH1A1CYP3A4TP53TSHRCYP2D6

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 3 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-6770417-B2 A NEGATIVE RESIST COMPOSITION COMPRISING A CONSTITUENT COMPONENT WHICH HAS A VINYL ETHER STRUCTURE PROTECTED WITH AN ACETAL IN A MOLECULE IS A FILM FORMING POLYMER SOLUBLE IN BASIC SOLUTION AND HAS AN ALKALI SOLUBLE GROUP FUJITSU LIMITED (JP) 2004-08-03 US disclosed
US-20020058197-A1 Negative resist composition, process for forming resist patterns, and process for manufacturing electron device FUJITSU LIMITED 2002-05-16 US disclosed
EP-1184723-A2 Negative resist composition, process for forming resist patterns, and process for manufacturing electronic device FUJITSU LIMITED (JP) 2002-03-06 EP disclosed