SCHEMBL6848901

SCHEMBL6848901

C=C(C)C(=O)OCC1OCCCC1OC1CCCCC1

nearest known ligand 0.46

Predicted protein targets (top 8)

geneUniProtsupporting neighboursconfidence
ALDH1A1 P00352 2/20 0.46
LMNA P02545 1/20 0.31
POLB P06746 1/20 0.31
TP53 P04637 1/20 0.31
CYP3A4 P08684 1/20 0.31
MEN1 O00255 1/20 0.30
KMT2A Q03164 1/20 0.30
TSHR P16473 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL18869522 0.84 ALDH1A1 (0.50) ALDH1A1LMNAPOLBTP53CYP3A4
SCHEMBL6848037 0.84 ALDH1A1 (0.50) ALDH1A1LMNAPOLBTP53CYP3A4
SCHEMBL6843991 0.81 ALDH1A1 (0.50) ALDH1A1LMNAPOLBTP53CYP3A4
SCHEMBL5281939 0.78 ALDH1A1 (0.53) ALDH1A1LMNAPOLBTP53CYP3A4
SCHEMBL36133 0.73 ALDH1A1 (0.67) ALDH1A1LMNAPOLBTP53CYP3A4
SCHEMBL27848264 0.73 ALDH1A1 (0.67) ALDH1A1LMNAPOLBTP53CYP3A4
SCHEMBL28309955 0.72 ALDH1A1 (0.65) ALDH1A1LMNAPOLBTP53CYP3A4
SCHEMBL4612527 0.72 ALDH1A1 (0.65) ALDH1A1LMNAPOLBTP53CYP3A4
SCHEMBL28183466 0.71 ALDH1A1 (0.59) ALDH1A1LMNAPOLBKMT2A
SCHEMBL10064060 0.71 ALDH1A1 (0.62) ALDH1A1LMNAPOLBTP53CYP3A4

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 3 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-6770417-B2 A NEGATIVE RESIST COMPOSITION COMPRISING A CONSTITUENT COMPONENT WHICH HAS A VINYL ETHER STRUCTURE PROTECTED WITH AN ACETAL IN A MOLECULE IS A FILM FORMING POLYMER SOLUBLE IN BASIC SOLUTION AND HAS AN ALKALI SOLUBLE GROUP FUJITSU LIMITED (JP) 2004-08-03 US disclosed
US-20020058197-A1 Negative resist composition, process for forming resist patterns, and process for manufacturing electron device FUJITSU LIMITED 2002-05-16 US disclosed
EP-1184723-A2 Negative resist composition, process for forming resist patterns, and process for manufacturing electronic device FUJITSU LIMITED (JP) 2002-03-06 EP disclosed