SCHEMBL686095

SCHEMBL686095

C=Cc1ccc(OC(C)OCC(C)C)cc1

nearest known ligand 0.38

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
CHRNB2 P17787 2/20 0.38
CHRNA7 P36544 2/20 0.38
CHRNB4 P30926 1/20 0.38
CHRNA3 P32297 1/20 0.38
CHRNA4 P43681 1/20 0.38
ALDH1A1 P00352 3/20 0.38
ALDH1A3 P47895 1/20 0.38
TAS1R3 Q7RTX0 1/20 0.35
TAS1R1 Q7RTX1 1/20 0.35
SIRT2 Q8IXJ6 1/20 0.32
PPARG P37231 1/20 0.32
PPARA Q07869 1/20 0.32
CYP2D6 P10635 2/20 0.31
NPC1 O15118 2/20 0.31
MTOR P42345 1/20 0.31
TP53 P04637 1/20 0.31
CYP3A4 P08684 1/20 0.31
CYP2C9 P11712 1/20 0.31
MAPK1 P28482 1/20 0.31
CYP2C19 P33261 1/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL134315 0.84 CHRNB2 (0.42) CHRNB2CHRNA7CHRNB4CHRNA3CHRNA4
SCHEMBL7941374 0.83 CHRNB2 (0.40) CHRNB2CHRNA7CHRNB4CHRNA3CHRNA4
SCHEMBL9412357 0.83 CHRNB2 (0.38) CHRNB2CHRNA7CHRNB4CHRNA3CHRNA4
SCHEMBL1357310 0.82 TP53 (0.41) ALDH1A1CYP2D6TP53CYP3A4CYP2C9
SCHEMBL24355011 0.81 CHRNB2 (0.37) CHRNB2CHRNA7CHRNB4CHRNA3CHRNA4
SCHEMBL5693040 0.81 CHRNB2 (0.44) CHRNB2CHRNA7CHRNB4CHRNA3CHRNA4
SCHEMBL23559184 0.80 CHRNB2 (0.40) CHRNB2CHRNA7CHRNB4CHRNA3CHRNA4
SCHEMBL5900997 0.80 CHRNB2 (0.43) CHRNB2CHRNA7CHRNB4CHRNA3CHRNA4
SCHEMBL5901182 0.80 CHRNB2 (0.36) CHRNB2CHRNA7CHRNB4CHRNA3CHRNA4
SCHEMBL7539425 0.80 CHRNB2 (0.40) CHRNB2CHRNA7CHRNB4CHRNA3CHRNA4

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 261 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-119937243-A Chemically amplified positive photosensitive resin composition, cured film, and element having cured film 奇美实业股份有限公司 2025-05-06 CN disclosed
CN-111324013-B Chemically amplified positive photosensitive resin composition and application thereof 奇美实业股份有限公司 2023-12-01 CN disclosed
CN-116360211-A Chemically amplified positive photosensitive resin composition, protective film, and element having protective film 奇美实业股份有限公司 2023-06-30 CN disclosed
CN-111381438-B Chemically amplified positive photosensitive resin composition and application thereof 奇美实业股份有限公司 2023-06-20 CN disclosed
CN-115437214-A Chemically amplified positive photosensitive resin composition, protective film, and element having protective film 奇美实业股份有限公司 2022-12-06 CN disclosed
US-20220128906-A1 PHOTORESIST PATTERN TRIMMING COMPOSITIONS AND METHODS OF TRIMMING PHOTORESIST PATTERNS DUPONT ELECTRONIC MATERIALS INTERNATIONAL, LLC 2022-04-28 US disclosed
CN-113126435-A Chemically amplified positive photosensitive resin composition and use thereof 奇美实业股份有限公司 2021-07-16 CN disclosed
CN-112394618-A Chemically amplified positive photosensitive resin composition, and protective film and member produced therefrom 奇美实业股份有限公司 2021-02-23 CN disclosed
CN-111999980-A Chemically amplified positive photosensitive resin composition, protective film and module 奇美实业股份有限公司 2020-11-27 CN disclosed
US-10795258-B2 Resist composition SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2020-10-06 US disclosed
US-6284863-B1 REACTED WITH UNSATURATED AMIDES THAT MAY BE CYCLIC, E.G., N-VINYL-2-PYRROLIDONE SUMITOMO CHEMICAL COMPANY, LTD. (JP) 2001-09-04 US disclosed
EP-1113005-A1 Sulfonium salt compounds Wako Pure Chemical Industries, Ltd. (JP) 2001-07-04 EP disclosed
EP-1059314-A1 A resist composition Wako Pure Chemical Industries, Ltd. (JP) 2000-12-13 EP disclosed
EP-1024406-A1 Resist composition WAKO PURE CHEMICAL INDUSTRIES LTD (JP) 2000-08-02 EP disclosed
US-5891603-A N-HYDROCARBYLSULFONYLOXY-SUBSTITUTED CYCLIC IMIDE SULFONIC ACID GENERATORS, POLYVINYLPHENOL DERIVATIVES FUJI PHOTO FILM CO., LTD. (JP) 1999-04-06 US disclosed
EP-0520642-B1 Resist material and pattern formation process WAKO PURE CHEM IND LTD (JP) 1998-10-28 EP disclosed
EP-0803775-A1 Positive working photosensitive composition FUJI PHOTO FILM CO., LTD. (JP) 1997-10-29 EP disclosed
US-5670299-A COATING A PHOTORESISTS POLYMER ON A SUBSTRATE, DEVELOPMENT AND HEAT TREATMENT WAKO PURE CHEMICAL INDUSTRIES, LTD. (JP) 1997-09-23 US disclosed
US-5468589-A Heat resistant, photosensitive patterns WAKO PURE CHEMICAL INDUSTRIES, LTD. (JP) 1995-11-21 US disclosed
EP-0520642-A1 Resist material and pattern formation process WAKO PURE CHEMICAL INDUSTRIES LTD (JP) 1992-12-30 EP disclosed