SCHEMBL705519

SCHEMBL705519

C[CH]Oc1ccccc1C1CCCCC1

nearest known ligand 0.50

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
PTGDR2 Q9Y5Y4 1/20 0.50
HTR1D P28221 2/20 0.46
HTR1B P28222 2/20 0.46
ADRA2A P08913 3/20 0.45
HTR2C P28335 2/20 0.45
ADRA2B P18089 2/20 0.45
ADRA2C P18825 2/20 0.45
MEN1 O00255 3/20 0.43
KMT2A Q03164 3/20 0.43
HTR1A P08908 4/20 0.42
SLC6A2 P23975 4/20 0.42
SLC6A4 P31645 4/20 0.42
USP2 O75604 1/20 0.42
CYP1A2 P05177 1/20 0.42
CYP2D6 P10635 1/20 0.42
CHRM1 P11229 1/20 0.42
CYP2C9 P11712 1/20 0.42
DRD1 P21728 1/20 0.42
TBXA2R P21731 1/20 0.42
PTGS1 P23219 1/20 0.42

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL2586792 0.82 PTGDR2 (0.50) PTGDR2HTR1DHTR1BADRA2AHTR2C
SCHEMBL6695552 0.79 HTR2C (0.68) PTGDR2HTR1DHTR1BADRA2AHTR2C
SCHEMBL4736528 0.79 HTR2C (0.68) PTGDR2HTR1DHTR1BADRA2AHTR2C
SCHEMBL1428861 0.79 HTR2C (0.68) PTGDR2HTR1DHTR1BADRA2AHTR2C
SCHEMBL30938438 0.79 HTR2C (0.68) PTGDR2HTR1DHTR1BADRA2AHTR2C
SCHEMBL3931077 0.79 HTR1D (0.50) PTGDR2HTR1DHTR1BADRA2AHTR2C
SCHEMBL2399633 0.79 PTGDR2 (0.57) PTGDR2HTR1DHTR1BADRA2AHTR2C
SCHEMBL29693629 0.78 PTGDR2 (0.43) PTGDR2HTR1DHTR1BADRA2AHTR2C
SCHEMBL7545433 0.77 HTR2C (0.70) PTGDR2HTR1DHTR1BHTR2CMEN1
SCHEMBL516572 0.76 ADRA2A (0.56) PTGDR2HTR1DHTR1BADRA2AHTR2C

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 56 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-10928727-B2 Actinic ray-sensitive or radiation-sensitive resin composition, actinic ray-sensitive or radiation-sensitive film, mask blank including actinic ray-sensitive or radiation-sensitive film, pattern forming method, and method for manufacturing FUJIFILM CORPORATION (JP) 2021-02-23 US disclosed
US-10423068-B2 Active-light-sensitive or radiation-sensitive resin composition, active-light-sensitive or radiation-sensitive film, pattern forming method, and method for manufacturing electronic device FUJIFILM CORPORATION (JP) 2019-09-24 US disclosed
US-20180120701-A1 ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE FILM, MASK BLANK INCLUDING ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE FILM, PATTERN FORMING METHOD, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE FUJIFILM CORPORATION (JP) 2018-05-03 US disclosed
US-20170242338-A1 ACTIVE-LIGHT-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, ACTIVE-LIGHT-SENSITIVE OR RADIATION-SENSITIVE FILM, PATTERN FORMING METHOD, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE FUJIFILM CORPORATION (JP) 2017-08-24 US disclosed
US-20170174801-A1 NON-CHEMICAL AMPLIFICATION TYPE RESIST COMPOSITION, NON-CHEMICAL AMPLIFICATION TYPE RESIST FILM, PATTERN FORMING METHOD, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE FUJIFILM CORPORATION (JP) 2017-06-22 US disclosed
US-20170176858-A1 PATTERN FORMING METHOD, METHOD FOR MANUFACTURING ELECTRONIC DEVICE, RESIST COMPOSITION AND RESIST FILM FUJIFILM CORPORATION (JP) 2017-06-22 US disclosed
US-9323150-B2 Actinic-ray- or radiation-sensitive resin composition, actinic-ray- or radiation-sensitive film therefrom and method of forming pattern FUJIFILM CORPORATION (JP) 2016-04-26 US disclosed
US-9188862-B2 Actinic ray-sensitive or radiation-sensitive resin composition, and, actinic ray-sensitive or radiation-sensitive film and pattern forming method, each using the same FUJIFILM CORPORATION (JP) 2015-11-17 US disclosed
US-20140295332-A1 ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, AND, ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE FILM AND PATTERN FORMING METHOD, EACH USING THE SAME FUJIFILM CORPORATION (JP) 2014-10-02 US disclosed
US-20140227636-A1 ACTINIC-RAY- OR RADIATION-SENSITIVE RESIN COMPOSITION, ACTINIC-RAY- OR RADIATION-SENSITIVE FILM THEREFROM AND METHOD OF FORMING PATTERN FUJIFILM CORPORATION (JP) 2014-08-14 US disclosed
US-20030075708-A1 Positive radiation-sensitive composition FUJI PHOTO FILM CO., LTD. 2003-04-24 US disclosed
US-6537718-B2 Compounds generate an acid upon irradiation with actinic rays FUJI PHOTO FILM CO., LTD. (JP) 2003-03-25 US disclosed
US-6485883-B2 Positive photoresist composition FUJI PHOTO FILM CO., LTD. (JP) 2002-11-26 US disclosed
US-20020058200-A1 Positive resist composition FUJI PHOTO FILM CO., LTD. 2002-05-16 US disclosed
US-6376152-B2 MIXTURE OF A COMPOUND WHICH GENERATES AN ACID UPON RADIATION, RESIN AND NITROGEN-CONTAINING COMPOUND FUJI PHOTO FILM CO., LTD. (JP) 2002-04-23 US disclosed
US-20020006578-A1 Positive resist composition FUJI PHOTO FILM CO., LTD. 2002-01-17 US disclosed
EP-1158363-A1 Positive resist composition and onium salts of saccharin derivatives FUJI PHOTO FILM CO., LTD. (JP) 2001-11-28 EP disclosed
US-20010041300-A1 Positive photoresist composition FUJIFILM CORPORATION (JP) 2001-11-15 US disclosed
US-20010021479-A1 Positive photoresist composition FUJIFILM CORPORATION (JP) 2001-09-13 US disclosed
US-20010008739-A1 Positive photoresist composition for exposure to far ultraviolet ray FUJIFILM CORPORATION (JP) 2001-07-19 US disclosed