SCHEMBL70734

SCHEMBL70734

CC(C)(C)c1ccc([I+]c2ccc(C(C)(C)C)cc2)cc1

nearest known ligand 0.52

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
TSHR P16473 1/20 0.52
LMNA P02545 1/20 0.50
TYR P14679 1/20 0.50
SLC22A2 O15244 1/20 0.44
SLC22A1 O15245 1/20 0.44
SLC22A3 O75751 1/20 0.44
KIF11 P52732 2/20 0.42
ALDH1A1 P00352 4/20 0.41
HPGD P15428 2/20 0.39
NPC1 O15118 2/20 0.39
RAB9A P51151 2/20 0.39
MAPT P10636 1/20 0.39
MAPK1 P28482 1/20 0.39
HDAC1 Q13547 1/20 0.39
BCHE P06276 3/20 0.39
ACHE P22303 3/20 0.39
ALOX15 P16050 1/20 0.39
HSD17B10 Q99714 1/20 0.39
TDP1 Q9NUW8 1/20 0.39
SRD5A2 P31213 1/20 0.38

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL12762156 1.00 TSHR (0.52) TSHRLMNATYRSLC22A2SLC22A1
Water SCHEMBL515827 0.97 TSHR (0.50) TSHRLMNATYRSLC22A2SLC22A1
Iodide SCHEMBL2968443 0.97 TSHR (0.50) TSHRLMNATYRSLC22A2SLC22A1
Hydrochloric Acid SCHEMBL217655 0.97 TSHR (0.50) TSHRLMNATYRSLC22A2SLC22A1
Bromide SCHEMBL10810288 0.97 TSHR (0.50) TSHRLMNATYRSLC22A2SLC22A1
SCHEMBL3813161 0.90 TSHR (0.44) TSHRLMNATYRSLC22A2SLC22A1
SCHEMBL425907 0.90 KDM1A (0.45) TSHRLMNATYRSLC22A2SLC22A1
SCHEMBL4180074 0.90 TSHR (0.71) TSHRLMNATYRSLC22A2SLC22A1
Toliodium SCHEMBL5427632 0.90 TSHR (0.71) TSHRLMNATYRSLC22A2SLC22A1
SCHEMBL374593 0.90 TSHR (0.44) TSHRLMNATYRSLC22A2SLC22A1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Appears in 5048 patents — a generic fragment claimed broadly, so it's down-weighted as IP noise. Top by claim status then date:

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-4565378-B1 METHODS FOR PRODUCING OPTICAL EFFECT LAYERS COMPRISING MAGNETIC OR MAGNETIZABLE PIGMENT PARTICLES AND EXHIBITING ONE OR MORE INDICIA SICPA HOLDING SA (CH) 2026-05-06 EP claimed
EP-4607278-A1 CHEMICALLY-AMPLIFIED POSITIVE PHOTORESIST COMPOSITION FOR PATTERN PROFILE IMPROVEMENT AND ETCH RESISTANCE ENHANCEMENT Ycchem Co., Ltd. (KR) 2025-08-27 EP claimed
US-12360454-B2 Stabilized interfaces of inorganic radiation patterning compositions on substrates INPRIA CORPORATION (US) 2025-07-15 US claimed
US-20250199405-A1 CHEMICALLY-AMPLIFIED POSITIVE PHOTORESIST COMPOSITION FOR PATTERN PROFILE IMPROVEMENT AND ETCH RESISTANCE ENHANCEMENT YCCHEM CO., LTD. (KR) 2025-06-19 US claimed
EP-4565378-A1 METHODS FOR PRODUCING OPTICAL EFFECT LAYERS COMPRISING MAGNETIC OR MAGNETIZABLE PIGMENT PARTICLES AND EXHIBITING ONE OR MORE INDICIA Sicpa Holding SA (CH) 2025-06-11 EP claimed
CN-119998727-A Chemically amplified positive resist composition for improving pattern profile and enhancing etch resistance YC化学制品株式会社 2025-05-13 CN claimed
US-12287574-B2 Resin composition and flow cells incorporating the same ILLUMINA, INC. (US) 2025-04-29 US claimed
CN-119677597-A Method for producing an optical effect layer comprising magnetic or magnetizable pigment particles and exhibiting more than one marking 锡克拜控股有限公司 2025-03-21 CN claimed
CN-119613600-A Star polymer photoresist film-forming resin and preparation method and application thereof 黄埔绿色先进材料技术研究院 2025-03-14 CN claimed
US-12187851-B2 Network polymers and methods of making and using same THE REGENTS OF THE UNIVERSITY OF COLORADO, A BODY CORPORATE (US) 2025-01-07 US claimed
US-5998099-A Energy-sensitive resist material and a process for device fabrication using an energy-sensitive resist material LUCENT TECHNOLOGIES INC. (US) 1999-12-07 US claimed
EP-0907109-A1 Process for device fabrication using a radiation-sensitive resist material LUCENT TECHNOLOGIES INC. (US) 1999-04-07 EP claimed
EP-0542523-B1 Positive resist material SHINETSU CHEMICAL CO (JP) 1999-03-10 EP claimed
EP-0778495-A1 Resist composition with radiation sensitive acid generator International Business Machines Corporation (US) 1997-06-11 EP claimed
EP-0679951-B1 Positive resist composition TOKYO OHKA KOGYO CO LTD (JP) 1997-01-15 EP claimed
WO-1992022856-A1 PHOTOELECTROGRAPHIC IMAGING WITH A MULTI-ACTIVE ELEMENT CONTAINING NEAR-INFRARED SENSITIZING PIGMENTS EASTMAN KODAK COMPANY (US) 1992-12-23 WO claimed
EP-0250893-B1 COLOUR FILTER ELEMENTS EASTMAN KODAK COMPANY (a New Jersey corporation) (US) 1992-08-19 EP claimed
EP-0250893-A1 Colour filter elements EASTMAN KODAK COMPANY (a New Jersey corporation) (US) 1988-01-07 EP claimed
EP-0244704-A2 Photoelectrographic elements and imaging method EASTMAN KODAK COMPANY (a New Jersey corporation) (US) 1987-11-11 EP claimed
US-4650734-A ACID PHOTOGENERATOR EASTMAN KODAK COMPANY (US) 1987-03-17 US claimed