SCHEMBL707342

SCHEMBL707342

CC[Si](Br)(Br)c1ccc([Si](Br)(Br)CC)cc1

nearest known ligand 0.40

Predicted protein targets (top 5)

geneUniProtsupporting neighboursconfidence
ESR1 P03372 2/20 0.40
NR1H2 P55055 2/20 0.33
NR1H3 Q13133 2/20 0.33
AR P10275 1/20 0.33
ESR2 Q92731 1/20 0.33

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL705955 0.86 TP53 (0.38) ESR1ESR2
SCHEMBL705422 0.77 ESR1 (0.38) ESR1NR1H2NR1H3ARESR2
SCHEMBL705449 0.75 ESR1 (0.40) ESR1NR1H2NR1H3ARESR2
SCHEMBL706935 0.73 NR1H2 (0.43) ESR1NR1H2NR1H3ARESR2
SCHEMBL7056361 0.69 NR1H2 (0.54) ESR1NR1H2NR1H3ARESR2
SCHEMBL708300 0.66 TP53 (0.35) ESR1NR1H2NR1H3ESR2
SCHEMBL706175 0.65 ESR1 (0.38) ESR1NR1H2NR1H3ARESR2
SCHEMBL3026782 0.65 NR1H2 (0.45) ESR1NR1H2NR1H3
SCHEMBL14369584 0.65 ESR1 (0.42) ESR1NR1H2NR1H3ARESR2
SCHEMBL18540404 0.64 NR1H2 (0.35) ESR1NR1H2NR1H3

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 4 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-8124239-B2 Silica film forming material, silica film and method of manufacturing the same, multilayer wiring structure and method of manufacturing the same, and semiconductor device and method of manufacturing the same FUJITSU LIMITED (JP) 2012-02-28 US disclosed
US-20100155121-A1 SILICA FILM FORMING MATERIAL, SILICA FILM AND METHOD OF MANUFACTURING THE SAME, MULTILAYER WIRING STRUCTURE AND METHOD OF MANUFACTURING THE SAME, AND SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME FUJITSU LIMITED (JP) 2010-06-24 US disclosed
US-7659357-B2 Precursor organosilicon polymer of 1,2-Bis(dimethylethoxysilyl)ethane, 1,4-bis(dimethylethoxysilyl)benzene, tetraethoxysilane, methyltriethoxysilane, phenyltriethoxysilane; dielectric (DE) films having etching/chemical/moisture resistance; adhesion; low DE constant; minimal wiring delay; high speed FUJITSU LIMITED (JP) 2010-02-09 US disclosed
US-20070026689-A1 Silica film forming material, silica film and method of manufacturing the same, multilayer wiring structure and method of manufacturing the same, and semiconductor device and method of manufacturing the same FUJITSU LIMITED (JP) 2007-02-01 US disclosed