SCHEMBL71765

SCHEMBL71765

[AlH3].[Ta]

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL28286027 1.00
SCHEMBL27633229 1.00
SCHEMBL3884264 0.82
Ammonia Solution, Strong SCHEMBL6707374 0.82
SCHEMBL9316049 0.82
Methane SCHEMBL11150033 0.82
SCHEMBL6526568 0.82
Water SCHEMBL8832646 0.82
SCHEMBL8200832 0.82
Hydrochloric Acid SCHEMBL10492944 0.82

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Appears in 6381 patents — a generic fragment claimed broadly, so it's down-weighted as IP noise. Top by claim status then date:

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20260032985-A1 SELECTIVE DEPOSITION OF HIGH-K DIELECTRIC MATERIAL IN GATE INTERFACE APPLIED MATERIALS INC (US) 2026-01-29 US claimed
US-20250364405-A1 BACK END OF LINE RESISTOR STRUCTURE TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. (TW) 2025-11-27 US claimed
US-20250359287-A1 SELF-ALIGNED PATTERNING LAYER FOR METAL GATE FORMATION TAIWAN SEMICONDUCTOR MFG CO LTD (TW) 2025-11-20 US claimed
US-20250301731-A1 GATE STRUCTURES OF NANOSTRUCTURE FIELD-EFFECT TRANSISTORS (NANO-FETS) INCLUDING A PLURALITY OF SEMICONDUCTOR BASED CAPPING MATERIALS AND METHODS TAIWAN SEMICONDUCTOR MFG CO LTD (TW) 2025-09-25 US claimed
US-12426324-B2 Gates structures of nanostructure field-effect transistors (nano-FETs) including a plurality of semiconductor based capping materials and methods of forming the same TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. (TW) 2025-09-23 US claimed
US-20250221001-A1 Multi-Gate Transistor Structure TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. (TW) 2025-07-03 US claimed
CN-117465079-B Aluminum-tantalum composite board and preparation method thereof 济南大学 2025-06-13 CN claimed
CN-120138408-A Preparation method of tantalum-aluminum alloy sputtering target material 宁波江丰电子材料股份有限公司 2025-06-13 CN claimed
CN-120079814-A Preparation method of Ti60 high-temperature titanium alloy cast ingot 新疆湘润新材料科技有限公司 2025-06-03 CN claimed
CN-120079813-A Preparation method of Ti65 titanium alloy cast ingot 新疆湘润新材料科技有限公司 2025-06-03 CN claimed
EP-0420589-B1 Process for forming deposited film and process for preparing semiconductor device CANON KK (JP) 1996-02-07 EP claimed
EP-0603782-A2 Method for producing a thin film resistor CANON KABUSHIKI KAISHA (JP) 1994-06-29 EP claimed
US-5322594-A Depositing sacrificial material on insulator elements to define jet chambers and transport chambers XEROX CORPORATION (US) 1994-06-21 US claimed
US-5187500-A CONTROL OF ENERGY TO THERMAL INKJET HEATING ELEMENTS HEWLETT-PACKARD COMPANY (US) 1993-02-16 US claimed
EP-0475235-A1 Control of energy to thermal ink jet heating elements Hewlett-Packard Company (US) 1992-03-18 EP claimed
US-5016024-A Integral ink jet print head HEWLETT-PACKARD COMPANY (US) 1991-05-14 US claimed
US-4965611-A Amorphous diffusion barrier for thermal ink jet print heads HEWLETT-PACKARD COMPANY (US) 1990-10-23 US claimed
CN-85105468-A The pre-brush plating method for brazing of welding-resistant metal 1987-01-14 CN claimed
US-3997411-A Method for the production of a thin film electric circuit SIEMENS AKTIENGESELLSCHAFT (DT) 1976-12-14 US claimed
US-3973106-A Thin film thermal print head HEWLETT-PACKARD COMPANY (US) 1976-08-03 US claimed