SCHEMBL72417

SCHEMBL72417

O=C1C[CH]CCC1

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL6101053 0.92
SCHEMBL7739749 0.89 TRIM24 (0.50)
SCHEMBL4276887 0.89
SCHEMBL7738689 0.89 TRIM24 (0.50)
SCHEMBL6397913 0.81
SCHEMBL290556 0.81
SCHEMBL11285608 0.77
SCHEMBL446594 0.74
SCHEMBL28649337 0.74 TRIM24 (0.61)
SCHEMBL5812857 0.74 TRIM24 (0.56)

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Appears in 2428 patents — a generic fragment claimed broadly, so it's down-weighted as IP noise. Top by claim status then date:

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-116867782-A Pyrazole amide derivative 豪夫迈·罗氏有限公司 2023-10-10 CN claimed
CN-108885396-B Positive working photosensitive material 默克专利有限公司 2023-03-24 CN claimed
US-20220342308-A1 POSITIVE WORKING PHOTOSENSITIVE MATERIALS MERCK PATENT GMBH (DE) 2022-10-27 US claimed
CN-114651212-A Positive photosensitive material 默克专利股份有限公司 2022-06-21 CN claimed
EP-2862024-B1 POSITIVE PHOTOSENSITIVE MATERIAL MERCK PATENT GMBH (DE) 2021-12-01 EP claimed
EP-3019484-B1 THERAPEUTICALLY ACTIVE COMPOUNDS AND THEIR METHODS OF USE LES LABORATOIRES SERVIER SAS (FR) 2021-09-08 EP claimed
EP-3847506-A1 POSITIVE WORKING PHOTOSENSITIVE MATERIAL Merck Patent GmbH (DE) 2021-07-14 EP claimed
US-10976662-B2 Positive working photosensitive material MERCK PATENT GMBH (DE) 2021-04-13 US claimed
CN-112654928-A Positive photosensitive material 默克专利股份有限公司 2021-04-13 CN claimed
EP-3446180-B1 POSITIVE WORKING PHOTOSENSITIVE MATERIAL AZ ELECTRONIC MAT LUXEMBOURG SARL (LU) 2020-04-01 EP claimed
US-5738975-A MIXTURE CONTAINING (METH)ACRYLATE TERPOLYMER HAVING GROUP WHICH REACTS WITH AN ACID TO CONVERT POLARITY OF POLYMER, PHOTO ACID GENERATING COMPOUND, SOLVENT NEC CORPORATION (JP) 1998-04-14 US claimed
US-5691111-A SULFONIUM SALT, ACRYLATE ESTER POLYMER NEC CORPORATION (JP) 1997-11-25 US claimed
EP-0645679-B1 Resist material and pattern forming process FUJITSU LTD (JP) 1997-10-01 EP claimed
WO-1997033198-A1 PHOTORESIST COMPOSITIONS COMPRISING POLYCYCLIC POLYMERS WITH ACID LABILE PENDANT GROUPS THE B.F. GOODRICH COMPANY (US) 1997-09-12 WO claimed
EP-0794458-A2 An energy-sensitive resist material and a process for device fabrication using an energy-sensitive resist material LUCENT TECHNOLOGIES INC. (US) 1997-09-10 EP claimed
US-5665518-A CARBOXY-SUBSTITUTED, BRIDGED CARBOCYCLIC (METH)ACRYLATE DERIVATIVE MONOMERS; TRANSPARENCY, RESOLUTION, SOLUBILITY, AND DRY-ETCHING RESISTANCE; SEMICONDUCTORS NEC CORPORATION (JP) 1997-09-09 US claimed
US-5635332-A MIXTURE WITH ULTRAVIOLET TRANSPARENT POLYMER HAVING GROUPS WHICH ARE UNSTABLE TO ACID NEC CORPORATION (JP) 1997-06-03 US claimed
EP-0663616-A2 Radiation sensitive material and method for forming pattern FUJITSU LIMITED (JP) 1995-07-19 EP claimed
EP-0645679-A1 Resist material and pattern forming process FUJITSU LIMITED (JP) 1995-03-29 EP claimed
US-4529737-A Analgesic and anti-inflammatory arylalkanoic acid phthalidyl esters and pharmaceutical compositions thereof RESFAR S.R.I. (IT) 1985-07-16 US claimed