SCHEMBL730631

SCHEMBL730631

CO[SiH](OC)C1CCC([SiH](OC)OC)CC1

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL3630385 0.87
SCHEMBL1291221 0.87
SCHEMBL1512688 0.84
Cyclopentane SCHEMBL6048924 0.84
SCHEMBL6048765 0.74
SCHEMBL14992291 0.72
SCHEMBL6048664 0.72
SCHEMBL19927410 0.67
SCHEMBL1637157 0.65
SCHEMBL4438669 0.60

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 24 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20090096106-A1 ANTIREFLECTIVE COATINGS AIR PRODUCTS AND CHEMICALS, INC. (US) 2009-04-16 US claimed
EP-2048700-A2 Antireflective coatings Air Products and Chemicals, Inc. (US) 2009-04-15 EP claimed
EP-1482070-B1 MECHANICAL ENHANCER ADDITIVES FOR LOW DIELECTRIC FILMS AIR PROD & CHEM (US) 2015-11-11 EP disclosed
US-20130260575-A1 SILICON PRECURSORS AND COMPOSITIONS COMPRISING SAME FOR DEPOSITING LOW DIELECTRIC CONSTANT FILMS AIR PRODUCTS AND CHEMICALS, INC. (US) 2013-10-03 US disclosed
EP-1666632-B1 Porous low dielectric constant compositions and methods for making and using same AIR PROD & CHEM (US) 2013-04-24 EP disclosed
US-8293001-B2 Porogens, porogenated precursors and methods for using the same to provide porous organosilica glass films with low dielectric constants AIR PRODUCTS AND CHEMICALS, INC. (US) 2012-10-23 US disclosed
US-8137764-B2 organosilicate film formed by plasma-enhanced chemical vapor deposition from a first silicon-containing precursor that comprises from 3 to 4 Si O bonds per Si atom, from 0 to 1 of Si H, Si Br, and Si Cl bonds per Si atom and a second silicon-containing precursor comprises at least one Si C bond per Si AIR PRODUCTS AND CHEMICALS, INC. (US) 2012-03-20 US disclosed
US-20110143032-A1 Porogens, Porogenated Precursors and Methods for Using the Same to Provide Porous Organosilica Glass Films With Low Dielectric Constants AIR PRODUCTS AND CHEMICALS, INC. (US) 2011-06-16 US disclosed
US-7943195-B2 Mixing of glass with hydrocarbons; chemical vapor deposition; mixing organosilane and/or organosiloxane precursors with porogens; neohexyl-1,3,5,7-tetramethylcyclo-tetrasiloxane AIR PRODUCTS AND CHEMICALS, INC. (US) 2011-05-17 US disclosed
EP-2281920-A1 Porous low dielectric constant compositions and methods for making and using same Air Products and Chemicals, Inc. (US) 2011-02-09 EP disclosed
EP-2261390-A2 Mechanical enhancer additives for low dielectric films AIR PRODUCTS AND CHEMICALS, INC. (US) 2010-12-15 EP disclosed
US-7332445-B2 Porous low dielectric constant compositions and methods for making and using same AIR PRODUCTS AND CHEMICALS, INC. (US) 2008-02-19 US disclosed
EP-1666632-A2 Porous low dielectric constant compositions and methods for making and using same AIR PRODUCTS AND CHEMICALS, INC. (US) 2006-06-07 EP disclosed
US-20060078676-A1 Porous low dielectric constant compositions and methods for making and using same VERSUM MATERIALS US, LLC 2006-04-13 US disclosed
US-6846515-B2 Methods for using porogens and/or porogenated precursors to provide porous organosilica glass films with low dielectric constants AIR PRODUCTS AND CHEMICALS, INC. (US) 2005-01-25 US disclosed
US-20040241463-A1 Mechanical enhancer additives for low dielectric films VERSUM MATERIALS US, LLC 2004-12-02 US disclosed
EP-1482070-A1 Mechanical enhancer additives for low dielectric films AIR PRODUCTS AND CHEMICALS, INC. (US) 2004-12-01 EP disclosed
US-20030232137-A1 Porogens, porogenated precursors and methods for using the same to provide porous organosilica glass films with low dielectric constants VERSUM MATERIALS US, LLC 2003-12-18 US disclosed
US-20030198742-A1 Porogens, porogenated precursors and methods for using the same to provide porous organosilica glass films with low dielectric constants VERSUM MATERIALS US, LLC 2003-10-23 US disclosed
EP-1354980-A1 Method for forming a porous SiOCH layer. AIR PRODUCTS AND CHEMICALS, INC. (US) 2003-10-22 EP disclosed