SCHEMBL7561536

SCHEMBL7561536

N#CC(=NO)c1ccc(Br)cc1

nearest known ligand 0.42

Predicted protein targets (top 19)

geneUniProtsupporting neighboursconfidence
RECQL P46063 1/20 0.42
CES2 O00748 1/20 0.39
CES1 P23141 1/20 0.39
HTT P42858 3/20 0.39
HSD17B10 Q99714 1/20 0.38
CA1 P00915 2/20 0.37
CA2 P00918 2/20 0.37
MAPT P10636 4/20 0.37
ALDH1A1 P00352 2/20 0.37
LMNA P02545 2/20 0.37
HIF1A Q16665 1/20 0.37
KDM4E B2RXH2 2/20 0.36
CYP2A6 P11509 1/20 0.35
GSK3B P49841 1/20 0.34
ESR1 P03372 1/20 0.34
ESR2 Q92731 1/20 0.34
CYP19A1 P11511 1/20 0.34
OGG1 O15527 1/20 0.33
ALOX15 P16050 1/20 0.33

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL22347726 1.00 RECQL (0.42) RECQLCES2CES1HTTHSD17B10
SCHEMBL7561533 1.00 RECQL (0.42) RECQLCES2CES1HTTHSD17B10
SCHEMBL10752112 0.78 LMNA (0.53) CES2CES1HTTHSD17B10CA1
SCHEMBL10753245 0.78 HSD17B10 (0.46) CES2CES1HTTHSD17B10MAPT
SCHEMBL10752089 0.78 TSHR (0.43) CES2CES1HTTHSD17B10CA1
SCHEMBL10752086 0.78 TSHR (0.43) CES2CES1HTTHSD17B10CA1
SCHEMBL6706101 0.78 HSD17B10 (0.46) CES2CES1HTTHSD17B10MAPT
SCHEMBL11320370 0.78 TSHR (0.43) CES2CES1HTTHSD17B10CA1
SCHEMBL10761154 0.78 GSK3B (0.47) HTTHSD17B10CA1CA2MAPT
SCHEMBL6706099 0.78 HSD17B10 (0.46) CES2CES1HTTHSD17B10MAPT

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 9 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-0780729-B1 Chemical-sensitization photoresist composition TOKYO OHKA KOGYO CO LTD (JP) 2002-07-10 EP disclosed
EP-0821274-B1 Chemical-sensitization resist composition TOKYO OHKA KOGYO CO LTD (JP) 2001-11-14 EP disclosed
US-6245930-B1 AN OXIMESULFONATE COMPOUND CAPABLE OF GIVING POSITIVELY OR NEGATIVELY PATTERNED RESIST LAYER OF EXCELLENT PATTERN RESOLUTION, CROSS SECTIOANL PROFILE, AND HIGH SENSITIVITY TOKYO OHKA KOGYO CO., LTD. (JP) 2001-06-12 US disclosed
US-6063953-A Chemical-sensitization photoresist composition TOKYO OHKA KOGYO CO., LTD. (JP) 2000-05-16 US disclosed
US-6022666-A Chemical-sensitization photoresist composition TOKYO OHKA KOGYO CO., LTD. (JP) 2000-02-08 US disclosed
US-5976760-A Chemical-sensitization resist composition TOKYO OHKA KOGYO CO., LTD. (JP) 1999-11-02 US disclosed
US-5902713-A Chemical-sensitization photoresist composition TOKYO OHKA KOGYO CO., LTD. (JP) 1999-05-11 US disclosed
EP-0821274-A1 Chemical-sensitization resist composition TOKYO OHKA KOGYO CO., LTD. (JP) 1998-01-28 EP disclosed
EP-0780729-A1 Chemical-sensitization photoresist composition TOKYO OHKA KOGYO CO., LTD. (JP) 1997-06-25 EP disclosed