Benzene

Benzene

SCHEMBL759657

C=C(C)C=O.c1ccccc1

nearest known ligand 0.41

Full drug profile on Sugi Atlas →

Predicted protein targets (top 10)

geneUniProtsupporting neighboursconfidence
ALDH1A1 P00352 5/20 0.41
TSHR P16473 2/20 0.41
TP53 P04637 1/20 0.41
TDP1 Q9NUW8 2/20 0.33
MAPK1 P28482 1/20 0.33
FFAR3 O14843 1/20 0.31
LCK P06239 1/20 0.31
FYN P06241 1/20 0.31
HPGD P15428 1/20 0.31
KDM4E B2RXH2 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL32678 0.89
SCHEMBL1200848 0.89 ALDH1A1 (0.50) ALDH1A1TSHRTP53TDP1
Ethylene SCHEMBL2199923 0.85
SCHEMBL11125850 0.85 ALDH1A1 (0.47) ALDH1A1TSHRTP53TDP1
SCHEMBL2339546 0.85
Water SCHEMBL23879217 0.85
Formaldehyde SCHEMBL23142310 0.85
Methyl Alcohol SCHEMBL6914031 0.85
Methane SCHEMBL756364 0.85
SCHEMBL11551884 0.85

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 26 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-0067067-B1 DRY-DEVELOPING NEGATIVE RESIST COMPOSITION FUJITSU LIMITED (JP) 1985-09-25 EP claimed
US-4464455-A Dry-developing negative resist composition FUJITSU LIMITED (JP) 1984-08-07 US claimed
EP-0067067-A2 Dry-developing negative resist composition FUJITSU LIMITED (JP) 1982-12-15 EP claimed
CN-106680431-A Method and device for detecting quality of air in vehicle 北京新能源汽车股份有限公司 2017-05-17 CN disclosed
CN-206033622-U Is silver aldehyde forebody to isobutyl group beta chlorine alpha apparatus for producing of methyl phenylpropyl alcohol olefine aldehydr 安徽华业香料股份有限公司 2017-03-22 CN disclosed
US-8815472-B2 Volume hologram optical recording medium, composition for volume hologram recording layer formation, and volume hologram recording material MITSUBISHI CHEMICAL CORPORATION (JP) 2014-08-26 US disclosed
EP-2077471-B1 VOLUME HOLOGRAM OPTICAL RECORDING MEDIUM, COMPOSITION FOR VOLUME HOLOGRAM RECORDING LAYER FORMATION, AND VOLUME HOLOGRAM RECORDING MATERIAL MITSUBISHI CHEM CORP (JP) 2012-07-25 EP disclosed
EP-2063324-B1 VOLUME HOLOGRAM OPTICAL RECORDING MEDIUM, COMPOSITION FOR FORMING VOLUME HOLOGRAM RECORDING LAYER, VOLUME HOLOGRAM RECORDING MATERIAL, AND VOLUME HOLOGRAM OPTICAL RECORDING METHOD MITSUBISHI CHEM CORP (JP) 2012-03-21 EP disclosed
US-20100067073-A1 VOLUME HOLOGRAM OPTICAL RECORDING MEDIUM, COMPOSITION FOR VOLUME HOLOGRAM RECORDING LAYER FORMATION, AND VOLUME HOLOGRAM RECORDING MATERIAL MITSUBISHI CHEMICAL CORPORATION (JP) 2010-03-18 US disclosed
US-20100039685-A1 VOLUME HOLOGRAM OPTICAL RECORDING MEDIUM, COMPOSITION FOR FORMING VOLUME HOLOGRAM RECORDING LAYER, VOLUME HOLOGRAM RECORDING MATERIAL, AND VOLUME HOLOGRAM OPTICAL RECORDING METHOD MITSUBISHI CHEMICAL CORPORATION (JP) 2010-02-18 US disclosed
EP-2077471-A1 VOLUME HOLOGRAM OPTICAL RECORDING MEDIUM, COMPOSITION FOR VOLUME HOLOGRAM RECORDING LAYER FORMATION, AND VOLUME HOLOGRAM RECORDING MATERIAL Mitsubishi Chemical Corporation (JP) 2009-07-08 EP disclosed
EP-0573023-B1 Method for manufacturing liquid jet recording head CANON KK (JP) 1998-12-30 EP disclosed
US-5458254-A Method for manufacturing liquid jet recording head CANON KABUSHIKI KAISHA (JP) 1995-10-17 US disclosed
EP-0573023-A1 Method for manufacturing liquid jet recording head CANON KABUSHIKI KAISHA (JP) 1993-12-08 EP disclosed
EP-0140240-B1 PROCESS FOR FORMING AN ORGANIC THIN FILM HITACHI, LTD. (JP) 1988-07-06 EP disclosed
US-4604294-A VACUUM VAPOR DEPOSITION HITACHI, LTD. (JP) 1986-08-05 US disclosed
EP-0067067-B1 DRY-DEVELOPING NEGATIVE RESIST COMPOSITION FUJITSU LIMITED (JP) 1985-09-25 EP disclosed
EP-0140240-A1 Process for forming an organic thin film HITACHI, LTD. (JP) 1985-05-08 EP disclosed
US-4464455-A Dry-developing negative resist composition FUJITSU LIMITED (JP) 1984-08-07 US disclosed
EP-0067067-A2 Dry-developing negative resist composition FUJITSU LIMITED (JP) 1982-12-15 EP disclosed