Hydrochloric Acid

Hydrochloric Acid

SCHEMBL774708

[Cl-].[H+].[SiH4]

nearest known ligand 0.00

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Known targets — ChEMBL curated mechanism

ACHEBDKRB2CHRM1CHRM2CHRM3CHRNA1CHRNB1CHRNDCHRNECHRNGGUCY1A1GUCY1A2GUCY1B1GUCY1B2NAMPTPTAFRSLC10A2SLC6A2SLC6A3TACR1dacAdacBdacCftsImrcAmrcBmrdA

The experimentally established mechanism targets of Hydrochloric Acid. The predicted profile below is derived independently by chemical similarity — agreement is a validation signal, a miss is honest.

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
Hydrochloric Acid SCHEMBL829788 1.00
Hydrochloric Acid SCHEMBL830957 0.87
Hydrochloric Acid SCHEMBL8326758 0.87
Hydrochloric Acid SCHEMBL830169 0.87
Hydrochloric Acid SCHEMBL6065995 0.87
Hydrochloric Acid SCHEMBL9813518 0.87
Hydrochloric Acid SCHEMBL9019483 0.87
SCHEMBL57479 0.82
SCHEMBL4106133 0.82
Hydrochloric Acid SCHEMBL4799714 0.82

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 47 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-220288344-U Polysilicon hydrogen chloride tail gas stepped energy-saving recovery system 中石化南京工程有限公司 2024-01-02 CN claimed
EP-2243745-B1 Method for making a chlorosilane VERSUM MAT US LLC (US) 2019-06-19 EP claimed
CN-106378133-A Catalyst for producing trichlorosilane with silicon-hydrogen chlorination process, preparation method of catalyst and method for catalytically producing trichlorosilane 中国科学院过程工程研究所 2017-02-08 CN claimed
WO-2011084427-A2 METHODS AND SYSTEMS FOR PRODUCING SILICON, E.G., POLYSILICON, INCLUDING RECYCLING BYPRODUCTS INTELLIGENT SOLAR, LLC (US) 2011-07-14 WO claimed
EP-2243745-A2 Method for making a chlorosilane Air Products and Chemicals, Inc. (US) 2010-10-27 EP claimed
JP-60215513-A None JP disclosed
US-12622185-B2 Method for manufacturing semiconductor silicon wafer composed of silicon wafer substrate and silicon monocrystalline epitaxial layer GLOBALWAFERS JAPAN CO., LTD. (JP) 2026-05-05 US disclosed
CN-120195760-A Pipeline blockage detection method, system and computer readable storage medium 西安奕斯伟材料科技股份有限公司 2025-06-24 CN disclosed
CN-119644615-A Optical fiber interference structure, preparation method thereof, optical fiber modulator and optical modulation device 北京航空航天大学 2025-03-18 CN disclosed
CN-220288344-U Polysilicon hydrogen chloride tail gas stepped energy-saving recovery system 中石化南京工程有限公司 2024-01-02 CN disclosed
CN-220288344-U Polysilicon hydrogen chloride tail gas stepped energy-saving recovery system 中石化南京工程有限公司 2024-01-02 CN disclosed
US-20230073641-A1 MANUFACTURING METHOD FOR SEMICONDUCTOR SILICON WAFER GLOBALWAFERS JAPAN CO., LTD. (JP) 2023-03-09 US disclosed
EP-0036573-B1 METHOD FOR MAKING A POLYSILICON CONDUCTOR STRUCTURE International Business Machines Corporation (US) 1986-10-22 EP disclosed
JP-S60215513-A CONTINUOUS PREPARATION OF SILANE COMPOUND DENKI KAGAKU KOGYO KK 1985-10-28 JP disclosed
EP-0036144-B1 METHOD FOR SELECTIVE REACTIVE ION ETCHING OF SILICON International Business Machines Corporation (US) 1983-08-10 EP disclosed
EP-0036573-A2 Method for making a polysilicon conductor structure International Business Machines Corporation (US) 1981-09-30 EP disclosed
EP-0036111-A2 Method for making fine deep dielectric isolation International Business Machines Corporation (US) 1981-09-23 EP disclosed
EP-0036144-A1 Method for selective reactive ion etching of silicon International Business Machines Corporation (US) 1981-09-23 EP disclosed
US-4287661-A Method for making an improved polysilicon conductor structure utilizing reactive-ion etching and thermal oxidation INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 1981-09-08 US disclosed
US-4274909-A Method for forming ultra fine deep dielectric isolation INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 1981-06-23 US disclosed