SCHEMBL789877

SCHEMBL789877

Cl[SiH2][SiH2]Cl

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL2734183 0.91
SCHEMBL9556533 0.68
SCHEMBL3912281 0.68
SCHEMBL9421787 0.67
SCHEMBL31388943 0.67
SCHEMBL535839 0.67
SCHEMBL49524 0.67
SCHEMBL1672412 0.63
SCHEMBL10824466 0.60
SCHEMBL13279759 0.60

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 470 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-4748968-A1 METHOD FOR FORMING THIN FILM USING TWO TYPES OF SILICON PRECURSOR COMPOUNDS Hansol Chemical Co., Ltd (KR) 2026-05-27 EP claimed
US-12635431-B2 High aspect ratio carbon layer etch with improved throughput and process window TOKYO ELECTRON LIMITED (JP) 2026-05-19 US claimed
EP-4667616-A1 METHOD FOR THE FORMATION OF THIN FILMS USING TWO TYPES OF SILICON PRECURSOR Hansol Chemical Co., Ltd (KR) 2025-12-24 EP claimed
US-20250369114-A1 METHOD FOR THE FORMATION OF THIN FILMS USING TWO TYPES OF SILICON PRECURSOR HANSOL CHEMICAL CO LTD (KR) 2025-12-04 US claimed
US-20250232981-A1 HIGH ASPECT RATIO CARBON LAYER ETCH WITH IMPROVED THROUGHPUT AND PROCESS WINDOW TOKYO ELECTRON LIMITED (JP) 2025-07-17 US claimed
CN-119823166-A Preparation method of six-membered cyclic chiral disilicide compound 中国科学技术大学 2025-04-15 CN claimed
US-20250059644-A1 SEMICONDUCTOR PROCESSING SYSTEM, A SEMICONDUCTOR PRECURSOR STORAGE VESSEL AND A METHOD OF FORMING A SILICON COMPRISING LAYER ASM IP HOLDING B.V. (NL) 2025-02-20 US claimed
CN-119406325-A Silane gas production system and method based on double-reaction rectifying tower 乐山协鑫新能源科技有限公司 2025-02-11 CN claimed
US-20250038003-A1 LOW TEMPERATURE MOLYBDENUM DEPOSITION ASSISTED BY SILICON-CONTAINING REACTANTS LAM RESEARCH CORPORATION (US) 2025-01-30 US claimed
WO-2025018802-A1 METHOD FOR FORMING THIN FILM USING TWO TYPES OF SILICON PRECURSOR COMPOUNDS 주식회사 한솔케미칼 2025-01-23 WO claimed
WO-2007140375-A2 METHODS AND SYSTEMS FOR SELECTIVELY DEPOSITING SI-CONTAINING FILMS USING CHLOROPOLYSILANES ASM AMERICA, INC. (US) 2007-12-06 WO claimed
US-7105460-B2 Nitrogen-free dielectric anti-reflective coating and hardmask APPLIED MATERIALS (US) 2006-09-12 US claimed
CN-1250556-C Compound of diamine disilazane and preparation method UNIV SHANGHAI JIAOTONG (CN) 2006-04-12 CN claimed
CN-1240704-C Compound of compound 1,4 diaza tetra silicon cyclonexane, and preparation method UNIV SHANGHAI JIAOTONG (CN) 2006-02-08 CN claimed
CN-1563016-A Compound of compound 1,4 diaza tetra silicon cyclonexane, and preparation method UNIV SHANGHAI JIAOTONG (CN) 2005-01-12 CN claimed
CN-1562920-A Compound of diamine disilazane and preparation method UNIV SHANGHAI JIAOTONG (CN) 2005-01-12 CN claimed
US-4923949-A REACTING GRIGNARD REAGENT WITH 1,2-DIETHYNYLDISILANE FOLLOWED WITH 1,2-DICHLORODISILANE; ELECTROCONDUCTIVE KANEGAFUCHI CHEMICAL INDUSTRY CO., LTD. (JP) 1990-05-08 US claimed
WO-1990001515-A1 ETHYNYLENE-DISILANYLENE COPOLYMERS AND METHOD OF PREPARING SAME KANEGAFUCHI KAGAKU KOGYO KABUSHIKI KAISHA (JP) 1990-02-22 WO claimed
WO-1990001485-A1 METHOD FOR PREPARING 1,2,5,6-TETRASILAOCTA-3,7-DIYNES KANEGAFUCHI KAGAKU KOGYO KABUSHIKI KAISHA (JP) 1990-02-22 WO claimed
US-4845255-A DICHLORODISILANE PLUS GRIGNARD REAGENT KANEGAFUCHI CHEMICAL INDUSTRY CO., LTD. (JP) 1989-07-04 US claimed