SCHEMBL49524

SCHEMBL49524

Cl[SiH2]Cl

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL9421787 1.00
SCHEMBL1895029 0.89
SCHEMBL10824466 0.89
SCHEMBL2803807 0.89
SCHEMBL5415465 0.89
Ammonia Solution, Strong SCHEMBL3277366 0.89
SCHEMBL13279759 0.89
SCHEMBL1895030 0.89
SCHEMBL2734608 0.89
SCHEMBL9234557 0.89

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Appears in 56818 patents — a generic fragment claimed broadly, so it's down-weighted as IP noise. Top by claim status then date:

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20260146322-A1 DEPOSITION METHODS USING PULSED PLASMA WITH VARYING PULSE FREQUENCY TOKYO ELECTRON LIMITED (JP) 2026-05-28 US claimed
US-20260150351-A1 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. (TW) 2026-05-28 US claimed
US-20260150380-A1 CONTINUOUS HIGH DOPANT CONCENTRATION IN EPITAXY REGIONS TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. (TW) 2026-05-28 US claimed
US-20260150592-A1 METHOD OF FORMING A SILICON ON INSULATOR SUBSTRATE SK Hynix Inc. (KR) 2026-05-28 US claimed
EP-4749710-A1 SILICON-CARBON COMPOSITE MATERIAL CONTAINING CARBON NANOTUBES, AND PREPARATION METHOD THEREFOR AND USE THEREOF Tianmulake Excellent Anode Materials Co, Ltd. (CN) 2026-05-27 EP claimed
EP-4748968-A1 METHOD FOR FORMING THIN FILM USING TWO TYPES OF SILICON PRECURSOR COMPOUNDS Hansol Chemical Co., Ltd (KR) 2026-05-27 EP claimed
EP-4750304-A1 METHOD OF FORMING A SILICON ON INSULATOR SUBSTRATE SK hynix Inc. (KR) 2026-05-27 EP claimed
CN-122079120-A Porous carbon, silicon-carbon anode material comprising porous carbon, and preparation method and application of porous carbon 2026-05-26 CN claimed
CN-114695264-B Semiconductor memory structure and method for filling conductive material in contact hole INSTITUTE OF MICROELECTRONICS OF THE CHINESE ACADEMY OF SCIENCES (CN) 2026-05-26 CN claimed
CN-113948464-B Field effect transistor device with gate spacer structure TAIWAN SEMICONDUCTOR MANUFACTURING CO.,LTD. (CN) 2026-05-26 CN claimed
US-4113845-A ION EXCHANGE UNION CARBIDE CORPORATION (US) 1978-09-12 US claimed
US-4085084-A Silicone resins having good thermal stability GENERAL ELECTRIC COMPANY (US) 1978-04-18 US claimed
US-4082691-A FOR AQUEOUS SYSTEMS WITCO CHEMICAL CORPORATION (US) 1978-04-04 US claimed
US-4038370-A METHOD OF PRODUCING HIGH-PURITY TRANSPARENT VITREOUS SILICA KOMATSU ELECTRONIC METALS CO., LTD. (JA) 1977-07-26 US claimed
US-4038371-A DISMUTATION OF TRICHLOROSILANE RHONE-POULENC INDUSTRIES (FR) 1977-07-26 US claimed
US-4018871-A TO DICHLOROSILANE, N-SUBSTITUTED-A-PYRROLIDONE CATALYST RHONE-POULENC INDUSTRIES (FR) 1977-04-19 US claimed
US-4007050-A OR METALLOIDS DEUTSCHE GOLD- UND SILBER-SCHEIDEANSTALT VORMALS ROESSLER (DT) 1977-02-08 US claimed
US-3980686-A Process for the preparation of chlorosilane RHONE-POULENC INDUSTRIES (FR) 1976-09-14 US claimed
US-RE28818-E WATER, REACTION PRODUCT OF PYROGENIC SILICA AND DIMETHYL DICHLOROSILANE AKZONA INCORPORATED (US) 1976-05-18 US claimed
US-3945864-A Method of growing thick expitaxial layers of silicon RCA CORPORATION (US) 1976-03-23 US claimed