SCHEMBL8008571

SCHEMBL8008571

CC(O)CS(=O)(=O)[O-].CC(O)CS(=O)(=O)[O-].[Pb+2]

nearest known ligand 0.36

Predicted protein targets (top 5)

geneUniProtsupporting neighboursconfidence
TSHR P16473 2/20 0.33
TDP1 Q9NUW8 1/20 0.33
TP53 P04637 1/20 0.33
BBOX1 O75936 1/20 0.32
ALDH1A1 P00352 1/20 0.32

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL30174348 0.94 TSHR (0.33) TSHRTDP1TP53BBOX1ALDH1A1
SCHEMBL1138619 0.94 TSHR (0.33) TSHRTDP1TP53BBOX1ALDH1A1
SCHEMBL19809588 0.94 TSHR (0.33) TSHRTDP1TP53BBOX1ALDH1A1
SCHEMBL1138618 0.94 TSHR (0.33) TSHRTDP1TP53BBOX1ALDH1A1
SCHEMBL8008569 0.94 TSHR (0.33) TSHRTDP1TP53BBOX1ALDH1A1
SCHEMBL1138590 0.94 TSHR (0.33) TSHRTDP1TP53BBOX1ALDH1A1
SCHEMBL1863170 0.94 TSHR (0.33) TSHRTDP1TP53BBOX1ALDH1A1
Lithium Ion SCHEMBL4299560 0.94
SCHEMBL490865 0.94
Potassium Ion SCHEMBL28676428 0.94

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 11 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-11993862-B2 Structure including copper plating layer or copper alloy plating layer ISHIHARA CHEMICAL CO., LTD. (JP) 2024-05-28 US disclosed
US-11946153-B2 Copper or copper alloy electroplating bath ISHIHARA CHEMICAL CO., LTD. (JP) 2024-04-02 US disclosed
US-11939691-B2 Tin or tin alloy electroplating bath, and electronic component having electrodeposit formed thereon using the plating bath ISHIHARA CHEMICAL CO., LTD. (JP) 2024-03-26 US disclosed
US-20220316085-A1 STRUCTURE INCLUDING COPPER PLATING LAYER OR COPPER ALLOY PLATING LAYER ISHIHARA CHEMICAL CO., LTD. (JP) 2022-10-06 US disclosed
US-20220127741-A1 COPPER OR COPPER ALLOY ELECTROPLATING BATH ISHIHARA CHEMICAL CO., LTD. (JP) 2022-04-28 US disclosed
EP-0770708-B1 Electrolytic process for producing lead sulfonate and tin sulfonate for solder plating use DAIWA FINE CHEMICALS CO LTD (JP) 2000-01-19 EP disclosed
EP-0770708-A1 Electrolytic process for producing lead sulfonate and tin sulfonate for solder plating use Daiwa Fine Chemicals Co., Ltd. (JP) 1997-05-02 EP disclosed
US-5618404-A APPLYING DIRECT CURRENT VOLTAGE TO AN ANODE MADE OF LEAD OR TIN IN AN ELECTROLYTE SOLUTION CONTAINING AN ORGANIC SULFONIC ACIDS; IONIZATION DAIWA FINE CHEMICALS CO., LTD. (JP) 1997-04-08 US disclosed
EP-0520421-B1 Immersion tin/lead alloy plating bath LEARONAL JAPAN INC (JP) 1996-09-18 EP disclosed
EP-0520421-A2 Immersion tin/lead alloy plating bath LEARONAL JAPAN Inc. (JP) 1992-12-30 EP disclosed
US-4617097-A Process and electrolyte for electroplating tin, lead or tin-lead alloys LEARONAL, INC. (US) 1986-10-14 US disclosed