SCHEMBL823110

SCHEMBL823110

C/C=C\C=C/C(O)=C\C

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL14255997 1.00
SCHEMBL14256037 0.79
SCHEMBL25330313 0.75 TSHR (0.44)
SCHEMBL14616139 0.75
SCHEMBL14256229 0.75
SCHEMBL26703946 0.75 CNR1 (0.30)
SCHEMBL20985488 0.75 ALDH1A1 (0.32)
SCHEMBL15368848 0.74
SCHEMBL16693628 0.74
SCHEMBL11946722 0.74

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 27 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20230234905-A1 NOVEL TRISPHENOL DERIVATIVE HONSHU CHEMICAL INDUSTRY CO., LTD. (JP) 2023-07-27 US disclosed
US-9765012-B2 Method for producing diaryl carbonate COVESTRO DEUTSCHLAND AG (DE) 2017-09-19 US disclosed
EP-3205685-A1 COPOLYCARBONATE AND COMPOSITION COMPRISING SAME LG Chem, Ltd. (KR) 2017-08-16 EP disclosed
US-20170073300-A1 METHOD FOR PRODUCING DIARYL CARBONATES COVESTRO DEUTSCHLAND AG (DE) 2017-03-16 US disclosed
US-8372176-B2 Metal complexes comprising a ligand derived from 2-aryl-2-hydroxyacetic acid and a divalent or trivalent metal cation, and their use CLARIANT SPECIALTY FINE CHEMICALS (FRANCE) (FR) 2013-02-12 US disclosed
US-20120305295-A1 THERMOSETTING COMPOSITION SHOWA DENKO K.K. (JP) 2012-12-06 US disclosed
US-20120228782-A1 METHOD FOR MANUFACTURING ELECTRONIC DEVICE, ELECTRONIC DEVICE, METHOD FOR MANUFACTURING ELECTRONIC DEVICE PACKAGE AND ELECTRONIC DEVICE PACKAGE Sumitomo Bakelite Co, Ltd (JP) 2012-09-13 US disclosed
US-20120168894-A1 HARD MASK COMPOSITION, METHOD OF FORMING A PATTERN, AND SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE INCLUDING THE PATTERN CHEIL INDUSTRIES, INC. (KR) 2012-07-05 US disclosed
US-20110272183-A1 (POLY)CARBONATE POLYOL AND CARBOXYL GROUP-CONTAINING POLYURETHANE OBTAINED FROM THE (POLY)CARBONATE POLYOL SHOWA DENKO K.K. (JP) 2011-11-10 US disclosed
US-20110253426-A1 CURABLE COMPOSITION SHOWA DENKO K.K. (JP) 2011-10-20 US disclosed
US-7674859-B2 Adhesive composition and adhesive sheet LINTEC CORPORATION (JP) 2010-03-09 US disclosed
US-20100032826-A1 SEMICONDUCTOR PACKAGE, CORE LAYER MATERIAL, BUILDUP LAYER MATERIAL, AND SEALING RESIN COMPOSITION SUMITOMO BAKELITE COMPANY LIMITED (JP) 2010-02-11 US disclosed
US-20100016497-A1 EPOXY RESIN COMPOSITION AND SEMICONDUCTOR DEVICE MIZUNO YASUHIRO 2010-01-21 US disclosed
US-20090004829-A1 Adhesive Composition, Adhesive Sheet and Production Process for Semiconductor Device LINTEC CORPORATION (JP) 2009-01-01 US disclosed
US-7442729-B2 curing accelerator which is suitable for various curable resin compositions, an epoxy resin composition having excellent curability, storage stability and fluidity, and a semiconductor device having excellent solder cracking resistance and moisture resistance reliability are provided. SUMITOMO BAEKLITE COMPANY LIMITED (JP) 2008-10-28 US disclosed
US-20080185700-A1 Adhesive Film and Method for Manufacturing Semiconductor Device Using Same MITSUI CHEMICALS, INC. (JP) 2008-08-07 US disclosed
US-7397139-B2 Containing a curing agent and an inorganic filler, especially silica having a maximum diameter size of at least 32 mu m, an average particle size of 12 mu m or less and a specific surface area of 3.0 m2/g or more HITACHI CHEMICAL CO., LTD. (JP) 2008-07-08 US disclosed
US-7381501-B2 Polymer electrolyte and proton conductive membrane JSR CORPORATION (JP) 2008-06-03 US disclosed
US-20070031675-A1 Epoxy resin composition for packaging a semiconductor device, method of making the same, and semiconductor device using the same CHEIL INDUSTRIES, INC. (KR) 2007-02-08 US disclosed
US-20070010601-A1 Latent catalyst for epoxy resin, epoxy resin composition, and semiconductor device SUMOTOMO BAKELITE COMPANY LIMITED (JP) 2007-01-11 US disclosed