SCHEMBL8896233

SCHEMBL8896233

Cc1ccc(-c2cc(C3CCCCC3)ccc2O)c(O)c1-c1cc(C2CCCCC2)ccc1O

nearest known ligand 0.44

Predicted protein targets (top 15)

geneUniProtsupporting neighboursconfidence
▸ ACMSD Q8TDX5 2/20 0.44
▸ QDPR P09417 4/20 0.37
▸ HDAC4 P56524 1/20 0.37
▸ HDAC2 Q92769 1/20 0.37
▸ HDAC8 Q9BY41 1/20 0.37
▸ PDK2 Q15119 1/20 0.36
▸ BIRC5 O15392 2/20 0.35
▸ BACE1 P56817 2/20 0.35
▸ NOS3 P29474 2/20 0.35
▸ NOS1 P29475 2/20 0.35
▸ NOS2 P35228 2/20 0.35
▸ S1PR1 P21453 1/20 0.34
▸ NUDT1 P36639 1/20 0.34
▸ KMO O15229 1/20 0.33
▸ NLRP3 Q96P20 1/20 0.33

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL8897014 0.89 ACMSD (0.44) ACMSDQDPRHDAC4HDAC2HDAC8
SCHEMBL8897907 0.87 ACMSD (0.48) ACMSDQDPRHDAC4HDAC2HDAC8
SCHEMBL7932026 0.82 ACMSD (0.61) ACMSDQDPRHDAC4HDAC2HDAC8
Orthocresol SCHEMBL15511891 0.78 ACMSD (0.48) ACMSDQDPRHDAC4HDAC2HDAC8
P-Cresol SCHEMBL15512160 0.77 ACMSD (0.49) ACMSDQDPRHDAC4HDAC2HDAC8
SCHEMBL3357755 0.75 ACMSD (0.53) ACMSDQDPRHDAC4HDAC2HDAC8
SCHEMBL917464 0.75 ACMSD (0.57) ACMSDQDPRHDAC4HDAC2HDAC8
SCHEMBL28454797 0.75 ACMSD (0.57) ACMSDQDPRHDAC4HDAC2HDAC8
SCHEMBL22313839 0.75 ACMSD (0.53) ACMSDQDPRHDAC4HDAC2HDAC8
SCHEMBL10890219 0.75 ACMSD (0.57) ACMSDQDPRHDAC4HDAC2HDAC8

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 30 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-10162260-B2 Photosensitive resin composition, protective film, and liquid crystal display element CHI MEI CORPORATION (TW) 2018-12-25 — — US disclosed
US-9851638-B2 Photosensitive polysiloxane composition and uses thereof CHI MEI CORPORATION (TW) 2017-12-26 — — US disclosed
US-20170168390-A1 PHOTOSENSITIVE RESIN COMPOSITION, PROTECTIVE FILM, AND LIQUID CRYSTAL DISPLAY ELEMENT CHI MEI CORPORATION (TW) 2017-06-15 — — US disclosed
US-20170023860-A1 PHOTOSENSITIVE POLYSILOXANE COMPOSITION AND USES THEREOF CHI MEI CORP (TW) 2017-01-26 — — US disclosed
US-9541832-B2 Photosensitive resin composition, protective film and element having the same CHI MEI CORPORATION (TW) 2017-01-10 — — US disclosed
US-9422446-B2 Photosensitive resin composition, protective film and element having the same CHI MEI CORPORATION (TW) 2016-08-23 — — US disclosed
US-9395627-B2 Positive photosensitive resin composition and method for forming pattern by using the same CHI MEI CORPORATION 2016-07-19 — — US disclosed
US-9389509-B2 Photosensitive polysiloxane composition, protecting film and element having the protecting film CHI MEI CORPORATION (TW) 2016-07-12 — — US disclosed
US-20150378256-A1 PHOTOSENSITIVE RESIN COMPOSITION, PROTECTIVE FILM AND ELEMENT HAVING THE SAME CHI MEI CORPORATION (TW) 2015-12-31 — — US disclosed
US-20150376355-A1 PHOTOSENSITIVE RESIN COMPOSITION, PROTECTIVE FILM AND ELEMENT HAVING THE SAME CHI MEI CORPORATION (TW) 2015-12-31 — — US disclosed
US-20140051017-A1 PHOTOSENSITIVE RESIN COMPOSITION AND APPLICATION THEREOF CHI MEI CORPORATION (TW) 2014-02-20 — — US disclosed
US-20130306970-A1 POSITIVE PHOTOSENSITIVE RESIN COMPOSITION AND USES THEREOF CHI MEI CORPORATION (TW) 2013-11-21 — — US disclosed
US-20130164461-A1 POSITIVE PHOTOSENSITIVE RESIN COMPOSITION AND USES THEREOF CHI MEI CORPORATION (TW) 2013-06-27 — — US disclosed
US-20120328799-A1 POSITIVE PHOTOSENSITIVE RESIN COMPOSITION AND METHOD FOR FORMING PATTERNS BY USING THE SAME CHI MEI CORPORATION (TW) 2012-12-27 — — US disclosed
US-20120287393-A1 POSITIVE PHOTOSENSITIVE RESIN COMPOSITION AND METHOD FOR FORMING PATTERNS BY USING THE SAME CHI MEI COOPERATION (TW) 2012-11-15 — — US disclosed
US-5601961-A QUINONE DIAZIDE GROUP-CONTAINING COMPOUND AS PHOTOSENSITIZING AGENT, ALKALI-SOLUBLE RESINOUS INGREDIENT AS FILM-FORMING AGENT MADE FROM A BLEND OF AT LEAST TWO NOVOLAK-TYPE RESINS FROM M-AND P-CRESOL, A XYLENOL AND A TRIMETHYLPHENOL TOKYO OHKA KOGYO CO., LTD. (JP) 1997-02-11 — — US disclosed
US-5576138-A MIXTURE OF RESIN, PHOTOSENSITIZER AND BENZOPHENONE COMPOUND TOKYO OHKA KOGYO CO., LTD. (JP) 1996-11-19 — — US disclosed
US-5501936-A IMPROVED RESOLUTION OF VERY FINE PATTERNS TOKYO OHKA KOGYO CO., LTD. (JP) 1996-03-26 — — US disclosed
US-5478692-A Fine patterning for electronics TOKYO OHKA KOGYO CO., LTD. (JP) 1995-12-26 — — US disclosed
US-5434031-A Positive-working naphthoquinone diazide photoresist composition containing specific hydroxy compound additive TOKYO OHKA KOGYO CO., LTD. (JP) 1995-07-18 — — US disclosed
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