SCHEMBL8962844

SCHEMBL8962844

CC1(C)CC[Si](CCCN)(CCCN)OC1(C)C

nearest known ligand 0.00

⚠ Novel chemotype — no close known analogue (best Tanimoto < 0.3). Unexplored chemical space relative to ChEMBL.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL8025781 0.74
SCHEMBL926380 0.67
SCHEMBL27980324 0.66
SCHEMBL2030787 0.63
SCHEMBL2030412 0.62
SCHEMBL8962854 0.62
SCHEMBL8759409 0.60
SCHEMBL10013713 0.60
SCHEMBL8200527 0.59
SCHEMBL23992282 0.58

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 11 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-0467561-B1 Photosensitive resin composition for forming a polyimide film pattern TOSHIBA KK (JP) 1995-10-18 EP claimed
US-20240210827-A1 PHOTOSENSITIVE RESIN COMPOSITION, METHOD FOR MANUFACTURING CURED RELIEF PATTERN, AND SEMICONDUCTOR APPARATUS ASAHI KASEI KABUSHIKI KAISHA (JP) 2024-06-27 US disclosed
US-10831101-B2 Photosensitive resin composition, method for manufacturing cured relief pattern, and semiconductor apparatus ASAHI KASEI KABUSHIKI KAISHA (JP) 2020-11-10 US disclosed
US-20190113845-A1 PHOTOSENSITIVE RESIN COMPOSITION, METHOD FOR MANUFACTURING CURED RELIEF PATTERN, AND SEMICONDUCTOR APPARATUS ASAHI KASEI KABUSHIKI KAISHA (JP) 2019-04-18 US disclosed
US-5518864-A PHOTOSENSITIVE, QUINONE DIAZIDE KABUSHIKI KAISHA TOSHIBA (JP) 1996-05-21 US disclosed
EP-0137655-B1 RADIATION-SENSITIVE POLYMER COMPOSITION TORAY INDUSTRIES, INC. (JP) 1988-12-28 EP disclosed
US-4783391-A Radiation-sensitive polyamide polymer composition with anthraquinone monoazide TORAY INDUSTRIES, INC. (JP) 1988-11-08 US disclosed
EP-0119719-B1 RADIATION SENSITIVE POLYMER COMPOSITION TORAY INDUSTRIES, INC. (JP) 1987-05-06 EP disclosed
US-4608333-A INCREASED PHOTOSENSITIVITY BY INCLUDING AN AROMATIC SECONDARY OR TERTIARY AMINE WITH AN ACRYLIC MONOMER AND A POLYIMIDE-CURING POLYAMIDE TORAY INDUSTRIES, INC. (JP) 1986-08-26 US disclosed
EP-0137655-A2 Radiation-sensitive polymer composition TORAY INDUSTRIES, INC. (JP) 1985-04-17 EP disclosed
EP-0119719-A1 Radiation sensitive polymer composition TORAY INDUSTRIES, INC. (JP) 1984-09-26 EP disclosed