SCHEMBL896813

SCHEMBL896813

CCCOC(C)COC(C)COC(C)COC(C)=O

nearest known ligand 0.44

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
TDP1 Q9NUW8 2/20 0.44
ALDH1A1 P00352 3/20 0.42
HSD17B10 Q99714 2/20 0.38
LMNA P02545 1/20 0.38
TSHR P16473 4/20 0.36
ALOX15 P16050 1/20 0.33
CHRM1 P11229 3/20 0.32
CHRM5 P08912 2/20 0.32
CHRM3 P20309 2/20 0.32
CHRM2 P08172 2/20 0.32
CHRM4 P08173 2/20 0.32
TBXA2R P21731 2/20 0.32
PGR P06401 1/20 0.32
HTR1A P08908 1/20 0.32
CHRNB2 P17787 1/20 0.32
CHRNB4 P30926 1/20 0.32
CHRNA3 P32297 1/20 0.32
CHRNA7 P36544 1/20 0.32
CHRNA4 P43681 1/20 0.32
SMN1; SMN2 Q16637 1/20 0.32

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL20210831 1.00 TDP1 (0.44) TDP1ALDH1A1HSD17B10LMNATSHR
SCHEMBL487419 1.00 TDP1 (0.44) TDP1ALDH1A1HSD17B10LMNATSHR
SCHEMBL2779992 0.96 ALDH1A1 (0.45) TDP1ALDH1A1HSD17B10LMNATSHR
SCHEMBL487273 0.89 ALDH1A1 (0.53) TDP1ALDH1A1HSD17B10LMNATSHR
SCHEMBL895989 0.89 ALDH1A1 (0.53) TDP1ALDH1A1HSD17B10LMNATSHR
SCHEMBL20210844 0.89 ALDH1A1 (0.53) TDP1ALDH1A1HSD17B10LMNATSHR
SCHEMBL19064962 0.87 ALDH1A1 (0.47) TDP1ALDH1A1TSHRPRKCAFAAH
SCHEMBL6531010 0.87 ALDH1A1 (0.47) TDP1ALDH1A1TSHRPRKCAFAAH
SCHEMBL896774 0.86 ALDH1A1 (0.46) ALDH1A1TSHRPRKCAFAAH
SCHEMBL22408895 0.86 ALDH1A1 (0.46) ALDH1A1TSHRPRKCAFAAH

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 76 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20250215318-A1 ETCHING COMPOSITION, ETCHING METHOD USING SAME, AND METHOD FOR MANUFACTURING ELECTRONIC COMPONENT TOKYO OHKA KOGYO CO., LTD. (JP) 2025-07-03 US disclosed
EP-3961676-B1 ETCHING METHOD AND PHOTOSENSITIVE RESIN COMPOSITION TOKYO OHKA KOGYO CO LTD (JP) 2025-01-22 EP disclosed
CN-119278503-A Substrate processing method and substrate manufacturing method 中央硝子株式会社 2025-01-07 CN disclosed
US-12187047-B2 Flow passage member, liquid ejecting head, liquid ejecting apparatus, and method for manufacturing flow passage member SEIKO EPSON CORPORATION (JP) 2025-01-07 US disclosed
CN-119278504-A Substrate processing method and substrate manufacturing method 中央硝子株式会社 2025-01-07 CN disclosed
US-11945152-B2 Model material ink set, support material composition, ink set, three-dimensional shaped object, and method for manufacturing three-dimensional shaped object MAXELL, LTD. (JP) 2024-04-02 US disclosed
EP-3715094-B1 COMPOSITION FOR MODEL MATERIAL MAXELL LTD (JP) 2024-03-27 EP disclosed
CN-108026225-B Resin composition for mold material, resin composition for support material, stereolithography product, and method for producing stereolithography product 麦克赛尔株式会社 2024-03-05 CN disclosed
CN-117304414-A Resin composition for mold material and stereolithography 麦克赛尔株式会社 2023-12-29 CN disclosed
WO-2023204141-A1 ETCHING COMPOSITION, ETCHING METHOD USING SAME, AND METHOD FOR MANUFACTURING ELECTRONIC COMPONENT 東京応化工業株式会社 2023-10-26 WO disclosed
US-20160263899-A1 INK JET RECORDING APPARATUS AND METHOD FOR MAINTAINING THE SAME SEIKO EPSON CORPORATION (JP) 2016-09-15 US disclosed
US-9409398-B2 Maintenance unit and liquid ejecting apparatus SEIKO EPSON CORPORATION (JP) 2016-08-09 US disclosed
US-20160144626-A1 MAINTENANCE UNIT AND LIQUID EJECTING APPARATUS SEIKO EPSON CORPORATION (JP) 2016-05-26 US disclosed
CN-105564032-A Maintenance unit and liquid ejection device SEIKO EPSON CORP 2016-05-11 CN disclosed
US-20160121614-A1 MAINTENANCE UNIT AND LIQUID EJECTION DEVICE SEIKO EPSON CORPORATION (JP) 2016-05-05 US disclosed
US-9199469-B1 Ink jet recording apparatus and maintenance thereof SEIKO EPSON CORPORATION (JP) 2015-12-01 US disclosed
US-20150328897-A1 INK JET RECORDING APPARATUS AND MAINTENANCE THEREOF SEIKO EPSON CORPORATION (JP) 2015-11-19 US disclosed
EP-2944472-A1 INK JET RECORDING APPARATUS AND MAINTENANCE METHOD THEREOF Seiko Epson Corporation (JP) 2015-11-18 EP disclosed
US-20120082791-A1 Coating Composition Amenable to Elastomeric Substrates LIVERSAGE ROBERT RICHARD (US) 2012-04-05 US disclosed
US-20090026425-A1 COMPOSITION COMPRISING POLYESTER AMIDE ACID AND THE LIKE AND INK-JET INK COMPOSITION USING THE SAME CHISSO CORPORATION (JP) 2009-01-29 US disclosed