SCHEMBL92814

SCHEMBL92814

CC(C)CCCCC(O)(F)C(F)F

nearest known ligand 0.37

Predicted protein targets (top 5)

geneUniProtsupporting neighboursconfidence
LMNA P02545 1/20 0.37
MEN1 O00255 1/20 0.36
CYP3A4 P08684 1/20 0.36
ALOX15 P16050 1/20 0.36
KMT2A Q03164 1/20 0.36

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL92813 0.79 LMNA (0.34) LMNAMEN1CYP3A4ALOX15KMT2A
SCHEMBL10082814 0.77 MEN1 (0.42) LMNAMEN1CYP3A4ALOX15KMT2A
SCHEMBL92787 0.74 MEN1 (0.40) LMNAMEN1CYP3A4ALOX15KMT2A
SCHEMBL12251777 0.74 LMNA (0.46) LMNAMEN1CYP3A4ALOX15KMT2A
SCHEMBL19759288 0.72 LMNA (0.43) LMNAMEN1CYP3A4ALOX15KMT2A
SCHEMBL22776 0.72 MEN1 (0.45) LMNAMEN1CYP3A4ALOX15KMT2A
SCHEMBL17882175 0.72 LMNA (0.43) LMNAMEN1CYP3A4ALOX15KMT2A
SCHEMBL28692310 0.71 MEN1 (0.41) LMNAMEN1CYP3A4ALOX15KMT2A
SCHEMBL1191595 0.71 LMNA (0.41) LMNAMEN1CYP3A4ALOX15KMT2A
SCHEMBL26501077 0.71 LMNA (0.41) LMNAMEN1CYP3A4ALOX15KMT2A

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 6 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-8129099-B2 Double patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-03-06 US disclosed
US-8101341-B2 Patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-01-24 US disclosed
US-20100178617-A1 PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2010-07-15 US disclosed
US-7687228-B2 Antireflection film composition and patterning process using the same SHIN ETSU CHEMICAL CO., LTD. (JP) 2010-03-30 US disclosed
US-20090208886-A1 DOUBLE PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2009-08-20 US disclosed
US-20080220381-A1 Antireflection film composition and patterning process using the same SHIN-ETSU CHEMICAL CO., LTD. (JP) 2008-09-11 US disclosed